Method of manufacturing micro-display
First Claim
1. A method of manufacturing micro-displays from a plurality of chips on a wafer, comprising the steps of:
- (A) inputting testing data for the wafer to a sealant machine and a laser puncher, the testing data identifying locations of“
passed” and
“
failed”
chips on the wafer;
(B) forming a sealant frame surrounding a perimeter of the identified “
passed”
chips on the wafer with the sealant machine;
(C) punching injection holes through an ITO glass panel with the laser puncher, the injection holes being punched at locations corresponding to positions of the “
passed”
chips on the wafer as defined in the testing data;
(D) dispensing spacing particles within an enclosed area of each of the “
passed”
chips formed by the sealant frame;
(E) position-aligning the wafer with the ITO glass panel such that each injection hole in the ITO glass panel is located to correspond to a respective one of the “
passed”
chips;
(F) injecting liquid crystal into the enclosed area of each of the “
passed”
chips via the corresponding injection holes in the ITO glass panel;
(G) sealing the injection holes on the ITO glass panel with the sealant machine; and
(H) dicing the wafer and ITO glass panel on the wafer and removing the identified “
passed”
chips.
4 Assignments
0 Petitions
Accused Products
Abstract
A method of manufacturing micro-display includes the steps of testing individual chips on a base wafer forming the micro-display, and the tested “void” chips being marked, inputting the testing data into a sealant/glue machine and a laser puncher; sealant/glue forming on the external surrounding of a “passed” chip a sealant frame by the sealant/glue machine; forming an injection hole on an ITO glass panel at a position corresponding to the position of the “passed” chip, by means of the laser puncher; dispensing spacing particles within a chip'"'"'s square box which has been formed with the sealant frame; position-aligning the ITO glass panel onto the wafer based on the wafer testing data; injecting a liquid crystal via the injection hole of the ITO glass panel located on the top layer of the “passed” chip to the space between the chips and the ITO glass; and sealing and dicing handling of the ITO glass panel to precisely manufacture the micro-display with a passed chip circuit so as to precisely screen the good products, and simplify the required number for fabrication and process.
26 Citations
9 Claims
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1. A method of manufacturing micro-displays from a plurality of chips on a wafer, comprising the steps of:
-
(A) inputting testing data for the wafer to a sealant machine and a laser puncher, the testing data identifying locations of“
passed” and
“
failed”
chips on the wafer;
(B) forming a sealant frame surrounding a perimeter of the identified “
passed”
chips on the wafer with the sealant machine;
(C) punching injection holes through an ITO glass panel with the laser puncher, the injection holes being punched at locations corresponding to positions of the “
passed”
chips on the wafer as defined in the testing data;
(D) dispensing spacing particles within an enclosed area of each of the “
passed”
chips formed by the sealant frame;
(E) position-aligning the wafer with the ITO glass panel such that each injection hole in the ITO glass panel is located to correspond to a respective one of the “
passed”
chips;
(F) injecting liquid crystal into the enclosed area of each of the “
passed”
chips via the corresponding injection holes in the ITO glass panel;
(G) sealing the injection holes on the ITO glass panel with the sealant machine; and
(H) dicing the wafer and ITO glass panel on the wafer and removing the identified “
passed”
chips.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of manufacturing micro-displays from a plurality of chips on a wafer, comprising the steps of:
-
(A) obtaining wafer testing data for each of the individual chips on the wafer to respectively identify the chips as being “
passed” and
“
void”
chips based on the testing data;
(B) marking the “
void”
chips;
(C) inputting the testing data of the plurality of chips of the wafer to a sealant machine and a laser puncher, the testing data identifying locations of the “
passed” and
the “
void chips;
(D) forming a sealant frame surrounding a perimeter of only the “
passed”
chips on the wafer with the sealant machine;
(E) punching injection holes through an ITO glass panel with the laser puncher, the injection holes being punched at locations corresponding to positions of the “
passed”
chips on the wafer as defined in the testing data;
(F) dispensing spacing particles within an enclosed area of each of the “
passed”
chips formed by the sealant frame;
(G) position-aligning the wafer with the ITO glass panel such that each injection hole in the ITO glass panel is located to correspond to a respective one of the “
passed”
chips;
(H) applying a vacuum environment to the wafer;
(I) injecting liquid crystal into the enclosed area of each of the “
passed”
chips via the corresponding injection holes in the ITO glass panel;
(J) releasing the vacuum environment and allowing the liquid crystal to inject into the enclosed areas of the individual chips via the corresponding injection holes;
(K) sealing the injection holes in the ITO glass panel the sealant machine; and
(L) dicing the wafer and ITO glass panel on the wafer and removing the “
passed”
chips.
-
Specification