Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms

• US 6,563,070 B2
• Filed: 04/23/1999
• Issued: 05/13/2003
• Est. Priority Date: 03/30/1999
• Status: Expired due to Fees

• Current Assignee: Vetco Gray Controls Inc (Baker Hughes Company)
• Original Assignee: Micron Technology, Inc.
• Inventors: Capser, Lance M.
• Primary Examiner(s): Nguyen, Tuan N.
• Application Number:
  US09/298,156
• Publication Number:
  US 20010047953A1
• Time in Patent Office: 1,481 Days
• Field of Search: 209/571, 209/573, 324/759, 324/765, 324/158.1
• US Class Current: 209/573
• CPC Class Codes: G11C 29/54 Arrangements for designing test circuits, e.g. design for test [DFT] tools
• CPC Class Codes: G11C 29/56 External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Abstract

A semiconductor device sorting method and apparatus involve development of small, self-contained and focused “qualification” or “sort” algorithm test programs or “modules”, each of which modules may test for the validity of a particular, selected grade of a memory or other semiconductor device based on the results of a test pattern associated with, or exhibited by, a particular device under test. Separating the test code from the main flow file of the test program into the aforementioned “plug-in” qualification or sort modules permits the test code to be much simpler and facilitates better organization, as each qualification or sort module may be independent of any other qualification or sort module and only determines in response to its associated test pattern whether or not (TRUE or FALSE) a device qualifies in a given device grade.

Claims

1. A method of qualifying and sorting a plurality of semiconductor devices, comprising:

selecting a plurality of test registers;

selecting a plurality of device grades and a downgrade path for each of said plurality of selected device grades;

initializing each of the plurality of semiconductor devices to a PASS status for an initial, selected device grade;

executing a first selected test from the plurality of test registers on the plurality of semiconductor devices and, for each semiconductor device of the plurality;

querying as to whether that device failed the first selected test; and

sorting those devices passing the first selected test to the initial, selected device grade.

2. The method of claim 1, further comprising:

for each device failing the first selected test;

querying if the first selected test is constrained to sorting of that device to the initial, selected device grade;

if yes, querying if that device is still a passing device grade;

calling a sort module associated with a lower, current grade;

querying using criteria of the sort module associated with the lower, current grade as to whether that device qualified to the lower, current grade; and

if yes, sorting that device to the lower, current grade.

3. The method of claim 2, further comprising:

for each device failing to qualify to the lower, current grade;

querying if there are additional grades in the downgrade path;

if yes, selecting a next lower grade in the downgrade path as a current grade,

calling a sort module associated with the next lower, current grade;

querying using criteria of the sort module associated with the next lower, current grade as to whether that device qualified to the next lower, current grade; and

if yes, sorting that device to the next lower, current grade.

4. The method of claim 3, further comprising:

for each device failing to qualify to the next lower, current grade, repeating the sequence set forth in claim 3 for each grade in the downgrade path until each device is sorted to a passing grade in the downgrade path or sorted to a fail bin.

5. The method of claim 4, further comprising sorting a failed device to a fail bin corresponding to a test register for the first selected test.

6. The method of claim 1, further comprising:

for each device failing the first selected test;

querying if that device is still a passing device grade;

if yes, selecting a lower grade for that device in the downgrade path as a current grade;

calling a sort module associated with the lower, current grade;

querying using criteria of the sort module associated with the lower, current grade as to whether that device qualified to the lower, current grade; and

if yes, sorting that device to the lower, current grade.

7. The method of claim 6, further comprising:

for each device failing to qualify to the lower, current grade;

querying if there are additional grades in the downgrade path;

if yes, selecting a next lower grade in the downgrade path as a current grade;

calling a sort module associated with the next lower, current grade;

querying using criteria of the sort module associated with the next lower, current grade as to whether that device qualified to the next lower, current grade; and

if yes, sorting that device to the next lower, current grade.

8. The method of claim 7, further comprising:

for each device failing to qualify to the next lower, current grade, repeating the sequence set forth in claim 7 for each grade in the downgrade path until each device is sorted to a passing grade in the downgrade path or sorted to a fail bin.

9. The method of claim 8, further comprising sorting a failed device to a fail bin corresponding to a test register for the first selected test.

10. The method of claim 1, further comprising:

for each device failing the first selected test;

querying if that device is still a passing device grade;

if no, querying if a fail bin associated with the first selected test is a higher ranking fail bin than a fail bin associated with the initial, selected device grade;

if yes, sorting that device to the fail bin associated with the first selected test; and

maintaining the sort for that device to the fail bin associated with the initial, selected device grade.

11. The method of claim 1, further comprising:

executing a next selected test from the plurality of test registers on the plurality of semiconductor devices and, for each semiconductor device of the plurality;

querying as to whether that device failed the next selected test; and

sorting those devices passing the next selected test to said initial, selected device grade.

12. A method of qualifying and sorting a semiconductor device through a plurality of device grades, comprising:

selecting a test sequence including a plurality of tests, each test corresponding to at least one device grade of the plurality of device grades;

selecting a downgrade path for each device grade;

initiating the semiconductor device to a first device grade of the plurality of device grades;

executing a first test in the test sequence;

querying if the semiconductor device failed the first test;

if yes, querying if the first test is constrained to sorting of the semiconductor device to the first device grade;

if yes, sequentially sorting the semiconductor device through at least two of the plurality of device grades along at least one downgrade path; and

defining the device grade resulting from the sorting as a current device grade.

13. The method of claim 12, further comprising:

sequentially executing substantially each remaining test in the test sequence; and

after each failing test,

querying if the failing test is constrained to the current device grade;

if yes, sequentially sorting the semiconductor device through the current device grade and at least one other device grade through which the semiconductor device has not previously been sorted; and

redefining the current device grade to be the device grade resulting from the sorting.

14. The method of claim 13, further comprising:

defining the current device grade as a fail bin not corresponding to any of the plurality of device grades; and

not executing any remaining tests in the test sequence.

15. The method of claim 14, further comprising sorting a failed device to one of a plurality of fail bins according to at least one of a predefined failed tests and a predefined combination of failed tests.