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Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms

  • US 6,563,070 B2
  • Filed: 04/23/1999
  • Issued: 05/13/2003
  • Est. Priority Date: 03/30/1999
  • Status: Expired due to Fees
First Claim
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1. A method of qualifying and sorting a plurality of semiconductor devices, comprising:

  • selecting a plurality of test registers;

    selecting a plurality of device grades and a downgrade path for each of said plurality of selected device grades;

    initializing each of the plurality of semiconductor devices to a PASS status for an initial, selected device grade;

    executing a first selected test from the plurality of test registers on the plurality of semiconductor devices and, for each semiconductor device of the plurality;

    querying as to whether that device failed the first selected test; and

    sorting those devices passing the first selected test to the initial, selected device grade.

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