×

Advanced production test method and apparatus for testing electronic devices

  • US 6,563,301 B2
  • Filed: 04/30/2001
  • Issued: 05/13/2003
  • Est. Priority Date: 04/30/2001
  • Status: Expired due to Fees
First Claim
Patent Images

1. An apparatus for handling an electronic device under test, comprising:

  • a platform to mount said electronic device;

    a power supply;

    means coupled to said power supply for said motorized transport of said apparatus on a track and to power said electronic device while said electronic device is being tested; and

    a low power addressable RE transmit/receiver to provide a wireless interface to the apparatus and the electronic device under test.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×