Checker head

• US 6,563,332 B2
• Filed: 05/09/2000
• Issued: 05/13/2003
• Est. Priority Date: 08/21/1997
• Status: Expired due to Term

• Current Assignee: Ibiden Co., Ltd.
• Original Assignee: Ibiden Co., Ltd.
• Inventors: Goto, Yoshihiro, Murase, Yasumitsu, Ohno, Shinji
• Primary Examiner(s): Cuneo, Kamand
• Assistant Examiner(s): NGUYEN, TRUNG Q
• Application Number:
  US09/463,995
• Publication Number:
  US 20020113611A1
• Time in Patent Office: 1,099 Days
• Field of Search: 324/754, 324/158.1, 324/72.5, 324/117.R, 324/761, 324/437, 324/445, 324/446, 324/690, 324/696, 324/715, 324/724, 324/757
• US Class Current: 324/756.03
• CPC Class Codes: G01R 1/07371 using an intermediate card or back card with apertures through which the probes pass

Abstract

The present invention is a checker head for inspecting an object having even a small test pad pitch, without using a wired socket. The checker head includes a pin to be brought into contact with a test pad of the object, a conductor connected to a circuit tester, and a spring in contact with the pin and conductor and disposed linearly between the pin and conductor. Another mode of checker head has a structure in which a pin to be brought into contact with a test pad of an object and a conductor in contact with the pin and connected to a circuit tester are arranged in line and inserted through laminated body including an elastic layer, and the position of the pin and conductor are restricted by the elastic layer.

Claims

1. A checker head comprising:

a pin including

a tip division configured to contact a test pad provided on an inspected object, and

a rear division connected to the tip division;

a leading wire electrically connected to the rear division of the pin; and

a laminated body comprising

a board made from an insulation material with rigidity, the board including

a forward side,

a rear side,

a hole extending through the board from the forward side to the rear side, the pin being movably inserted into the hole, the tip division of the pin projecting from the forward side, the rear division of the pin projecting from the rear side, and

an elastic insulation layer provided on the rear side of the board and having a through hole aligned with the hole, the rear division of the pin and the leading wire being inserted into the through hole, the elastic insulation layer being configured to be elastically deformed to apply force to the pin in a forward direction to press the tip division to the test pad when force is applied to the pin in a backward direction to retract the tip division.

2. A checker head according to claim 1, wherein the pin includes a large diameter division which connects the tip division and the rear division, the hole includes a large diameter hole which the large diameter division of the pin is movably inserted into.

3. A checker head according to claim 2, wherein the rear division of the pin is a part separate from the tip division and the large diameter division.