Method and arrangement for monitoring surfaces for the presence of dew

• US 6,566,893 B2
• Filed: 07/10/2001
• Issued: 05/20/2003
• Est. Priority Date: 02/28/1997
• Status: Expired due to Fees

• Current Assignee: UST Umweltsensortechnik GmbH
• Original Assignee: UST Umweltsensortechnik GmbH
• Inventors: Reinholz, Albert, Altstadt, Erhard, Hansch, Horst, Kiesewetter, Olaf
• Primary Examiner(s): Le, N.
• Assistant Examiner(s): Hamdan, Wasseem H.
• Application Number:
  US09/902,252
• Publication Number:
  US 20020036507A1
• Time in Patent Office: 679 Days
• Field of Search: 324/664, 324/712, 324/678, 324/663, 324/683, 338/35, 733/350.5, 73/240.6, 73/290.2, 374/28, 374/21, 374/16, 374/27
• US Class Current: 324/664
• CPC Class Codes: G01N 2291/02863 Electric or magnetic parameters
• CPC Class Codes: G01N 27/223 for determining moisture content, e.g. humidity rain detectors on vehicle windows B60S1/0825

Abstract

A method and device for detecting condensation on surfaces of structural components. A evaluation signal is generated before dewing while the structural component is cooling. A detectable film is produced on a measuring arrangement a few degrees Kelvin before the dew point is reached. The temperature is measured directly on the layer where the dew is developing.

Claims

1. A method for monitoring the dew on a surface of a structural component by evaluating a change in a dielectric constant in the field of a scatter field capacitor, comprising the steps of:

measuring a temperature with a measuring system comprising a temperature-dependent resistor and the scatter field capacitor mounted on the structural component;

detecting capacitance and resistance for evaluating moisture and temperature; and

cooling the sensor forming a detectable film of water in the sensor on an additional hydrophilic layer applied to the sensor at a temperature a few degrees Kelvin prior to dewing, wherein the film water is evaporated wherein the measuring system is heated prior to the step of measuring the temperature with the help of said temperature-dependent resistor.

2. A device for monitoring dew on a surface of a structural component comprising:

a) a substrate;

b) a measuring system arranged near a surface of the structural component and comprising;

i) a metal layer comprising an interdigital structure mounted on said substrate, wherein said metal layer forms a scatter field capacitor wherein said metal layer is comprised of two areas, whereby a first area comprises said interdigital structure, and a second area comprises three metal surfaces arranged next to one another and insulated against each other, wherein said metallic surfaces serve as bonding islands; and

ii) a temperature-dependent resistor integrated in said scatter field capacitor;

c) a first additional layer disposed on and covering said entire interdigital structure and said substrate for promoting the formation of dew, wherein said first additional layer comprises hydrophobic material; and

d) a second additional layer disposed on and covering said entire first additional layer for promoting the formation of dew, wherein said second additional layer comprises hydrophilic material, and wherein said hydrophilic material contains a mixture of organic polymers permeable to moisture and salts;

wherein said second additional layer produces increased humidity versus the environment and contains condensation nuclei; and

wherein said second additional layer effects a change in the scatter field capacity when moisture is present permitting a signal change at a temperature 5 to 10°

Kelvin above the dew point temperature.

3. The device according to claim 2, wherein said substrate on which said metal layer is arranged, is made of flexible material.

4. The device according to claim 2, wherein said substrate is made of ceramic material and said first additional layer and said second additional layer consist of polymer.

5. The device according to claim 2, wherein said second additional hydrophilic layer consists of mowiol or polystyrene and potassium chloride or lithium chloride, and said first additional hydrophobic layer consists of poly-p-xylylene.

6. The device according to claim 2, wherein said first additional layer and said second additional layer are placed over said metal layer in such a way that elevations and deepenings are obtained.

7. The device according to claim 2, wherein intermediate spaces located between structures of said metal layer applied to said substrate, are lowered.

8. The device according to claim 2, wherein said first additional layer and said second additional layer are covered by small porous grains.