System, apparatus, and method for detecting defects in particles

• US 6,570,177 B1
• Filed: 01/31/2000
• Issued: 05/27/2003
• Est. Priority Date: 01/31/2000
• Status: Expired due to Fees

• Current Assignee: DCS Corporation
• Original Assignee: DCS Corporation
• Inventors: Shyy, Yeu-Hwa, Struckhoff, Andy
• Primary Examiner(s): Allen, Stephone B.
• Application Number:
  US09/494,305
• Time in Patent Office: 1,212 Days
• Field of Search: 250/574, 250/222.2, 250/228, 250/343, 356/246, 356/236, 356/436, 356/437, 348/126
• US Class Current: 250/574
• CPC Class Codes: G01N 15/1433 using image recognition
• CPC Class Codes: G01N 15/147 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/1472 with colour
• CPC Class Codes: G01N 2015/1486 Counting the particles

Abstract

A method and apparatus for automatically inspecting transparent or translucent materials, especially plastic materials, the apparatus including a light container, at least one camera, a digital processor, and a reject mechanism, the method comprising conveying a particle of the material through the light container, capturing an image of the particle with the camera, identifying defects in the image with the digital processor, and separating out defective material by communication between the digital processor and the reject mechanism. The light container is an illumination device, preferably an integrating sphere, that has two opposing openings through which a particle can pass and one or more other openings or windows through which one or more cameras view the particle.

Claims

1. A material inspection apparatus comprising:

(a) a light container having an entry opening and an exit opening;

(b) at least one camera with an inside view of the light container,

wherein the at least one camera is adapted to capture an image of a particle traveling from the entry opening to the exit opening as the particle is illuminated inside the light container;

(c) a reject mechanism in fluid communication with the exit opening; and

(d) a digital processor in signal communication with the at least one camera and with the reject mechanism.

2. The material inspection apparatus of claim 1, wherein the digital processor is a computer with means for receiving data from the at least one camera, assembling the data into images, analyzing the images for defects, and sending a signal to the reject mechanism.

3. The material inspection apparatus of claim 1, wherein the at least one camera and the digital processor are an integrated device.

4. The material inspection apparatus of claim 1, wherein the reject mechanism removes a defective particle in response to a signal from the digital processor.

5. The material inspection apparatus of claim 1, wherein the reject mechanism comprises:

(i) a signal receiver;

(ii) a non-reject channel in fluid communication with the exit opening;

(iii) a reject channel in fluid communication with the non-reject channel; and

(iv) a pneumatic injector in fluid communication with the non-reject channel, the pneumatic injector capable of redirecting a defective particle from the non-reject channel to the reject channel.

6. The material inspection apparatus of claim 1, wherein the at least one camera, the reject mechanism, and the digital processor work automatically as a part of a manufacturing process.

7. A material inspection apparatus comprising:

(a) a light container having an entry opening and an exit opening;

(b) at least one camera with an inside view of the light container,

wherein the at least one camera is adapted to capture an image of a particle traveling from the entry opening to the exit opening as the particle is illuminated inside the light container;

(c) a feeder that receives particles in bulk;

(d) a sorting mechanism in fluid communication with the feeder and with the entry opening;

(e) a clear conduit connecting the entry opening to the exit opening; and

(f) at least one particle counter that counts particles traveling through the light container.

8. A method for inspecting particles comprising the steps of:

(a) sorting the particles and arranging the particles into a line of particles;

(b) conveying the line of particles one-by-one through a light container;

(c) recording images of the particles as the particles are illuminated inside the light container; and

(d) identifying defects in the images.

9. The method of claim 8, wherein the light container is an integrating sphere with an input beam, and wherein the input beam transmits light into the integrating sphere but away from the particles.

10. The method of claim 8, wherein the light container is an integrating sphere.

11. The method of claim 8, wherein the step of conveying comprises dropping the particles through a clear conduit running through the light container.

12. The method of claim 8, wherein the step of recording images of the particles comprises the steps of:

(i) scanning one-dimensional arrays of the particles as the particles pass in front of a line scan camera;

(ii) sending the one dimensional arrays to a memory buffer in a digital processor; and

(iii) assembling the one-dimensional arrays into a two dimensional image at a specified frame time.

13. The method of claim 8, wherein the step of identifying defects comprises the steps of:

(i) scanning a sample of particles to determine a non-defect video level at which light passes through a non-defective particle;

(ii) determining a defect video level that indicates a defective particle;

(iii) establishing a threshold level between the non-defect video level and the defect video level; and

(iv) identifying the defects as instances when a video level of the images falls below the threshold level.

14. The method of claim 8, further comprising the steps of:

(e) associating the defects in the images with defective particles in the line of particles; and

(f) removing the defective particles from the line of particles.

15. The method of claim 14, wherein the step of removing the defective particles comprises injecting air to redirect the defective particles to a destination separate from a destination of the line of particles.

16. A method for inspecting particles comprising the steps of:

(a) passing the particles through a light container;

(b) scanning the particles; and

(c) identifying defective particles,

wherein the particles pass through the light container one-by-one in a line.

17. The method of claim 16, wherein the light container is an integrating sphere.

18. The method of claim 16, wherein the particles pass through the light container in a clear conduit.

19. A method for inspecting particles comprising the steps of:

(a) passing the particles through a light container;

(b) scanning the particles; and

(c) identifying defective particles,

wherein the step of scanning the particles comprises recording one-dimensional arrays of the particles and assembling the one-dimensional arrays into images of the particles.

20. The method of claim 19,

wherein the step of identifying defective particles comprises recognizing dark areas in the images of the particles.

21. A method for inspecting particles comprising the steps of:

(a) passing the particles one-by-one through a light container;

(b) scanning the particles; and

(c) identifying defective particles,

wherein the particles are transparent or translucent.

22. A method for inspecting particles comprising the steps of:

(a) passing the particle one-by-one through a light container;

(b) scanning the particles; and

(c) identifying defective particles,

wherein the particles are opaque.

23. A system for inspecting particles comprising:

(a) an integrating sphere that produces spatially integrated light;

(b) means for sorting the particles into a stream of particles and directing the stream of particles through the integrating sphere;

(c) means for electronically recording images of the particles as they pass through the integrating sphere;

(d) means for identifying flawed particles by detecting dark spots in the images of the particles; and

(e) means for rejecting flawed particles.

24. The system of claim 23, wherein the means for sorting the particles comprises a sifting sorter.

25. The system of claim 23, wherein the means for electronically recording images of the particles comprises a line scan camera.

26. The system of claim 25, comprising a digital processor that stores one-dimensional arrays recorded by the line scan camera, and assembles the one-dimensional arrays into two-dimensional images.

27. The system of claim 23, wherein the means for rejecting the flawed particles comprises a pneumatic injector in communication with the means for identifying the flawed particles.