Use of a scan chain for configuration of BIST unit operation

• US 6,574,762 B1
• Filed: 03/31/2000
• Issued: 06/03/2003
• Est. Priority Date: 03/31/2000
• Status: Expired due to Term

• Current Assignee: Avago Technologies International Sales Pte Limited (Broadcom, Inc.)
• Original Assignee: LSI Logic Corporation (Broadcom, Inc.)
• Inventors: Karimi, Farzin, Crosby, Thompson W., Irrinki, V. Swamy
• Primary Examiner(s): Decady, Albert
• Assistant Examiner(s): Dooley, Matthew C.
• Application Number:
  US09/540,197
• Time in Patent Office: 1,159 Days
• Field of Search: 714/726, 714/727, 714/733, 714/734, 714/735, 714/824, 714/731, 714/744
• US Class Current: 714/727
• CPC Class Codes: G01R 31/318536 Scan chain arrangements, e.g. connections, test bus, analog signals
• CPC Class Codes: G01R 31/318541 Scan latches or cell details

Abstract

An integrated circuit device is disclosed having a boundary scan chain and a hardwired BIST unit that is configurable via the control circuitry for the boundary scan chain. In one embodiment, the device includes application logic, a BIST unit, a boundary scan chain, a register, and a test access port. The application logic is the logic that provides the intended function of the chip. The BIST unit is configured to apply test patterns to the application logic to verify its functionality. The boundary scan chain is configured to sample input signals to the application logic and to control output signals from the application logic. The register stores an operational mode parameter for the BIST. The test access port provides external access to the boundary scan chain and the register, and is configured to control a clock signal to the BIST unit in accordance with the BIST operational mode parameter.

Claims

1. An integrated circuit device that comprises:

application logic;

a built-in self-test (BIST) unit configured to apply test patterns to the application logic to verify functionality of the application logic;

a boundary scan chain coupled to the application logic and configured to sample input signals to the application logic and control output signals from the application logic;

a register configured to store a parameter that indicates one operational mode from a set including;

step mode, phase mode, and full BIST mode; and

a test access port configured to provide external access to the boundary scan chain and the register, and configured to control a clock signal to the BIST unit in accordance with the operational mode parameter,

wherein when the operational mode parameter is set to indicate step mode, the test access port provides only enough clock cycles to the BIST unit for the BIST unit to complete one step of the test pattern each time the test access port enters a Run-BIST state,

wherein when the operational mode parameter is set to indicate phase mode, the test access port provides only enough clock cycles to the BIST unit for the BIST unit to complete one phase of the test pattern each time the test access port enters a Run-BIST state, and

wherein when the operational mode parameter is set to indicate full BIST mode, the test access port provides enough clock cycles to the BIST unit for the BIST unit to complete the test pattern.

2. The device of claim 1, wherein one step of the test pattern consists of a plurality of memory accesses to a single memory address.

3. The device of claim 1, wherein one phase of the test pattern consists of a plurality of memory accesses to each memory location.

4. The device of claim 1, wherein the test access port provides external access to at least one individual portion of the boundary scan chain separately from the rest of the boundary scan chain in addition to external access via the boundary scan chain as a whole.

5. The device of claim 1, wherein at least some portion of the boundary scan chain applies a latched inversion mask to signals in a bitwise fashion as the signals are conveyed between the BIST unit and the application logic.

6. The device of claim 1, wherein the application logic includes an array of memory cells.

7. The device of claim 6, wherein the BIST unit includes an address generator for addressing memory locations, and wherein the data input portion of the boundary scan chain is individually accessible via the test access port separately from the rest of the boundary scan chain.

8. An integrated circuit device which comprises:

application logic;

a built-in self-test (BIST) unit configured to apply test patterns to the application logic to verify functionality of the application logic;

a boundary scan chain coupled to the application logic and configured to sample input signals to the application logic and control output signals from the application logic, wherein during operation of the BIST unit, the boundary scan chain is further configured to apply a latched inversion mask to a sequence of address and data bus signals; and

a test access port configured to provide external access to the boundary scan chain to store the latched inversion mask.

9. The device of claim 8, further comprising:

an instruction register configurable to store a parameter that indicates one operational mode from a set including;

step mode, phase mode, and full BIST mode,

wherein the test access port is configured to provide external access to the instruction register, and wherein the test access port is configured to control a clock signal to the BIST unit in accordance with the operational mode parameter,

wherein when the operational mode parameter is set to indicate step mode, the test access port provides only enough clock cycles to the BIST unit for the BIST unit to complete one step of the test pattern each time the test access port enters a Run-BIST state,

wherein when the operational mode parameter is set to indicate phase mode, the test access port provides only enough clock cycles to the BIST unit for the BIST unit to complete one phase of the test pattern each time the test access port enters a Run-BIST state, and

wherein when the operational mode parameter is set to indicate full BIST mode, the test access port provides enough clock cycles to the BIST unit for the BIST unit to complete the test pattern.