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Ion optic components for mass spectrometers

  • US 6,593,570 B2
  • Filed: 12/22/2000
  • Issued: 07/15/2003
  • Est. Priority Date: 05/24/2000
  • Status: Expired due to Fees
First Claim
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1. An apparatus for manipulating charged particles, when present, comprising:

  • (a) a hollow first element, and (b) a hollow second element, said second element being disposed within said first element, said second element having at least two openings through a wall thereof wherein said openings are elongated in a direction that is substantially parallel to the longitudinal axis of said second element, wherein said openings are distributed around a circumference of said element, wherein the length of said openings are at least about 20% of the length of said second element, and wherein said openings of said second element allow an electric field resulting from the application of electrical voltages to said first element and said second element to enter an area within said second element and generate within said second element an oscillating electric potential field having predetermined characteristics that manipulates charged particles, when present.

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