Method of cutting off circuit under overcurrent, circuit cutting-off device under overcurrent, and method of protecting semiconductor relay system

• US 6,594,129 B1
• Filed: 09/22/2000
• Issued: 07/15/2003
• Est. Priority Date: 09/22/1999
• Status: Expired due to Fees

• Current Assignee: Yazaki Corporation
• Original Assignee: Yazaki Corporation
• Inventors: Sugiyama, Kazuto, Nagashima, Yoshikazu, Mine, Yoshihiko, Baba, Akira
• Primary Examiner(s): Patel, Rajnikant B.
• Application Number:
  US09/667,778
• Time in Patent Office: 1,026 Days
• Field of Search: 361/87, 361/18, 361/71, 361/74, 361/90, 361/91, 361/103, 361/100, 361/274, 361/86, 361/94, 363/56, 363/60
• US Class Current: 361/87
• CPC Class Codes: H03K 17/0822 in field-effect transistor switches
• CPC Class Codes: H03K 2017/0806 against excessive temperature
• CPC Class Codes: H03K 2217/0081 Power supply means, e.g. to the switch driver

Abstract

In a semiconductor relay system for supply a power source to a lamp load under the on/off control by a microcomputer using a semiconductor relay, a method of cutting off a circuit under an overcurrent, a first prescribed value is which is a current value higher than a rated load current for the load and a maximum current value supplied to the lamp load, and a second prescribed value is set which is a current value between said first prescribed value and said rated current value; the current value flowing through the lamp load is sampled at predetermined time intervals and comparing the current value thus sampled with the second prescribed value; and when a higher current than said first prescribed value flows through the lamp load, the current supplied to the lamp load is controlled within a prescribed range between said first prescribed value and said second prescribed value, and when the sampled current value higher that said second prescribed value is counted by a prescribed number of times, the sampled current is decided as an overcurrent thereby cutting off the semiconductor relay to stop the current supply to said lamp load.

Claims

1. A method of cutting off a circuit under an overcurrent in a semiconductor relay system for supplying a power source to a load, said method comprising the steps of:

setting a first prescribed value which is a current value higher than a rated load current for the load and is a maximum current value supplied to the load;

setting a second prescribed value which is a current value between said first prescribed value and said rated current value;

sampling a current value flowing to the lamp load at predetermined intervals;

comparing said sampled current value with said second prescribed value;

controlling the current supplied to the load within a range between said first prescribed value and said second prescribed value in case of said sampled current higher than said first prescribed value flows to the load; and

deciding said sampled current as an overcurrent and cutting off the semiconductor relay to stop the current supply to said load in case of said sampled current value higher than said second prescribed value is counted by a predetermined number of times.

2. A method of cutting off a circuit according to claim 1, wherein said second prescribed value is twice as large as the rated load current.

3. A circuit cutoff device having a semiconductor relay system for supplying a power source to a load under on/off control by a semiconductor relay of a microcomputer, said circuit cutoff device comprising:

a first setting device setting a first prescribed value which is a current value as maximum current value supplied to said load, having a current detection resistor connected to a drain side of said semiconductor relay for detecting a current supplied to said load;

a comparator comparing a resistance voltage at both ends of said current detector resistor to a first prescribed voltage defined by said first prescribed value;

a hysteresis circuit applying a hysteresis having a prescribed width defined by said first prescribed voltage and a second prescribed voltage lower than said first prescribed voltage to said resistance voltage;

a gate logic circuit controlling a gate voltage of said semiconductor relay for stopping supplying said power source to said load according to an output from said comparator in case of said current exceed said first prescribed value, and controlling said gate voltage for supplying said power source to said load in case of said current lower than said second prescribed voltage; and

a second setting device setting a second prescribed value which is a current value lower than said first prescribed value and higher than a rated current supplied to said load in a stationary state.

4. A circuit cutoff device according to claim 3, wherein said semiconductor relay is a thermal cutoff circuit incorporating type MOSFET.

5. A circuit cutoff device according to claim 3, wherein said second prescribed value is set at a current value which is twice as large as a rated load current.

6. A circuit cutoff device according to claim 3, wherein said second prescribed value is set in said microcomputer.

7. A method of protecting a semiconductor relay system including a thermal interrupting circuit incorporating type MOSFET, a microcomputer and a driving circuit, said MOSFET being on/off controlled by said microcomputer through said driving circuit so that said semiconductor relay system supplying a power source to a load, said method comprising the steps of:

detecting a current supplied to said load;

controlling said driving circuit to cut off a voltage applied to a gate of said MOSFET so that supply of said power source to said load is stopped when said detected current is larger than a prescribed current value set at larger than a rated current value;

detecting a source voltage generated on a source side of said MOSFET while an instruction signal for turning on said MOSFET is outputted from said microcomputer;

counting a number of times which said detected source voltage is lower than a prescribed voltage value; and

turning off said semiconductor relay system for fear of reset when said counted number reaches a prescribed number of times.

8. A method of protecting a semiconductor relay system according to claim 7, wherein said prescribed number of times is fewer than a number of times, defined by a characteristic of said MOSFET, that said MOSFET is broken of repetition of cutoff by a thermal self cut-off circuit incorporated in said MOSFET in state where a current limitation is imposed on a prescribed current value.