Micromachined strain sensor

• US 6,606,913 B1
• Filed: 01/15/1999
• Issued: 08/19/2003
• Est. Priority Date: 11/06/1998
• Status: Expired due to Term

• Current Assignee: Wisconsin Alumni Research Foundation (University of Wisconsin System)
• Original Assignee: Wisconsin Alumni Research Foundation (University of Wisconsin System)
• Inventors: Gianchandani, Yogesh B.
• Primary Examiner(s): Williams, Hezron
• Assistant Examiner(s): DAVIS, OCTAVIA L
• Application Number:
  US09/232,092
• Time in Patent Office: 1,677 Days
• Field of Search: 737/77, 737/67, 737/81, 731/05, 735/143.2, 735/141.6, 735/141.8, 735/041.6, 738/625.9
• US Class Current: 73/777
• CPC Class Codes: G01B 7/22 using change in capacitance
• CPC Class Codes: G01L 5/0047 measuring forces due to residual stresses

Abstract

A micromachined strain sensor can be incorporated in a sealed package with other microelectrical and micromechanical components, with the residual strain being monitored electronically from outside the package to allow strain to be monitored during production and during the life of the component. The strain sensor includes at least one microstructural beam member anchored to a substrate at one position and having a portion which is freed from the substrate during formation to displace as a result of the strain in the beam member. At least one electrically conductive displaceable tine is connected to the beam member to be displaced as it is freed. A mating electrically conductive tine is mounted to the substrate adjacent to the displaceable tine such that a capacitor is formed between the adjacent tines. A plurality of displaceable tines and mating tines may be formed to increase the overall capacitance of the device. The mating tines and displaceable tines are connected to leads extending from the package to allow the change in capacitance caused by displacement of the beam member to be measured from outside the package. The strain sensors may be configured with the beam members connected to the top and bottoms of support beams that carry the displaceable tines, with multiple structures formed adjacent to each other to increase the overall capacitance of the sensor and to increase the displacement of the tines in response to the built-in compressive or tensile strain in the microstructural material of the beam members, and to allow differential capacitive readout.

Claims

1. A micromachined strain sensor comprising:

(a) a substrate with a surface;

(b) a sacrificial layer on the surface of the substrate;

(c) a microstructural beam member anchored to the substrate at one end and having a portion that is deposited on the sacrificial layer;

(d) at least one electrically conductive displaceable tine connected to the beam member to displace with the beam member as the beam member expands or contracts; and

(e) at least one electrically conductive mating tine mounted to the substrate closely adjacent to a displaceable tine to define adjacent tines such that a capacitor is formed between the adjacent tines which has a capacitance that can change with displacements of the displaceable tine when the sacrificial layer is removed to release the beam member.

2. The strain sensor of claim 1 including an elongated support beam disposed above the surface of the substrate to define a longitudinal direction along the support beam, and wherein there are two pairs of beam members joined to two ends of the support beam at an acute angle such that each pair of beam members forms a V-shape and such that the V-shapes formed by the two pairs of beam members are aligned, each beam member extending from an anchor mount secured to the substrate to a position at which each beam member is joined to the support beam, and wherein there are a plurality of displaceable tines formed with and extending outwardly from opposite sides of the elongated support beam over the surface of the substrate, and wherein there are a plurality of mating tines mounted to the substrate and extending toward the displaceable tines on each side of the support beam such that expansion or contraction of the beam members displaces the support beam longitudinally.

3. The strain sensor of claim 2 wherein the beam members, support beam, and displaceable tines are deposited on the sacrificial layer.

8. The strain sensor of claim 1 further comprising a package enclosing the micromachined strain sensor including the substrate and electrical connectors extended from the strain sensor to lead pins outside the package.

4. A micromachined strain sensor comprising:

(a) a substrate with a surface;

(b) a microstructural beam member anchored to the substrate at one end and having a portion extending over the surface of the substrate;

(c) at least one electrically conductive displaceable tine;

(d) at least one electrically conductive mating tine mounted to the substrate closely adjacent to a displaceable tine to define adjacent tines such that a capacitor is formed between the adjacent tines; and

,

(e) a support beam to which the at least one displaceable tine is mounted, wherein the beam member is a first beam member which extends from an anchor mount secured to the substrate to join to the support beam at a position along a side of the support beam, a second beam member extending from an anchor mount secured to the substrate to join the support beam on a side of the support beam opposite to the side to which the first beam member is joined and at a position spaced longitudinally from the position at which the first beam member joins the support beam, whereby expansion or contraction of the first and second beam members will rotate the support beam about a pivot position between the positions at which the beam members join the support beam to displace the at least one displaceable tine so as to bring the at least one displaceable tine closer to or further from the adjacent mating tine.

5. The strain sensor of claim 4 further including a sacrificial layer on the surface of the substrate and on which the beam members, support beam, and displaceable tines are deposited.

6. A micromachined strain sensor comprising:

(a) a substrate with a surface;

(b) a microstructural beam member anchored to the substrate at one end and having a portion extending over the surface of the substrate;

(c) a plurality of electrically conductive displaceable tines; and

(d) a plurality of electrically conductive mating tines each mounted to the substrate closely adjacent to a displaceable tine to define adjacent tines such that a capacitor is formed between the adjacent tines, wherein the beam member is a first beam member that extends from an anchor mount secured to the substrate to join a support beam at one end of the support beam, and including a second beam member shorter than the first beam member extending from an anchor mount secured to the substrate to another end of the support beam, the displaceable tines mounted to the support beam, and the mating tines mounted to the substrate adjacent to the displaceable tines, such that expansion or contraction of the beam members causes the first beam member to expand or contract more than the second beam member and to thereby rotate the support beam in one direction or another to displace the displaceable tines so as to bring the displaceable tines closer to or further from the mating tines.

7. A micromachined strain sensor comprising:

(a) a substrate with a surface;

(b) a microstructural beam member anchored to the substrate at one end and having a portion extending over the surface of the substrate;

(c) a plurality of electrically conductive displaceable tines; and

(d) a plurality of electrically conductive mating tines each mounted to the substrate closely adjacent to a displaceable tine to define adjacent tines such that a capacitor is formed between the adjacent tines, wherein the beam member is a first beam member that extends from an anchor mount secured to the substrate to join a support beam at one end of the support beam, and including a second beam member shorter than the first beam member extending from an anchor mount secured to the substrate to another end of the support beam, the displaceable tines mounted to the support beam, and the mating tines mounted to the substrate adjacent to the displaceable tines, such that expansion or contraction of the beam members causes the first beam member to expand or contract more than the second beam member and to thereby rotate the support beam in one direction or another to displace the displaceable tines so as to bring the displaceable tines closer to or further from the mating tines; and

(e) a sacrificial layer formed on the surface of the substrate on which the beam members, support beam, and displaceable tines are deposited.

9. A micromachined strain sensor comprising:

(a) a substrate with a surface;

(b) an elongated support beam disposed above the surface of the substrate to define a longitudinal direction along the support beam;

(c) two pairs of microstructural beam members anchored to the substrate at one end and having a portion extending over the surface of the substrate, the two pairs of beam members joined to two ends of the support beam at an acute angle to form a V-shape and such that the V-shapes formed by the two pairs of beam members are aligned, each beam member extending from an anchor mount secured to the substrate to a position at which each beam member is joined to the support beam such that expansion or contraction of the beam members displaces the support beam longitudinally;

(d) a plurality of electrically conductive displaceable tines formed with and extending outwardly from opposite sides of the elongated support beam over the surface of the substrate; and

(e) a plurality of electrically conductive mating tines mounted to the substrate and extending toward the displaceable tines on each side of the support beam, each mating tine adjacent to a displaceable tine to define adjacent tines, such that capacitors are formed between adjacent tines.

10. The strain sensor of claim 9 further including a sacrificial layer between the substrate and the beam members, support beam, and displaceable tines and on which the beam members, support beam, and displaceable tines are deposited.

11. The strain sensor of claim 9 wherein the beam members, support beam, and displaceable tines are spaced above the surface of the substrate and are free of the substrate to permit displacement of these structures.

12. The strain sensor of claim 9 wherein the microstructural beam members, support beam, and electrically conductive displaceable tines are integrally formed of a material selected from the group consisting of polysilicon and electroplated metal.

13. The strain sensor of claim 9 wherein the displaceable tines extending from a first side of the support beam are most closely adjacent to mating tines in a direction toward a first end of the support beam, and the displaceable tines extending from a second side of the support beam opposite to the first side are most closely adjacent to mating tines in a direction toward a second end of the support beam such that displacement of the support beam in the longitudinal direction of the support beam brings the displaceable tines and mating tines on one side of the support beam closer together while drawing the displaceable tines and the mating tines on a side of the support beam that is opposite to the one side further apart.

14. A micromachined strain sensor comprising:

(a) a substrate with a surface;

(b) a plurality of adjacent displaceable structures each comprising;

(1) an elongated support beam disposed above the surface of the substrate to define a longitudinal direction along the support beam;

(2) two pairs of microstructural beam members anchored to the substrate at one end and having a portion extending over the surface of the substrate, the two pairs of beam members joined at two ends of the support beam at an acute angle to form a V-shape and such that the V-shapes formed by the two pairs of beam members are aligned, each beam member extending- from an anchor mount secured to the substrate to a position at which each beam member is joined to the support beam such that expansion or contraction of the beam members displaces the support beam longitudinally;

(3) a plurality of electrically conductive displaceable tines formed with and extending outwardly from opposite sides of the elongated support beam over the surface of the substrate, each mating tine adjacent to a displaceable tine to define adjacent tines such that capacitors are formed between adjacent tines; and

wherein the displaceable structures include one central displaceable structure formed with the pairs of beam members extending from the anchor mounts of the beam members to the support beam in a first longitudinal direction and two adjacent displaceable structures having the pairs of beam members extending from the anchor mounts of the beam members to the support beam in a second longitudinal direction that is opposite to the first longitudinal direction, wherein the displaceable tines on each side of the support beam of the central displaceable structure are closely adjacent to the displaceable tines on the support beam of the adjacent displaceable structures that are adjacent to the central displaceable structure, such that the support beam of the central displaceable structure displaces in one direction in response to built-in strain in the beam members supporting that support beam while the support beams of the adjacent displaceable structures are displaced in the opposite direction.

15. The strain sensor of claim 14 including two outermost displaceable structures on either side of the displaceable structures that are adjacent to the central displaceable structure, each of the outermost displaceable structures having a support beam disposed above the surface of the substrate to define longitudinal directions along the support beams, two pairs of beam members joined to two ends of the support beam at acute angles to form a V-shape, the V-shapes defined by the two pairs of beam members being aligned, the V-shapes defined by the beam members on the two outermost structures aligned with the V-shapes defined by the beam members on the central displaceable structure, each beam member on the outermost displaceable structures extending from an anchor mount secured to the substrate to a position at which each beam member is joined to the support beam, and a plurality of electrically conductive displaceable tines formed with and extending from the support beam to positions adjacent to displaceable tines extending from the support beams of the displaceable structures that are adjacent to the central displaceable structure such that the support beams of the outermost structures displace longitudinally in a direction opposite to the longitudinal displacement of the support beams of the displaceable structures that are adjacent to the central displaceable structure.

16. The strain sensor of claim 15 wherein the displaceable tines on a first side of the support beam of the central structure are most closely adjacent to displaceable tines extending from the support beam of the adjacent displaceable structure in the first of the longitudinal directions and wherein the displaceable tines on a side of the support beam of the central structure that is opposite to the first side are most closely adjacent to displaceable tines extending from the support beam of the displaceable structure on a second side of the central structure in the second of the longitudinal directions such that the adjacent tines on one of the first or second sides of the support beam of the central structure move closer together while the adjacent tines on the other of the first or second sides of the support beam of the central structure move further apart.

17. The strain sensor of claim 16 wherein the outermost displaceable structures and the central displaceable structure are electrically connected together in common such that the displaceable tines of these structures are electrically connected together to define commonly connected structures and wherein a capacitor is formed between the commonly connected structures and the displaceable structure on one side of the central structure and another capacitor is formed between the commonly connected structures and the displaceable structure on another side of the central structure, the capacitance of these two capacitors changing in magnitude in opposite directions.

18. The strain sensor of claim 14 wherein the beam members, support beam, and displaceable tines are spaced above the surface of the substrate and are free of the substrate to permit displacement of these structures.

19. The strain sensor of claim 14 wherein the beam members, support beam, and electrically conductive displaceable tines are integrally formed of a material selected from the group consisting of polysilicon and electroplated metal.

20. The strain sensor of claim 14 further including a sacrificial layer between the substrate and the beam members, support beam, and displaceable tines and on which the beam and displaceable tines are elongated.

21. The strain sensor of claim 14 further comprising a package enclosing the micromachined strain sensor including the substrate and electrical connectors extending from the strain sensor to lead pins outside the package.

22. A method of sensing strain in a microstructural material comprising the steps of:

(a) providing a substrate with a sacrificial layer thereon;

(b) depositing a microstructural beam member on the sacrificial layer and anchoring the beam member to the substrate at one end thereof;

(c) connecting at least one electrically conductive displaceable tine to the beam member such that the at least one displaceable tine can displace with the beam member;

(d) forming at least one electrically conductive mating tine mounted to the substrate closely adjacent to the displaceable tine to define adjacent tines such that a capacitor is formed between the adjacent tines;

(e) removing the sacrificial layer to allow the beam member to displace by expansion or contraction of the beam member as a result of strain in the beam member and to displace the displaceable tine connected to the beam member; and

(f) measuring a change in capacitance between the displaceable tine and the mating tine that occurs as a result of removing the sacrificial layer whereby the built-in strain in the beam member can be determined from the measured change in capacitance.