Multiport automatic calibration device for a multiport test system
First Claim
1. An N-port automatic calibration device comprising N-ports, each port adapted to be coupled to a port of a N-port multiport test set, the N-port automatic calibration device comprising:
- a single-pole, N−
1 throw switch having a single-pole coupled to a first port of the automatic calibration device and having each throw of N−
1 throws coupled to a corresponding port of the automatic calibration device; and
at least one single-pole, double-throw switch, having at least first, second, third, and fourth conditions and having a single pole coupled to a second port of the N-ports of the automatic calibration device, having a first throw coupled to a first load impedance, and having a second throw coupled to a throw of the N−
1 throws of the single-pole, N−
1 throw switch, said first condition connecting said single pole to said first throw, said second condition connecting said single pole to said second throw, said third condition connecting said single pole to a reference potential within said single-pole, double-throw switch, and said fourth condition connecting said single pole to a high impedance within said single-pole, double-throw switch.
1 Assignment
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Accused Products
Abstract
According to one embodiment of the invention, there is provided an N-port automatic calibration device comprising N-ports, wherein each port is adapted to be coupled to a port of an N-port multiport test set. The N-port automatic calibration device comprises a single-pole, N−1 throw switch having a single-pole coupled to a first port of the automatic calibration device and having each throw of the N−1 throws coupled to a corresponding port of the automatic calibration device. In addition, the N-port automatic calibration device comprises at least one single-pole, double-throw switch, having a single-pole coupled to a second port of the N-ports of the automatic calibration device, having a first throw coupled to a first load impedance, and having a second throw coupled to a throw of the N−1 throws of the single-pole, N−1 throw switch.
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Citations
23 Claims
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1. An N-port automatic calibration device comprising N-ports, each port adapted to be coupled to a port of a N-port multiport test set, the N-port automatic calibration device comprising:
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a single-pole, N−
1 throw switch having a single-pole coupled to a first port of the automatic calibration device and having each throw of N−
1 throws coupled to a corresponding port of the automatic calibration device; and
at least one single-pole, double-throw switch, having at least first, second, third, and fourth conditions and having a single pole coupled to a second port of the N-ports of the automatic calibration device, having a first throw coupled to a first load impedance, and having a second throw coupled to a throw of the N−
1 throws of the single-pole, N−
1 throw switch, said first condition connecting said single pole to said first throw, said second condition connecting said single pole to said second throw, said third condition connecting said single pole to a reference potential within said single-pole, double-throw switch, and said fourth condition connecting said single pole to a high impedance within said single-pole, double-throw switch.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
first and second output arms, comprising said first and second throws, and a common arm comprising said single-pole, first, second, third and fourth series FETs, each series FET having a gate, a drain, and a source, said first output arm at said source of said first series FET, said second output arm at said drain of said fourth series FET, said first, second, third and fourth series FETs arranged in series between said first and second output arms, said common arm at a second series node intermediate said second and third series FETs, first and second parallel FETs, each parallel FET having a gate, a drain, and a source, a first series node connected to reference potential through said first parallel FET, said gate of said first parallel FET connected to a control terminal, a third series node connected to reference potential through said second parallel FET, said gate of said second parallel FET connected to a control arm through a second parallel resistive element, and a bleeder resistive element at said common arm.
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22. The N-port automatic calibration device as claimed in claim 1 wherein said fourth condition presents a FET switching device in a high impedance state to said single-pole.
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23. The N-port automatic calibration device as claimed claim 1 wherein said third condition presents a FET switching device in a low impedance state between at least one of said throws and reference potential.
Specification