Wire pattern test system

• US 6,614,922 B1
• Filed: 01/04/2000
• Issued: 09/02/2003
• Est. Priority Date: 01/04/2000
• Status: Expired due to Fees

• Current Assignee: Ohio State Innovation Foundation (Ohio State University)
• Original Assignee: Ohio State University
• Inventors: Walton, Eric K.
• Primary Examiner(s): Ahmed, Samir
• Assistant Examiner(s): Bali, Vikkram
• Application Number:
  US09/477,594
• Time in Patent Office: 1,337 Days
• Field of Search: 382/141-154, 348/86, 348/87, 348/125, 348/126, 348/127, 324/51, 324/52, 324/57, 324/56, 250/252.1, 738/66
• US Class Current: 382/141
• CPC Class Codes: G01R 31/309 of printed or hybrid circuits or circuit substrates
• CPC Class Codes: G06T 2207/10048 Infrared image
• CPC Class Codes: G06T 2207/30108 Industrial image inspection
• CPC Class Codes: G06T 7/0006 using a design-rule based approach

Abstract

The present invention includes testing devices and testing systems. This invention also includes machines or electronic apparatus using these aspects of the invention. The present invention also includes methods and processes using these devices and systems. In a preferred embodiment, a testing device and method are described that utilize infrared imaging and computer analysis thereof in detecting and measuring continuity, uniformity, and presence of inhomogeneities of wire heating grids in automotive windshields. The computer is capable of autonomous decision making, and can signal industrial equipment such as robotic actuators to automatically remove faulty windshields from the assembly line.

Claims

1. A testing system for a conductive pattern, said testing system comprising:

(a) an article of manufacture comprising said conductive pattern;

(b) an electrical power source in contact with said conductive pattern, whereby electrical current may be circulated throughout at least a portion of said conductive pattern;

(c) an infrared detection device, said infrared detection device adapted to collect data from at least a portion of said conductive pattern; and

(d) a data collection device adapted to receive data from said infrared detection device.

2. A testing system according to claim 1 wherein said article of manufacture comprises an automotive windshield, automotive backlite, or other automotive component.

3. A testing system according to claim 1 wherein said conductive pattern comprises a printed conductive pattern.

4. A testing system according to claim 1 wherein said infrared detection device comprises an infrared imaging device.

5. A testing system according to claim 1 wherein said data collection device is a computer adapted to collect image data from said infrared detection device, process said image data, and determine performance of at least a portion of said conductive pattern.

6. A testing system according to claim 1 wherein:

said data collection device is adapted to store preexisting data that includes pattern coordinates of said conductive pattern; and

said data collection device is adapted to determine the performance of a respective line of said conductive pattern.

7. A testing system according to claim 6 wherein said data collection device is adapted to automatically determine the performance of said respective line of said conductive pattern.

8. A testing system for a glass panel comprising a conductive pattern, said testing system comprising:

(a) an electrical power source in contact with said conductive pattern, whereby electrical current may be circulated throughout at least a portion of said conductive pattern;

(b) an infrared imaging device, said infrared imaging device adapted to collect image data from at least a portion of said conductive pattern; and

(c) a computer adapted to collect said image data from said infrared imaging device, process said image data, determine performance of at least a portion of said conductive pattern, and report the results of said performance.

9. A testing system according to claim 8 wherein:

said computer is adapted to store preexisting data that includes pattern coordinates of said conductive pattern; and

said computer is adapted to determine the performance of a respective line of said conductive pattern.

10. A testing system according to claim 9 wherein said computer is adapted to automatically determine the performance of said respective line of said conductive pattern.

11. A method of testing a conductive pattern, said method comprising the steps of:

(a) collecting a first set of infrared data from a conductive pattern;

(b) circulating an electrical current throughout said conductive pattern;

(c) collecting a second set of infrared data from said conductive pattern;

(d) subtracting said first set of infrared data from said second set of infrared data whereby effects of pre-existing thermal non-uniformities may be removed;

(e) determining the performance of each portion of said conductive pattern; and

(f) making a decision based upon predetermined criteria.

12. A method of testing a conductive pattern according to claim 11 additionally comprising the step of determining the continuity of at least a portion of said conductive pattern.

13. A method of testing a conductive pattern according to claim 11 additionally comprising the step of determining the uniformity of at least a portion of said conductive pattern.

14. A method of testing a conductive pattern according to claim 11 additionally comprising the step of measuring inhomogeneities of at least a portion of said conductive pattern.

15. A method of testing a conductive pattern according to claim 11 additionally comprising the step of reporting said decision to external devices.

16. A method of testing a conductive pattern according to claim 11 further comprising the step of storing preexisting data that includes pattern coordinates of said conductive pattern such that the performance of a respective line of said conductive pattern can be determined.

17. A method of testing a conductive pattern according to claim 16 wherein the performance of said respective line of said conductive pattern is automatically determined.