System and method for single-beam internal reflection tomography

• US 6,618,463 B1
• Filed: 07/09/2002
• Issued: 09/09/2003
• Est. Priority Date: 07/09/2002
• Status: Expired due to Fees

• Current Assignee: Washington University In St Louis
• Original Assignee: Washington University In St Louis
• Inventors: Carney, Paul Scott, Schotland, John Carl
• Primary Examiner(s): BRUCE, DAVID VERNON
• Application Number:
  US10/191,666
• Time in Patent Office: 427 Days
• Field of Search: 378/4, 378/15, 378/21, 378/22, 378/901
• US Class Current: 378/21
• CPC Class Codes: G01N 21/4795 spatially resolved investigating of object in scattering medium in vivo A61B
• CPC Class Codes: G02B 21/0004 specially adapted for specific applications
• CPC Class Codes: Y10S 378/901 Computer tomography program or processor

Abstract

A methodology and concomitant system for three-dimensional near-field microscopy achieves subwavelength resolution of an object via total internal reflection. The features of this approach include: (i) the evanescent waves used for illumination encode on the scattered field the subwavelength structure of the scattering object—it is thus possible to obtain subwavelength resolved images of the sample as is done in other near-field techniques such as near-field scanning optical microscopy without the technical difficulties encountered with probe-sample interactions; and (ii) the results of the reconstruction are unambiguous in the sense that the relation between the scattered field and the three-dimensional structure of the sample, as described by the spatial dependence of the susceptibility, is made manifest.

Claims

1. A method for generating a tomographic image of an object comprising:

probing the object with incident evanescent waves,

detecting waves scattered by the object, and

reconstructing the tomographic image by executing a prescribed mathematical algorithm with reference to the incident waves and the scattered waves to generate the tomographic image with subwavelength resolution.

2. The method as recited in claim 1 wherein the detecting includes measuring scattering data from the object, said scattering data being related to a scattering potential of the object by an integral operator.

3. The method as recited in claim 2 wherein the reconstructing includes reconstructing the tomographic image by executing the prescribed mathematical algorithm, determined with reference to the integral operator, on the scattering data, the prescribed mathematical algorithm further relating the scattering potential to the scattering data by another integral operator.

4. The method as recited in claim 1 wherein the probing includes illuminating a prism to generate the incident waves.

5. A method for generating a tomographic image of an object comprising:

illuminating the object with incident evanescent waves,

measuring scattering data from the object wherein the scattering data is related to the object by an integral operator, and

reconstructing the tomographic image by executing a prescribed mathematical algorithm, determined with reference to the integral operator, on the scattering data to generate the tomographic image with subwavelength resolution.

6. The method as recited in claim 5 wherein the scattering data is related to a scattering potential of the object by the integral operator, and wherein the reconstructing includes reconstructing the tomographic image by executing the prescribed mathematical algorithm, determined with reference to the integral operator, on the scattering data, the prescribed mathematical algorithm further relating the scattering potential to the scattering data by another integral operator.

7. The method as recited in claim 5 wherein the illuminating includes illuminating a prism to generate the incident waves.

8. A system for generating a tomographic image of an object comprising:

a source for probing the object with incident evanescent waves,

a detector for detecting waves scattered by the object, and

a processor for reconstructing the tomographic image by executing a prescribed mathematical algorithm with reference to the incident waves and the scattered waves to generate the tomographic image with subwavelength resolution.

9. The system as recited in claim 8 wherein the detector includes means for measuring scattering data from the object, said scattering data being related to a scattering potential of the object by an integral operator.

10. The system as recited in claim 9 wherein the processor includes means for reconstructing the tomographic image by executing the prescribed mathematical algorithm, determined with reference to the integral operator, on the scattering data, the prescribed mathematical algorithm further relating the scattering potential to the scattering data by another integral operator.

11. A system for generating a tomographic image of an object comprising:

a source for illuminating the object with incident evanescent waves,

a detector for measuring scattering data from the object wherein the scattering data is related to the object by an integral operator, and

a processor for reconstructing the tomographic image by executing a prescribed mathematical algorithm, determined with reference to the integral operator, on the scattering data to generate the tomographic image with subwavelength resolution.

12. The system as recited in claim 11 wherein the scattering data is related to a scattering potential of the object by the integral operator, and wherein the processor includes means for reconstructing the tomographic image by executing the prescribed mathematical algorithm, determined with reference to the integral operator, on the scattering data, the prescribed mathematical algorithm further relating the scattering potential to the scattering data by another integral operator.