Program production system for semiconductor tester

• US 6,618,853 B1
• Filed: 10/07/1999
• Issued: 09/09/2003
• Est. Priority Date: 10/10/1998
• Status: Expired due to Fees

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: Ohyama, Chiaki, Hasebe, Junichi
• Primary Examiner(s): CHAVIS, JOHN Q
• Application Number:
  US09/415,041
• Time in Patent Office: 1,433 Days
• Field of Search: 717/109, 717/113, 717/125, 717/129, 700/121
• US Class Current: 717/109
• CPC Class Codes: G01R 31/31912 Tester/user interface
• CPC Class Codes: G06F 8/30 Creation or generation of source code

Abstract

There is disclosed a program production system for a semiconductor tester which performs production of programs while various kinds of information are viewed on screens. A user sets an execution sequence for commands on a target by specifying any from among the program cells included on a sequence setting screen and sets the functions used in semiconductor testing corresponding to those commands and the parameters accompanying the functions by using a function setting screen.

Claims

1. A program production system for generating a test program for a semiconductor tester comprising:

a sequence setting unit which displays a sequence setting screen possessing a plurality of program cells corresponding to an execution sequence of a program and which, when specifying any of said program cells, sets an execution sequence for commands on a target in correspondence with the positions of the specified program cells; and

a function setting unit which displays function setting screens which, when a plurality of previously prepared functions for semiconductor testing and parameters corresponding to said functions exist, includes those parameters, and which, when specifying any of said functions, sets said specified functions so as to correspond to said commands on a target and sets the values of said corresponding parameters, and

further comprising a parameter calculation unit for converting the values of parameters of said functions set by said function setting unit into an execution format;

for making groupings of prescribed codes corresponding to the types of said functions set by said function setting unit and the values of said parameters corresponding to said functions following conversion into an execution format by said parameter calculation unit; and

for producing a program as an object by arranging said groupings into an execution sequence set by said sequence setting unit in absence of performing a compiling operation.

2. The program production system for a semiconductor tester according to claim 1, wherein said functions corresponding to said commands and said parameters corresponding to said functions respectively correspond to functions of the C language and their corresponding parameters.

3. The program production system for a semiconductor tester according to claim 1, further comprising debugging execution unit for performing debugging operations by executing said program that is a target of production.

4. The program production system for a semiconductor tester according to claim 3, wherein break points for interrupting processing during debugging operations are set in a part of said program cells.

5. A program production system for a semiconductor tester according to claim 3, wherein setting of said break points is performed during said program production or during editing.