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X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects

  • US 6,621,888 B2
  • Filed: 07/08/2002
  • Issued: 09/16/2003
  • Est. Priority Date: 06/18/1998
  • Status: Expired due to Term
First Claim
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1. A method for inspecting an enclosure, the method comprising:

  • a. irradiating the enclosure with penetrating radiation emanating from a source;

    b. detecting radiation side-scattered from an object within the enclosure;

    c. locating the position of the object from the side-scattered radiation;

    d. determining whether the object is a suspect object on the basis of the side-scattered radiation;

    e. irradiating a volume element of the suspect object with penetrating radiation;

    f. detecting radiation coherently-scattered by the volume element of the suspect object in such a manner that the correspondence between a particular detector element and a given scattering angle is substantially independent of the location of the volume element of the suspect object within the enclosure;

    g. determining at least one of an energy spectrum and an angular distribution of radiation coherently-scattered by the volume element of the suspect object; and

    h. characterizing the volume element of the suspect object on the basis of at least one of the energy spectrum and the angular distribution of the coherently-scattered radiation.

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