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Robust sequential approach in detecting defective pixels within an image sensor

  • US 6,625,318 B1
  • Filed: 11/13/1998
  • Issued: 09/23/2003
  • Est. Priority Date: 11/13/1998
  • Status: Expired due to Fees
First Claim
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1. A method of detecting defective sensors in a sensor array comprising:

  • performing an observation of an object on a sensor array having a plurality of pixels, each pixel corresponding to a sensor of said sensor array and each sensor generating a pixel value for the corresponding pixel;

    for each of said pixels, determining a score based on statistical analysis of said pixel values using said observation; and

    if said score for said each pixel satisfies a stopping condition, classifying said each pixel as being one of either defective or functional.

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