Method and circuit for analysis of the operation of a microcontroller using signature analysis of memory

• US 6,625,688 B1
• Filed: 05/10/1999
• Issued: 09/23/2003
• Est. Priority Date: 05/10/1999
• Status: Expired due to Term

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Delphi Technologies, Inc. (BorgWarner Incorporated)
• Inventors: Fruehling, Terry L., Helm, Troy L., Waidner, John
• Primary Examiner(s): PORTKA, GARY J
• Application Number:
  US09/309,055
• Time in Patent Office: 1,597 Days
• Field of Search: 711/109, 711/110, 714/30, 714/42, 714/718, 714/722, 714/732, 714/733, 714/734
• US Class Current: 711/109
• CPC Class Codes: G06F 11/2236 to test CPU or processors

Abstract

A method and circuit for determining the health of a microcontroller is provided having a circuit that includes a bus, a CPU coupled to the bus and a register coupled to the bus. A memory is also coupled to the bus. The memory is utilized by the first CPU. A controller is coupled to the register for controlling reading of the memory. The register generates a signature in response to the memory. The controller compares the reference signature and the second signature. The controller generated a fault signal when the reference signature is unequal to the second signature.

Claims

1. A circuit comprising:

a bus;

a first CPU coupled to the bus, the first CPU being operable to execute an algorithm during normal operation;

a register coupled to the bus;

a memory coupled to the bus, said memory containing the algorithm embodied in a plurality of operation codes, said memory utilized by said first CPU; and

,

a controller coupled to the register for controlling reading of said operation codes from said memory during normal operation of the CPU and responsively generating a signature, said CPU comparing said signature and a reference signature in parallel with normal operation of said first CPU during an idle cycle of the first CPU, said controller generating a fault signal when the reference signature is unequal to the signature.

2. A circuit as recited in claim 1 further comprising a total cycle counter coupled to the bus control logic.

3. A circuit as recited in claim 1 wherein said register comprises a linear feedback shift register.

4. A circuit as recited in claim 1 wherein said register is comprised of a first data register coupled to said bus, and a control register coupled to said bus.

5. A circuit as recited in claim 4 further comprising a second data register coupled to said bus.

6. A circuit as recited in claim 5 further comprising a plurality of feedback register stages coupled to said first data register, said second data register and said control register.

7. A circuit as recited in claim 1 further comprising a second CPU coupled to the bus, said second CPU concurrently utilizing said memory with said first CPU.

8. A circuit as recited in claim 7 further comprising an isolation gate coupled to the said bus between said first CPU and said second CPU.

9. A circuit as recited in claim 1 wherein said memory is noncontiguous.

10. A method of validating the memory of a microcontroller unit, the microcontroller having a CPU, an independent controller coupled to the CPU, and a memory block coupled to the CPU, said method comprising the steps of:

obtaining a reference signature;

reading the content of the memory block in parallel with normal operation of the microcontroller unit, the content of the memory block comprising an algorithm of an embedded application executed by the CPU;

generating, by the controller during execution of the algorithm by the CPU, a second signature in response to contents of the memory block;

comparing the reference signature to the second signature without CPU intervention to obtain a comparison in parallel with normal operation of the microcontroller unit during an idle cycle of the CPU; and

,

indicating a fault in response to the comparison.

11. A method as recited in claim 10 wherein the step of reading comprises the step of reading during a background mode.

12. A method as recited in claim 10 wherein the step of reading comprises the step of reading the contents of the memory block during a free cycle.

13. A method as recited in claim 10 further comprising the step of forcing a free cycle if a free cycle does not exist.

14. A method as recited in claim 10 wherein the step of obtaining a reference signature comprises the step of learning a reference signature.

15. A method as recited in claim 10 wherein the step of obtaining a reference signature comprises the step of retrieving the reference signature from a pattern memory.

16. A method as recited in claim 10 further comprising the step of receiving a start address and an end address.

17. A method as recited in claim 10 wherein the step of reading the contents of the memory block comprises the step of consecutively cycling through said memory block from the start address to the end address.

18. A method as recited in claim 10 wherein the step of indicating a fault comprises the steps of disabling an output while the CPU continues to run.

19. A method as recited in claim 10 wherein the step of indicating a fault comprises the step of generating a reset.

20. A method as recited in claim 10 wherein the step of indicating a fault comprises the steps of initiating a fault counter.

21. A method as recited in claim 10 wherein the step of indicating a fault comprises the step of generating a vectored interrupt.

22. A method as recited in claim 10 wherein the step of indicating a fault comprises the steps of executing a service routine to obtain increased detail fault diagnostics.

23. A method as recited in claim 10 further comprising the step of initializing a shift register.

24. A method as recited in claim 23 wherein the step of initializing the shift register comprises the step of clearing the shift register.

25. A method as recited in claim 23 wherein the step of initializing the shift register comprises the step of loading a starting value into the shift register.

26. A method as recited in claim 10 wherein the step of generating a second signature comprises the step of generating a second signature in a linear feedback shift register.

27. A microcontroller, comprising:

a CPU;

a memory coupled to the CPU, the CPU being adapted to perform operations on the memory during normal operation of the microcontroller; and

,

a self-test module coupled to the memory and being adapted to test operation of the memory during normal operation of the microcontroller, wherein the self-test module is adapted to generate a signature in response to contents of the memory and compare the signature with a reference signature and to read a value of at least two memory locations within the memory and wherein the signature is a function of the values from the at least two memory locations and wherein the self-test module is adapted to read the values from the at least two memory locations during a n idle cycle of the CPU, to count a number of continuous cycles of the CPU in which the CPU is not idle, and to compare the number of continuous cycles of the CPU in which the CPI is not idle with a predetermined value a and force a CPU idle cycle if the number exceeds the predetermined value.

28. A microcontroller, comprising:

a CPU, the CPU being operable to execute an embedded application algorithm during normal operation;

a memory coupled to the CPU, the memory containing the embedded application algorithm embodied in a plurality of operation codes; and

,

a self-test module coupled to the memory and being adapted, during normal operation of the microcontroller during an idle cycle of the CPU, to read a value of at least two memory locations within the memory from the at least two memory locations, to generate a signature as a function of the values from the at least two memory locations, and to compare the signature with a reference signature during an idle cycle of the CPU.

29. A microcontroller, as set forth in claim 28, wherein the self-test module is adapted to count a number of continuous cycles of the CPU in which the CPU is not idle.

30. A microcontroller, comprising:

a CPU;

a memory coupled to the CPU, the CPU being adapted to perform operations on the memory during normal operation of the microcontroller; and

,

a self-test module coupled to the memory and being adapted, during normal operation of the microcontroller, to read a value of at least two memory locations within the memory from the at least two memory locations, to generate a signature as a function of the values from the at least two memory locations, and to compare the signature with a reference signature, wherein the self-test module is adapted to count a number of continuous cycles of the CPU in which the CPU is not idle and wherein the self-test module is adapted to compare the number of continuous cycles of the CPU in which the CPU is not idle with a predetermined value and force a CPU idle cycle if the number exceeds the predetermined value.

31. A method for testing a microcontroller having a CPU and a memory coupled to the CPU, including the steps of:

operating the microcontroller under normal operations;

reading values from a plurality memory locations within the memory during the normal operations;

determining a signature as a function of the values;

comparing the signature with a reference signature;

comparing the number of continuous cycles of the CPU in which the CPU is not idle with a predetermined value; and

,

forcing a CPU idle cycle if the number exceeds the predetermined value.

32. A method, as set forth in claim 31, wherein the step of reading values from a plurality memory locations within the memory during the normal operations occurs in a foreground mode.