Test bus architecture

• US 6,625,768 B1
• Filed: 03/29/2000
• Issued: 09/23/2003
• Est. Priority Date: 03/29/2000
• Status: Expired due to Fees

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Jie, Ni, Susnow, Dean S., Collins, Brian M., Burton, Tom E., Reohr, Richard D. Jr., Gasbarro, Dominic J., Leitner, Brian M.
• Primary Examiner(s): Decady, Albert
• Assistant Examiner(s): Dooley, Matthew C.
• Application Number:
  US09/537,398
• Time in Patent Office: 1,273 Days
• Field of Search: 714/30, 714/724, 714/726, 714/727, 714/729, 714/733, 714/734, 714/738, 324/73.1, 326/16
• US Class Current: 714/729
• CPC Class Codes: G01R 31/31723 Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes routing the test signal to or from the device under test G01R31/31926
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
• CPC Class Codes: G01R 31/31926 Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Abstract

A test bus architecture for testing an integrated circuit having a plurality of agents includes providing both a test block select signal and test function select signal to a plurality of select decoders respectively disposed in each of the plurality of agents. The test block select signal has a number of states at least equal to the number of agents and the test function select signal at least equal to a maximum number of internal signal groups of any one of the agents, each select decoder having at least one internal signal group which is outputted from circuitry to be tested within the agent of the select decoder. An output from each of the select decoders is fed to a test bus output such that a selected internal signal group is outputted to the test bus output upon the agent of the selected signal group being selected by the state of the test block select signal and the selected signal group being selected by the state of the test function select signal by the select decoder.

Claims

1. A method of testing an integrated circuit comprising a plurality of agents, the method comprising:

providing a test block select signal to a plurality of select decoders respectively disposed in each of said plurality of agents;

providing at least one internal signal group to each select decoder, said at least one internal signal group being outputted from circuitry to be tested within the agent of said select decoder;

providing a test function select signal to said select decoders of said plurality of agents; and

providing an output from each of said select decoders to a test bus output;

wherein a selected internal signal group is outputted to said test bus output upon the agent of said selected signal group being selected in accordance with said test block select signal and the selected signal group being selected in accordance with said test function select signal by the select decoder.

2. The method of claim 1, wherein said test block select signal has a number of states equal to at least one or more than the number of agents, said agent being selected in accordance with the state of said test block select signal.

3. The method of claim 2, further comprising providing a plurality of signal lines sufficient to represent the number of states for the test block select signal in binary form.

4. The method of claim 1, wherein said test function select signal has a number of states at least equal to a maximum number of internal signal groups of any one of said plurality of agents, said selected signal group being selected in accordance with the state of said test function select signal.

5. The method of claim 4, further comprising providing a plurality of signal lines sufficient to represent the number of states for the test function select signal in binary form.

6. The method of claim 1, wherein each of said at least one internal signal group of each select decoder is selected sequentially to be outputted to said test bus output.

7. The method of claim 1, wherein each of said at least one internal signal group of each select decoder is selected in a predetermined order to be outputted to said test bus output.

8. The method of claim 1, wherein the test bus originates internally to one of the plurality of agents.

9. The method of claim 1, wherein the test block select signal is provided simultaneously with the test function select signal.

10. An apparatus for testing an integrated circuit comprising a plurality of agents, the apparatus comprising:

a select decoder disposed in each of the plurality of agents;

a test block select signal generator for providing a test block select signal to said plurality of select decoders;

each of said select decoders being connected to at least one internal signal group of its respective agent, said at least one internal signal group being outputted from circuitry to be tested within the agent of said select decoders;

a test function select signal generator for providing a test function select signal to said decoders of said plurality of agents; and

an output circuit for providing an output from each of said select decoders to a test bus output;

wherein a selected internal signal group is outputted to said test bus output upon the agent of said selected signal group being selected in accordance with said test block select signal and the selected signal group being selected in accordance with said test function select signal by the select decoder.

11. The apparatus of claim 10, wherein said test block select signal has a number of states equal to at least one or more than the number of agents, said agent being selected in accordance with the state of said test block select signal.

12. The apparatus of claim 11, wherein the test block signal comprises a plurality of signal lines sufficient to represent the number of states for the test block select signal in binary form.

13. The apparatus of claim 10, wherein said test function select signal has a number of states at least equal to a maximum number of internal signal groups of any one of said plurality of agents, said selected signal group being selected in accordance with the state of said test function select signal.

14. The apparatus of claim 13, wherein the test function signal comprises a plurality of signal lines sufficient to represent the number of states for the test function select signal in binary form.

15. The apparatus of claim 10, wherein said output circuit comprises at least one OR gate.

16. The apparatus of claim 10, wherein said select decoder comprises:

a first multiplexer having inputs to receive internal signal groups from each of the internal signals of the agent of said select decoder and providing an output corresponding to one of said internal signal groups in accordance with said test function select signal, said test function select signal being inputted to said first multiplexer;

a second multiplexer having a first input connected to said output of said first multiplexer and having a second input connected to a logic 0 level and for selectively outputting one of said first and second inputs in response to a control signal input thereto;

a comparator having an input connected to said test block select signal and having a predetermined signal inputted to another input of said comparator, said comparator having an output connected to said control input of said second multiplexer, said output of said comparator assuming a predetermined value upon the signals inputted thereto being identical; and

an OR gate having an input connected to an output of said second multiplexer and having another input connected to a test bus output of another of said agents and having an output connected to said test bus output.

17. The apparatus of claim 10, wherein each of said at least one internal signal group of each select decoder is selected sequentially to be outputted to said test bus output.

18. The apparatus of claim 10, wherein each of said at least one internal signal group of each select decoder is selected in a predetermined order to be outputted to said test bus output.

19. The apparatus of claim 10, wherein the test bus originates internally to one of the plurality of agents.

20. The apparatus of claim 10, wherein the test block select signal is provided simultaneously with the test function select signal.

21. An integrated circuit apparatus comprising:

a plurality of agents;

a select decoder disposed in each of the plurality of agents;

a test block select signal generator for providing a test block select signal to said plurality of select decoders;

each of said select decoders being connected to at least one internal signal group of its respective agent, said at least one internal signal group being outputted from circuitry to be tested within the agent of said select decoders;

a test function select signal generator for providing a test function select signal to said decoders of said plurality of agents;

an output circuit for providing an output from each of said select decoders to a test bus output;

wherein as selected internal signal group is outputted to said test bus output upon the agent of said selected signal group being selected in accordance with said test block select signal and the selected signal group being selected in accordance with said test function select signal by the select decoder.

22. The apparatus of claim 21, wherein said test block select signal has a number of states equal to at least one or more than the number of agents, said agent being selected in accordance with the state of said test block select signal.

23. The apparatus of claim 22, wherein the test block signal comprises a plurality of signal lines sufficient to represent the number of states for the test block select signal in binary form.

24. The apparatus of claim 21, wherein said test function select signal has a number of states at least equal to a maximum number of internal signal groups of any one of said plurality of agents, said selected signal group being selected in accordance with the state of said test function select signal.

25. The apparatus of claim 24, wherein the test function signal comprises a plurality of signal lines sufficient to represent the number of states for the test function select signal in binary form.

26. The apparatus of claim 21, wherein said output circuit comprises at least one OR gate.

27. The apparatus of claim 21, wherein said select decoder comprises:

a first multiplexer having inputs to receive internal signal groups from each of the internal signals of the agent of said select decoder and providing an output corresponding to one of said internal signal groups in accordance with said test function select signal, said test function select signal being inputted to said first multiplexer;

a second multiplexer having a first input connected to said output of said first multiplexer and having a second input connected to a logic 0 level and for selectively outputting one of said first and second inputs in response to a control signal input thereto;

a comparator having an input connected to said test block select signal and having a predetermined signal inputted to another input of said comparator, said comparator having an output connected to said control input of said second multiplexer, said output of said comparator assuming a predetermined value upon the signals inputted thereto being identical; and

an OR gate having an input connected to an output of said second multiplexer and having another input connected to a test bus output of another of said agents and having an output connected to said test bus output.

28. The apparatus of claim 21, wherein each of said at least one internal signal group of each select decoder is selected sequentially to be outputted to said test bus output.

29. The apparatus of claim 21, wherein each of said at least one internal signal group of each select decoder is selected in a predetermined order to be outputted to said test bus output.

30. The apparatus of claim 21, wherein the test bus originates internally to one of the plurality of agents.

31. The apparatus of claim 21, wherein the test block select signal is provided simultaneously with the test function select signal.