Imaging with digital tomography and a rapidly moving x-ray source

• US 6,628,745 B1
• Filed: 07/02/2001
• Issued: 09/30/2003
• Est. Priority Date: 07/01/2000
• Status: Expired due to Fees

• Current Assignee: Reveal Imaging Technologies, Inc. (Leidos Holdings, Inc.)
• Original Assignee: Martin Annis, Richard Adler
• Inventors: Adler, Richard, Annis, Martin
• Primary Examiner(s): Dunn, Drew A.
• Assistant Examiner(s): Yun, Jurie
• Application Number:
  US09/897,715
• Time in Patent Office: 820 Days
• Field of Search: 378/57, 378/21, 378/20, 378/19, 378/12, 378/10, 378/14, 378/22, 378/143, 378/137, 378/138, 378/62, 378/26
• US Class Current: 378/21
• CPC Class Codes: A61B 6/032 Transmission computed tomography [CT]
• CPC Class Codes: A61B 6/4028 resulting in acquisition of views from substantially different positions, e.g. EBCT
• CPC Class Codes: A61B 6/4078 Fan-beams
• CPC Class Codes: A61B 6/4441 the rigid structure being a C-arm or U-arm
• CPC Class Codes: G01N 2223/204 source created from radiated target
• CPC Class Codes: G01N 2223/419 computed tomograph
• CPC Class Codes: G01V 5/226 using tomography

Abstract

A digital tomography system includes an electron source that provides a beam of electrons, and an electromagnet assembly that receives said beam of electrons and is configured and arranged to direct the beam of electrons along a selected path, wherein the assembly provides a redirected beam of electrons. The system also includes a target that is struck by the redirected beam of electrons and generates a cone of x-rays, and a slit collimator that receives the cone of x-rays and generates a fan beam. A first line of detectors is positioned to detect x-rays that pass through the object under inspection, and provide sensed signals indicative thereof to a controller that receives the sensed signals and forms a displayable image of a selected plane through the object under inspection.

Claims

1. A digital tomography system, comprising:

an electron source that provides a pencil beam of electrons;

an electromagnet assembly that receives said pencil beam of electrons and is configured and arranged to direct said beam of electrons along a selected path, to bend said pencil beam of electrons and to scan the bended electron beam along a line to form a scanning redirected beam;

a linear target that is struck by said scanning redirected beam of electrons and generates a cone of x-rays that moves along a target line as a result of said scanning redirected beam;

a slit collimator that receives said scanning cone of x-rays and generates a scanning fan beam, which are directed to an object under inspection, wherein each point in the object under inspection receives x-rays from various angles;

a first line of detectors positioned in the same plane as the linear target to detect xrays that pass through the object under inspection, and provide sensed signals indicative thereof; and

a processing system that receives said sensed signals and forms a digital tomographic image of selected planes through the object under inspection.

2. The digital tomography system of claim 1, wherein said electron source includes a high voltage electron accelerator.

3. The digital tomography system of claim 1, wherein said electron source includes a nested high voltage electron generator.

4. The digital tomography system of claim 1, wherein said first line of detectors includes a plurality of photo multiplier tubes.

5. The digital tomography system of claim 1, further comprising a second line of detectors and a third line of detectors, each perpendicular to said first line of detectors, wherein said first, second and third line of detectors form a U-shaped detector configured and arranged to detect x-rays that pass through the object under inspection.

6. The digital tomography system of claim 1, said first line of detectors includes a plurality of solid state detectors.

7. A computed tomography system, comprising:

means for providing a pencil beam of electrons;

means for receiving said pencil beans of electrons, for directing said beam of electrons along a selected path, and for bending said pencil beam of electrons and for scanning said bended electron beam along a line to form a scanning redirected beam;

a linear target that is struck by said scanning redirected beam of electrons and generates a cone of x-rays that moves along a target line as a result of said scanning redirected beam;

a collimator that receives said scanning cone of x-rays and generates a scanning fan beam directed to an object under inspection, wherein each point in the object under inspection receives x-rays from at least 180 degrees about the object under inspection;

a line of detectors positioned in the same plane as the linear target to detect x-rays that pass through the object under inspection, and provide sensed signals indicative thereof; and

a processing system that receives said sensed signals and forms a computed tomography image of selected planes through the object under inspection.

8. The computed tomography system of claim 7, further comprising a platform that moves laterally and rotates, and onto which the object under inspection is placed.

9. The computed tomography system of claim 7, wherein said means for providing a pencil beam of electrons is separated from said linear target by about 18 inches.

10. A computed tomography system, comprising:

a plurality of x-ray sources arranged around an object under inspection, each of said x-ray sources including

(i) means for providing a pencil beam of electrons;

(ii) an electromagnet assembly that receives said pencil beam of electrons and is configured and arranged to direct said beam of electrons along a selected path and bend said pencil beam of electrons and scans the bended electron beam along a line to form a scanning redirected beam;

(iii) a linear target that is struck by said scanning redirected beam of electrons and generates a cone of x-rays that moves along a target line as a result of said scanning redirected beam;

(iv) a slit collimator that receives said scanning cone of x-rays and generates a scanning fan beam directed to an object under inspection,

wherein said plurality of x-ray sources surround the object under inspection such that the object receives x-rays from at least 180 degrees about the object under inspection;

lines of detectors positioned to detect x-rays that pass through the object under inspection, and provide sensed signals indicative thereof; and

a computing device that receives said sensed signals to form a computed tomography image of the object under inspection.

11. The computed tomography system of claim 10, wherein said detectors comprise a plurality of substantially U-shaped detectors that detect x-rays from each of said x-ray sources, wherein each of said U-shaped detectors includes first and second parallel detector arms separated by a perpendicular detector arm, each including a plurality of photodetective elements.

12. The computed tomography system of claim 10, further comprising a platform that moves laterally and rotates, and onto which the object under inspection is placed.

13. The computed tomography system of claim 10, wherein the object under inspection includes luggage.

14. The computed tomography system of claim 10, wherein each means for providing a pencil beam of electrons is separated from its associated linear target by about 18 inches.