Input control apparatus, display control apparatus and display apparatus
First Claim
1. An input control apparatus mounted on semiconductor device manufacturing equipment for subjecting a plurality of processes to a substrate to manufacture semiconductor devices, comprising:
- a display unit having a touch panel configured to input data regarding the processes;
an input detection section configured to detect a start of inputting of the data from said touch panel and an elapse of a predetermined period of time from the start of inputting of the data; and
a neglecting section configured to neglect at least one input following a first input, the at least one input and the first input being input within the predetermined period of time, to receive only the first input, wherein said touch panel includes a scroll button for designating scrolling on a display, said input detection section comprises a detector which detects click-on and click-off of said scroll button as the start and end of the data input period, and said neglecting section comprises a neglecting section which neglects second and subsequent operations of said scroll button within the input period.
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Abstract
An input control apparatus mounted on a semiconductor device manufacturing equipment, or the semiconductor device manufacturing equipment, which subjects a plurality of processes to a substrate to manufacture semiconductor devices. A display unit includes a touch panel configured to input data regarding the processes. An input detection section detects a start of inputting of the data from the touch panel and an elapse of a predetermined period of time from the start of inputting of the data. A neglecting section neglects at least one input following a first input, the at least one input and the first input being input within the predetermined period of time, to receive only the first input.
46 Citations
11 Claims
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1. An input control apparatus mounted on semiconductor device manufacturing equipment for subjecting a plurality of processes to a substrate to manufacture semiconductor devices, comprising:
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a display unit having a touch panel configured to input data regarding the processes;
an input detection section configured to detect a start of inputting of the data from said touch panel and an elapse of a predetermined period of time from the start of inputting of the data; and
a neglecting section configured to neglect at least one input following a first input, the at least one input and the first input being input within the predetermined period of time, to receive only the first input, wherein said touch panel includes a scroll button for designating scrolling on a display, said input detection section comprises a detector which detects click-on and click-off of said scroll button as the start and end of the data input period, and said neglecting section comprises a neglecting section which neglects second and subsequent operations of said scroll button within the input period.
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2. An input control apparatus mounted on semiconductor device manufacturing equipment for subjecting a plurality of processes to a substrate to manufacture semiconductor devices, comprising:
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a display unit having a touch panel configured to input data regarding the processes;
an input detector configured to detect a start and end of an input period for inputting data from said touch panel;
a period detection section configured to detect an elapse of a first period from the start of the input period and repeatedly detect an elapse of a second period upon the elapse of the first period; and
an input updating section configured to, when the end of the input period is detected before a first elapse of the second period, recognize detection of the end of the input period as one input completion cycle, and when the input period continues after the first elapse of the second period, recognize an input completion cycle every time the second period has elapsed. - View Dependent Claims (3, 4)
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5. Semiconductor device manufacturing equipment for subjecting a plurality of processes to a wafer to manufacture semiconductor devices, comprising:
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a cassette station configured to load/unload in/from said semiconductor device manufacturing equipment a plurality of wafers;
a process station including various wafer process machines each of which performs one of the processes for each wafer; and
an interface section configured to exchange the wafer with an exposure device arranged adjacent to said process station, and wherein said interface section includes;
a display unit having a touch panel configured to input data regarding the process;
an input detection section configured to detect a start of inputting of the data from said touch panel and an elapse of a predetermined period of time from the start of inputting of the data; and
a neglecting section configured to neglect at least one input following a first input, the at least one input and the first input being input within the predetermined period of time, to receive only the first input, wherein said touch panel includes a scroll button for designating scrolling on a display, said input detection section comprises means for detecting click-on and click-off of said scroll button as the start and end of the data input period, and said neglecting section comprises means for neglecting second and subsequent operations of said scroll button within the input period.
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6. Semiconductor device manufacturing equipment for subjecting a plurality of processes to a wafer to manufacture semiconductor devices, comprising;
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a cassette station configured to load/unload in/from said semiconductor device manufacturing equipment a plurality of wafers;
a process station including various wafer process machines each of which performs one of the processes for each wafer; and
an interface section configured to exchange the wafer with an exposure device arranged adjacent to said process station, and wherein said interface section includes;
a display unit having a touch panel configured to input data regarding the processes;
an input detector configured to detect a start and end of an input period for inputting data from said touch panel;
a period detection section configured to detect an elapse of a first period from the start of the input period and repeatedly detect an elapse of a second period upon the elapse of the first period; and
an input updating section configured to, when the end of the input period is detected before a first elapse of the second period, recognize detection of the end of the input period as one input completion cycle, and when the input period continues after the first elapse of the second period, recognize an input completion cycle every time the second period has elapsed. - View Dependent Claims (7, 8)
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9. Semiconductor device manufacturing equipment for subjecting a process to a wafer to manufacture semiconductor devices, comprising:
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a process station including a wafer process machine which performs the process for the wafer; and
an input control apparatus, and wherein said input control apparatus includes;
a display unit having a touch panel configured to input data regarding the process;
an input detection section configured to detect a start of inputting of the data from said touch panel and an elapse of a predetermined period of time from the start of inputting of the data; and
a neglecting section configured to neglect at least one input following a first input, the at least one input and the first input being input within the predetermined period of time, to receive only the first input, wherein said touch panel includes a scroll button for designating scrolling on a display, said input detection section comprises means for detecting click-on and click-off of said scroll button as the start and end of the data input period, and said neglecting section comprises means for neglecting second and subsequent operations of said scroll button within the input period.
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10. Semiconductor device manufacturing equipment for subjecting a process to a wafer to manufacture a semiconductor device, comprising:
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a process station including a wafer process machine which performs the process for the wafer; and
an input control apparatus, and wherein said input control apparatus includes;
a display unit having a touch panel configured to input data regarding the process;
an input detector configured to detect a start and end of an input period for inputting data from said touch panel;
a period detection section configured to detect an elapse of a first period from the start of the input period and repeatedly detect an elapse of a second period upon the elapse of the first period; and
an input updating section configured to, when the end of the input period is detected before a first elapse of the second period, recognize detection of the end of the input period as one input completion cycle, and when the input period continues after the first elapse of the second period, recognize an input completion cycle every time the second period has elapsed. - View Dependent Claims (11)
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Specification