Method and apparatus for the electrical testing of printed circuit boards employing intermediate layer grounding

• US 6,630,832 B1
• Filed: 02/27/2001
• Issued: 10/07/2003
• Est. Priority Date: 06/16/1998
• Status: Expired due to Fees

• Current Assignee: Orbotech Limited (KLA Corporation)
• Original Assignee: Orbotech Limited (KLA Corporation)
• Inventors: Weber, Raviv, Harzanu, Benyamin, Golan, Hanan
• Primary Examiner(s): Le, N.
• Assistant Examiner(s): Dole, Timothy J.
• Application Number:
  US09/719,753
• Time in Patent Office: 952 Days
• Field of Search: 324/537, 324/95, 324/501, 324/750, 324/158.1, 324/538
• US Class Current: 324/537
• CPC Class Codes: G01R 31/2805 Bare printed circuit boards
• CPC Class Codes: G01R 31/2818 using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors G01R31/2805 takes precedence; printed circuits having, e.g. symbols, test patterns or visualisation means H05K1/0266
• CPC Class Codes: G01R 31/312 by capacitive methods

Abstract

This invention discloses an apparatus for electrical testing of an electrical circuit (12) having first and second side surfaces and including a plurality of conductors, the apparatus including at least one stimulation electrode (14, 16, 20) disposed adjacent at least one of the first and second side surfaces of the electrical circuit and being operative to apply thereto a stimulation electromagnetic field in a non-contact manner, at least one sensing electrode (25) disposed adjacent at least one of the first and second side surfaces of the electrical circuit and being operative to sense a resulting electromagnetic field produced by application of the stimulation electromagnetic field at various locations thereon in a non-contact manner wherein at least one of the at least one stimulation electrode and the at least one sensing electrode includes at least two electrodes at least one of which is disposed adjacent each of the first and second side surfaces of the electrical circuit. A method for electrical testing of an electrical circuit having first and second side surfaces and including a plurality of conductors is also disclosed.

Claims

1. Apparatus for electrical testing of an electrical circuit having first and second side surfaces and including a plurality of conductors, the apparatus comprising:

at least one stimulation electrode disposed adjacent at least one of said first and second side surfaces of said electrical circuit and being operative to apply thereto a stimulation electromagnetic field in a non-contact manner;

at least one sensing electrode disposed adjacent at least one of said first and second side surfaces of said electrical circuit and being operative to sense a resulting electromagnetic field produced by application of said stimulation electromagnetic field at various locations thereon in a non-contact manner;

a ground interconnect grounding an intermediate layer of said electrical circuit;

wherein at least one of said at least one stimulation electrode and said at least one sensing electrode includes at least two electrodes.

2. Apparatus for electrical testing of an electrical circuit according to claim 1 and wherein said at least one simulation electrode includes at least first and second simulation electrodes disposed adjacent respective ones of said first and second side surfaces of said electrical circuit.

3. Apparatus for electrical testing of an electrical circuit according to claim 1, and wherein said at least one sensing electrode includes at least first and second sensing electrodes disposed adjacent respective ones of said first and second side surfaces of said electrical circuit.

4. Apparatus for electrical testing of an electrical circuit according to claim 1, and also comprising at least one stimulation signal generator providing at least one stimulation signal to said at least one stimulation electrode.

5. Apparatus for electrical testing of an electrical circuit according to claim 4, and wherein said at least one stimulation signal generator provides stimulation signals to a plurality of stimulation electrodes in a manner such that signals induced in said electrical circuit by individual ones of said stimulation electrodes may be distinguished from each other.

6. Apparatus for electrical testing of an electrical circuit according to claim 5, and also comprising at least one separating detector for receiving from said at least one sensing electrode signals induced in said electrical circuit by individual ones of said stimulation electrodes and distinguishing said signals from each other.

7. Apparatus for electrical testing of an electrical circuit according to claim 5, and wherein said at least one signal generator provides signals having different frequencies to different ones of said stimulation electrodes.

8. Apparatus for electrical testing of an electrical circuit according to claim 5, and wherein said at least one signal generator provides multiplexed signals to different ones of said stimulation electrodes.

9. Apparatus for electrical testing of an electrical circuit according to claim 1, and also comprising a signal analyzer operative to analyze at least one signal received from said at least one sensing electrode.

10. Apparatus for electrical testing of an electrical circuit according to claim 1, and also comprising a comparator receiving at least one signal derived from said resulting electromagnetic field and comparing said at least one signal with a reference.

11. Apparatus for electrical testing of an electrical circuit according to claim 10, and also comprising a defect report generator providing a defect report relating to said electrical circuit based on the output of said comparator.

12. Apparatus for electrical testing of an electrical circuit according to claim 1, and wherein said at least one stimulation electrode comprises first and second stimulation electrodes arranged to be disposed alongside a first side of said electrical circuit and a third stimulation electrode arranged to be disposed alongside a second side of said electrical circuit.

13. Apparatus for electrical testing of an electrical circuit according to claim 12, and wherein a linear array is disposed intermediate said first and second stimulation electrodes.

14. Apparatus for electrical testing of an electrical circuit according to claim 1, and wherein said at least one sensing electrode comprises a linear array of sensing electrodes.

15. Apparatus for electrical testing of an electrical circuit according to claim 1, and wherein said at least one stimulation electrode comprises a linear array of stimulation electrodes.

16. Apparatus for electrical testing of an electrical circuit according to claim 15, and wherein said linear array is disposed intermediate said first and second stimulation electrodes.

17. Apparatus for electrical testing of an electrical circuit according to claim 1, and wherein said at least one sensing electrode comprises first and second sensing electrodes arranged to be disposed alongside a first side of said electrical circuit and a third sensing electrode arranged to be disposed alongside a second side of said electrical circuit.

18. Apparatus for electrical testing for an electrical circuit according to claim 1, and wherein said at least one sensing electrode comprises first and second sensing electrodes arranged to be disposed alongside a first side of said electrical circuit.

19. Apparatus for electrical testing of an electrical circuit according to claim 18, and wherein a linear array is disposed intermediate first and second stimulation electrodes.

20. Apparatus for electrical testing of an electrical circuit according to claim 1, and wherein said at least one stimulation electrode comprises a plurality of individually controllable sections.

21. A method for electrical testing of an electrical circuit having first and second side surfaces and including a plurality of conductors, the method comprising:

applying an electromagnetic field in a non-contact manner to at least one of first and second side surfaces of said electrical circuit;

grounding an intermediate metal layer in said electrical circuit; and

sensing a resulting electromagnetic field in a non-contact manner at various locations along at least one of said first and second side surfaces of said electrical circuit, wherein at least one of said applying and sensing employs non-contact electrodes.

22. A method for electrical testing of an electrical circuit according to claim 21, and wherein said applying step includes employing at least first and second stimulation electrodes disposed adjacent respective ones of said first and second side surfaces of said electrical circuit to apply at least one said electromagnetic field thereto.

23. A method for electrical testing of an electrical circuit according to claim 21, and wherein said sensing step includes employing at least first and second sensing electrodes disposed adjacent respective ones of said first and second side surfaces of said electrical circuit to sense said resulting electromagnetic field.

24. A method for electrical testing of an electrical circuit according claim 21, and also comprising generating at least one stimulation signal and providing it to at least one stimulation electrode.

25. A method for electrical testing of an electrical circuit according to claim 24, and wherein said generating step provides said stimulation signals to a plurality of stimulation electrodes in a manner such that signals induced in said electrical circuit by individual ones of said stimulation electrodes may be distinguished from each other.

26. A method for electrical testing of an electrical circuit according to claim 25, and also comprising receiving signals induced in said electrical circuit by individual stimulation electrodes and distinguishing said signals from each other.

27. A method for electrical testing of an electrical circuit according to claim 25, and wherein said generating step provides signals having different frequencies to different ones of said stimulation electrodes.

28. A method for electrical testing of an electrical circuit according to claim 25, and wherein said generating step provides multiplexed signals to different ones of said stimulation electrodes.

29. A method for electrical testing of an electrical circuit according to claim 21, and also comprising analyzing at least one signal induced in said electrical circuit.

30. A method for electrical testing of an electrical circuit according to claim 21, and also comprising receiving at least one signal derived from said resulting electromagnetic field and comparing said at least one signal with a reference.

31. A method for electrical testing of an electrical circuit according to claim 30, and also comprising providing a defect report relating to said electrical circuit based on the comparing step.

32. A method for electrical testing of an electrical circuit according to claim 21, and wherein said applying step employs first and second stimulation electrodes disposed alongside a first side of said electrical circuit and a third stimulation electrode disposed alongside a second side of said electrical circuit.

33. A method for electrical testing of an electrical circuit according to claim 32, and wherein a linear array is disposed intermediate first and second stimulation electrodes.

34. A method for electrical testing of an electrical circuit according to claim 32, and wherein a linear array is disposed intermediate first and second stimulation electrodes.

35. A method for electrical testing of an electrical circuit according to claim 21, and wherein said sensing step employs a linear array of sensing electrodes.

36. A method for electrical testing of an electrical circuit according to claim 21, and wherein said applying step employs a linear array of stimulation electrodes.

37. A method for electrical testing of an electrical circuit according to claim 36, and wherein said linear array is disposed intermediate first and second stimulation electrodes.

38. A method for electrical testing of an electrical circuit according to claim 21, and wherein said sensing step employs first and second sensing electrodes disposed alongside a first side of said electrical circuit and a third sensing electrode disposed alongside a second side of said electrical circuit.

39. A method for electrical testing of an electrical circuit according to claim 21, and wherein said sensing step employs first and second sensing electrodes disposed alongside a first side of said electrical circuit.

40. A method for electrical testing of an electrical circuit according to claim 21, and wherein said applying step employs a least one stimulation electrode comprising a plurality of individually controllable sections.

41. A method according to claim 21, wherein said sensing step comprises sensing potentials on one side of the electrical circuit and sensing potentials on the opposite side of the electrical circuit.