Signal supply apparatus and method for examining the same, and semiconductor device, electro-optical apparatus and electronic apparatus using the same

• US 6,633,167 B2
• Filed: 06/12/2001
• Issued: 10/14/2003
• Est. Priority Date: 06/14/2000
• Status: Expired due to Term

• Current Assignee: 138 East LCD Advancements Limited (Vector Capital Corporation)
• Original Assignee: Seiko Epson Corporation (Seiko Group)
• Inventors: Morita, Akira
• Primary Examiner(s): Hirshfeld, Andrew H.
• Assistant Examiner(s): Hamdan, Wasseem H.
• Application Number:
  US09/880,712
• Publication Number:
  US 20020005722A1
• Time in Patent Office: 854 Days
• Field of Search: 324/523, 324/512, 324/123.C, 341/161
• US Class Current: 324/523
• CPC Class Codes: G09G 2310/0291 Details of output amplifiers or buffers arranged for use in a driving circuit
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/2011 by amplitude modulation
• CPC Class Codes: G09G 3/3688 suitable for active matrices only

Abstract

In a signal supply apparatus such as might find use in an electro-optical device, signals that are supplied from multiple digital-to-analog converters are subject to impedance conversion by respective voltage followers, and provided as outputs to control the operation of the device. In the signal supply apparatus in a diagnostic examination mode, switching elements are operated so that output lines of the voltage followers are short-circuited by an output examination line. A current value measured as a result of the short circuit is compared with a specified current value to make a good-or-bad determination for the signal supply apparatus.

Claims

1. A method for examining a signal supply apparatus in which signals having specified voltages supplied from a plurality of signal supply sources are subject to impedance conversion, respectively, by a plurality of impedance conversion devices, and supplied to a plurality of output lines, respectively, the method comprising:

short-circuiting each of the plurality of output lines upon examination; and

comparing a current value detected on the short-circuited lines and a specified current value to thereby determine whether the signal supply apparatus is good or bad, wherein the signal supply apparatus comprises;

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements; and

a detection terminal that is connected to the short-circuited lines.

2. A method for examining a signal supply apparatus in which signals are subject to impedance conversion by a plurality of impedance conversion devices, respectively, and supplied to a plurality of output lines, the method comprising:

short-circuiting each of the plurality of output lines upon examination; and

comparing a composite current consumption value for the plurality of impedance conversion devices and a specified current value to determine whether the signal supply apparatus is good or bad, wherein the signal supply apparatus comprises;

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a short-circuit line that short-circuits the plurality of output lines when the plurality of switching elements are operated; and

a detection terminal for detecting the composite current consumption value.

3. A semiconductor device including a signal supply apparatus in which signals having specified voltages supplied from a plurality of signal supply sources are subject to impedance conversion, respectively, by a plurality of impedance conversion devices, and supplied to a plurality of output lines, respectively, wherein the signal supply apparatus comprises:

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a detection terminal that is connected to the short-circuited lines,

means for short-circuiting each of the plurality of output lines upon examination; and

means for comparing a current value detected on the short-circuited lines and a specified current value to thereby determine whether the signal supply apparatus is good or bad.

4. A data line driver IC including a signal supply apparatus in which signals having specified voltages supplied from a plurality of signal supply sources are subject to impedance conversion, respectively, by a plurality of impedance conversion devices, and supplied to a plurality of output lines, respectively, wherein the signal supply apparatus comprises:

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a detection terminal that is connected to the short-circuited lines,

means for short-circuiting each of the plurality of output lines upon examination; and

means for comparing a current value detected on the short-circuited lines and a specified current value to thereby determine whether the signal supply apparatus is good or bad,

wherein the signal supply apparatus is used as a driver device to drive each of a plurality of data lines in a display section using electro-optical elements.

5. A data line driver IC according to claim 4, wherein, after a voltage is supplied to the test terminal and each of the plurality of switching elements is operated, a voltage with a voltage width range corresponding to ±

(LSB)/2 with respect to a signal having the specified voltage to be supplied to the electro-optical elements is supplied through the detection terminal to the short-circuit line, and a minimum value among the current values detected at the detection terminal in response thereto is compared with a specified current value to make a good-or-bad determination.

6. A data line driver IC according to claim 5, wherein the specified voltage is set as a voltage that is supplied to the electro-optical element when the display section displays an intermediate gradation.

7. An electro-optical apparatus comprising a data line driver IC including a signal supply apparatus in which signals having specified voltages supplied from a plurality of signal supply sources are subject to impedance conversion, respectively, by a plurality of impedance conversion devices, and supplied to a plurality of output lines, respectively, wherein the signal supply apparatus comprises:

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a detection terminal that is connected to the short-circuited lines;

means for short-circuiting each of the plurality of output lines upon examination; and

means for comparing a current value detected on the short-circuited lines and a specified current value to thereby determine whether the signal supply apparatus is good or bad, wherein the signal supply apparatus is used as a driver device to drive each of a plurality of data lines in a display section using electro-optical elements.

8. An electronic apparatus comprising an electro-optical apparatus comprising a data line driver IC including a signal supply apparatus in which signals having specified voltages supplied from a plurality of signal supply sources are subject to impedance conversion, respectively, by a plurality of impedance conversion devices, and supplied to a plurality of output lines, respectively, wherein the signal supply apparatus comprises:

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a detection terminal that is connected to the short-circuited lines,

means for short-circuiting each of the plurality of output lines upon examination; and

means for comparing a current value detected on the short-circuited lines and a specified current value to thereby determine whether the signal supply apparatus is good or bad, wherein the signal supply apparatus is used as a driver device to drive each of a plurality of data lines in a display section using electro-optical elements.

9. A signal supply apparatus in which signals having specified voltages supplied from a plurality of signal supply sources are subject to impedance conversion, respectively, by a plurality of impedance conversion devices, and supplied to a plurality of output lines, respectively, wherein the signal supply apparatus is adapted to be examined to determine whether the signal supply apparatus is good or bad, wherein the signal supply apparatus comprises:

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a detection terminal that is connected to the short-circuited lines;

means for short-circuiting each of the plurality of output lines upon examination; and

means for comparing a current value detected on the short-circuited lines and a specified current value to thereby determine whether the signal supply apparatus is good or bad.

10. A signal supply apparatus in which signals are subject to impedance conversion by a plurality of impedance conversion devices, respectively, and supplied to a plurality of output lines, wherein the signal supply apparatus is adapted to be examined to determine whether the signal supply apparatus is good or bad, wherein the signal supply apparatus comprises:

a plurality of switching elements provided for the corresponding respective plurality of output lines;

a test terminal for inputting a test signal that controls operation of each of the plurality of switching elements;

a short-circuit line that short-circuits the plurality of output lines when the plurality of switching elements are operated;

a detection terminal for detecting the composite current consumption value;

means for short-circuiting each of the plurality of output lines upon examination; and

means for comparing a composite current consumption value for the plurality of impedance conversion devices and a specified current value to determine whether the signal supply apparatus is good or bad.