×

Inspection system and method

  • US 6,636,581 B2
  • Filed: 08/31/2001
  • Issued: 10/21/2003
  • Est. Priority Date: 08/31/2001
  • Status: Expired due to Fees
First Claim
Patent Images

1. An inspection method for identifying particularities of a structure, the method comprising:

  • positioning a first inspection device inside of the structure and positioning a second inspection device outside of the structure, wherein one of the first or second inspection devices comprises a detector inspection device and the other of the first or second inspection devices comprises a source inspection device;

    collecting data of at least a portion of the structure located between the first and second inspection devices;

    moving the first inspection device on the inside and the second inspection device on the outside of a subsequent portion of the structure while approximately maintaining a pre-determined distance between the inspection devices; and

    collecting data at the subsequent portion of the structure located between the inspection devices.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×