Constant offset buffer for reducing sampling time in a semiconductor temperature sensor

• US 6,637,934 B1
• Filed: 01/16/2002
• Issued: 10/28/2003
• Est. Priority Date: 09/27/2001
• Status: Active Grant

• Current Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Original Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Inventors: Aslan, Mehmet, Henderson, Richard Dean
• Primary Examiner(s): Gutierrez, Diego
• Assistant Examiner(s): PRUCHNIC, STANLEY J
• Application Number:
  US10/051,394
• Time in Patent Office: 650 Days
• Field of Search: 374/178, 374/170, 374/163, 374/168, 374/183, 374/120, 327/512, 326/82
• US Class Current: 374/178
• CPC Class Codes: G01K 1/028 arrangements for numerical indication
• CPC Class Codes: G01K 7/01 using semiconducting elements having PN junctions G01K7/02, G01K7/16, G01K7/30 take precedence

Abstract

A data acquisition system for sampling a temperature signal from a temperature sensor includes: a programmable current source, a buffer with a constant offset, and an analog-to-digital converter (ADC). The programmable current source selectively provides bias currents to the temperature sensor, which produces response voltages in response to the applied bias current. The buffer receives the response voltages and produces buffered response voltages that include a constant offset. The ADC is arranged to produce digital codes in response to the buffered response voltages. The digital codes are used to determine a temperature associated with the temperature sensor. The buffer isolates the temperature sensor from the ADC such that loading effects are minimized and set-up times for the conversion are minimized.

Claims

1. A method of sampling a response voltage from a temperature sensor that includes a PN junction, the method comprising:

applying a first bias current to the temperature sensor such that the PN junction produces a first PN junction voltage, and the temperature sensor produces a first response voltage;

buffering the first response voltage to produce a first buffered response voltage with a buffer that has an associated constant offset voltage;

applying a second bias current to the temperature sensor such that the PN junction produces a second PN junction voltage, and the temperature sensor produces a second response voltage, wherein the second bias current is different than the first bias current;

buffering the second response voltage to produce a second buffered response voltage with the buffer; and

converting the first and second buffered response voltages to corresponding values using a converter that has an associated input impedance that is isolated from the temperature sensor by the buffer such that a setup time associated with applying the first and second bias currents is minimized.

2. The method of claim 1, further comprising calculating a temperature associated with the temperature sensor from the values associated with the first and second buffered response voltages.

3. The method of claim 1, further comprising producing normalized values by subtracting another value from the values associated with the first and second buffered response voltages, wherein the another value corresponds to the constant offset voltage, such that the normalized values correspond to the respective first and second buffered response voltages which have the constant offset voltage removed.

4. The method of claim 3, further comprising calculating a temperature associated with the temperature sensor from the normalized values.

5. The method of claim 1, wherein the first bias current is greater than the second bias current.

6. The method of claim 1, wherein the first bias and the second bias current are related to one another by a ratio.

7. The method of 1, further comprising filtering the first and second response voltages with a low pass filter such that system noise effects are minimized.

8. An apparatus for sampling response voltages from a temperature sensor that includes a PN junction, comprising:

a means for applying a first bias current that is arranged to apply a first bias current to the temperature sensor at a first time, such that the PN junction produces a first PN junction voltage, and the temperature sensor produces a first response voltage at the first time;

a means for applying a second bias current that is arranged to apply a second bias current to the temperature sensor at a second time that is different from the first time, such that the PN junction produces a second PN junction voltage that is different from the first PN junction voltage, and the temperature sensor produces a second response voltage at the second time;

a means for buffering that is arranged to buffer response voltages from the temperature sensor and provide buffered response voltages that have a constant offset, such that the buffered response voltage is one of a first buffered response voltage and a second buffered response voltage when the response voltage is a corresponding one of the first and second response voltages; and

a means for converting that is arranged to convert the first and second buffered response voltages to values, wherein the means for converting has an associated input impedance that is isolated from the temperature sensor by the means for buffering such that loading effects associated with the temperature sensor are minimized.

9. The apparatus of claim 8, further comprising a means for calculating a temperature that is arranged to calculate a temperature associated with the temperature sensor using the values.

10. The apparatus of claim 8, further comprising a means for subtracting that is arranged to provide normalized values by subtracting another value from the values such that the associated offset is removed.

11. The apparatus of claim 10, further comprising a means for calculating that is arranged to calculate a temperature associated with the temperature sensor using the normalized values.

12. The apparatus of claim 8, wherein the first bias current is greater than the second bias current.

13. The apparatus of claim 8, further comprising a means for filtering that is arranged to filter system noise from the response voltages.

14. An apparatus for sampling response voltages from a temperature sensor that includes a semiconductor sensor, comprising:

a programmable current source that is configured to provide a bias current to the temperature sensor such that the temperature sensor provides a response voltage, wherein the bias current corresponds to a selected one of a first current and a second current that is different from the first current;

a buffer that is configured to provide a buffered response voltage in response to the response voltage, wherein the buffer has an associated offset voltage that is substantially constant; and

an analog-to-digital converter that is configured to sample the buffered response voltage and provide a value that corresponds to a quantized buffered response voltage, wherein the buffer is arranged to isolate the temperature sensor from the analog-to-digital converter such that a set-up time is minimized.

15. The apparatus of claim 14, further comprising a subtracter that is configured to subtract a value that corresponds to the offset voltage from the value to provide a normalized value.

16. The apparatus of claim 14, further comprising a capacitor that is coupled to the temperature sensor such that common mode noise in the response voltage is reduced.

17. The apparatus of claim 14, wherein the temperature sensor includes a PN junction.

18. The apparatus of claim 14, further comprising a bias circuit that is configured to control a bias voltage associated with the temperature sensor.

19. The apparatus of claim 14, wherein the temperature sensor is configured to monitor a temperature associated with a microprocessor.