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Machine vision methods for inspection of leaded components

  • US 6,639,624 B1
  • Filed: 04/11/2000
  • Issued: 10/28/2003
  • Est. Priority Date: 12/30/1999
  • Status: Expired due to Term
First Claim
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1. A machine vision method of locating a leaded electronic device in an image, the method comprising the steps ofsearching the image with a template representing a portion of each of one of more leads, each portion constituting less than an entirety of the respective lead, the searching step including positively weighting a portion represented in the template that matches an apparent lead at an expected position, negatively weighting a portion represented in the template that matches an apparent lead at an unexpected position, determining a location, if any, of any of a lead and the device based on results of the searching step.

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