Automatic integrated mechanical and electrical angular motion detector test system

• US 6,640,610 B2
• Filed: 03/30/2001
• Issued: 11/04/2003
• Est. Priority Date: 03/30/2001
• Status: Expired due to Term

• Current Assignee: Analog Devices, Inc.
• Original Assignee: Analog Devices, Inc.
• Inventors: Lueth, Richard A. II, Beucler, Brian G., OʼReilly, Robert P., Malone, Robert E., Hanle, Christopher F.
• Primary Examiner(s): NOLAND, THOMAS
• Application Number:
  US09/822,117
• Publication Number:
  US 20020139169A1
• Time in Patent Office: 949 Days
• Field of Search: 73/13.8, 73/13.7, 73/17.7, 73/18.2, 736/63
• US Class Current: 73/1.38
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices

Abstract

An automatic integrated mechanical and electrical angular motion detector test system includes a test fixture for holding an angular motion detector to be mechanically and electrically tested; a handler subsystem for feeding an angular motion detector to the test fixture; a motor having a rotatable shaft attached to the test fixture for rotating it and the angular motion detector it holds; and an electrical tester for testing the angular motion detector while it is rotating.

Claims

1. An automatic, integrated mechanical and electrical angular motion detector test system comprising:

a test fixture for holding an angular motion detector to be mechanically and electrically tested;

a handler subsystem for feeding an angular motion detector to said test fixture;

a motor having a rotatable shaft attached to said test fixture for rotating it and the angular motion detector it holds; and

an electrical tester for testing said angular motion detector while it is rotating.

2. The test system of claim 1 in which said test fixture includes a seat for supporting said angular motion detector in said test fixture.

3. The test system of claim 2 in which said text fixture includes a clamp for urging said angular motion detector against said seat.

4. The test system of claim 1 in which said test fixture includes a vacuum chuck for sensing the presence of an angular motion detector to be tested.

5. The test system of claim 1 in which said test fixture includes a contactor having at least one set of gripping contacts for engaging an angular motion detector to be tested.

6. The test system of claim 3 in which said clamp includes a lever and an actuator for driving said lever to operate said clamp.

7. The test system of claim 5 in which said contactor includes a lever and an actuator for driving said lever to operate said gripping contacts.

8. The test system of claim 1 in which said motor includes an oscillator motor.

9. The test system of claim 8 in which said motor produces a sinusoidal output motion to said test fixture.

10. The test system of claim 1 in which said motor includes a stepper motor.

11. The test system of claim 1 in which said motor includes a galvanometer.

12. The test system of claim 1 in which said angular motion detector is a gyroscope.

13. The test system of claim 12 in which said gyroscope is an integrated circuit chip gyroscope.

14. The test system of claim 12 in which said gyroscope is a micromachined integrated circuit chip gyroscope.

15. The test system of claim 1 in which said angular motion detector is an angular accelerometer.