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Coverage-based test generation for microprocessor verification

  • US 6,647,513 B1
  • Filed: 05/25/2000
  • Issued: 11/11/2003
  • Est. Priority Date: 05/25/2000
  • Status: Expired due to Fees
First Claim
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1. A verification method, comprising:

  • generating a first test description, simulating the first test description, and storing functional coverage information derived therefrom in a functional coverage database;

    generating a second test description;

    determining the functional coverage achievable by the second test description;

    comparing the functional coverage achievable by the second test description against the functional coverage information stored in the functional coverage database;

    modifying the second test description prior to simulating it if the second test description achieves no incremental coverage; and

    simulating the second test description if the functional coverage achievable by the second test description exceeds the functional coverage stored in the database and storing information indicative of the functional coverage achieved by said simulating in the database.

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