Temperature insensitive fiber-optic torque and strain sensor

• US 6,647,800 B2
• Filed: 11/26/2002
• Issued: 11/18/2003
• Est. Priority Date: 11/01/2000
• Status: Expired due to Term

• Current Assignee: Mcmaster University
• Original Assignee: Mcmaster University
• Inventors: Jessop, Paul E., De La Puente, Gonzalo
• Primary Examiner(s): Lefkowitz, Edward
• Assistant Examiner(s): DICKENS, CHARLENE
• Application Number:
  US10/304,049
• Publication Number:
  US 20030126930A1
• Time in Patent Office: 357 Days
• Field of Search: 738/00, 738/623.24, 738/626.24, 737/62, 737/05, 356/33, 356/364, 356/366, 356/367, 252/231.19, 252/225
• US Class Current: 73/800
• CPC Class Codes: G01B 11/165 by means of a grating deformed by the object
• CPC Class Codes: G01B 11/168 by means of polarisation
• CPC Class Codes: G01B 11/18 using photoelastic elements
• CPC Class Codes: G01L 1/241 by photoelastic stress analysis

Abstract

The present invention provides a simple design for a temperature-insensitive extrinsic polarimetric strain sensor. The sensing element is a thin sheet of photoelastic material that is bonded to the test object. It is illuminated with linearly polarized light with the polarization direction at 45 degrees relative to the strain-induced fast and slow axes in the photoelastic material. The sensor measures the difference between the strains along these two orthogonal directions. The reduced sensitivity of the sensor to temperature results from the fact that the illumination is perpendicular to the surface of the test object. All polarization components that are parallel to the surface will experience identical refractive index changes due to thermal effects. Consequently, a measurement of the difference in strains along two directions in the surface plane is insensitive to temperature.

Claims

1. A method of measuring strain in a workpiece that is insensitive to ambient temperature fluctuations, comprising the steps of:

illuminating a strain-sensitive material with a beam of selectively polarized light, the beam of selectively polarized light being substantially perpendicular to the surface of the workpiece, the strain-sensitive material being in physical contact with the surface of the workpiece;

measuring an intensity of at least one polarization component of the beam of selectively polarized light making at least one pass through the strain-sensitive material, the at least one polarization component being tilted with respect to strain-induced fast and slow orthogonal axes in the strain-sensitive material so that it has a projection along both strain-induced fast and slow orthogonal axes; and

calculating from said intensity a difference between strains along the strain-induced fast and slow orthogonal axes in the strain-sensitive material, the difference being substantially independent of ambient temperature fluctuations.

2. The method of measuring strain according to claim 1 including determining a maximum value of said intensity of said at least one polarization component by applying a range of stresses to the workpiece so as to cause the measured intensity to scan through the maximum value of its sinusoidal response, recording the measured intensity for each stress applied to the workpiece, and wherein said step of calculating from said intensity a difference between strains along the strain-induced fast and slow orthogonal axes in the strain-sensitive material includes taking a ratio of the at least one polarization component to the maximum value.

3. The method of measuring strain according to claim 1 wherein said beam of selectively polarized light is a beam of linearly polarized light, including operating said sensor in a region of linear response corresponding to quadrature points in which cos(φ

_y−

φ

_x)=0, wherein φ

_x and φ

_y are total optical phase shifts accumulated in passage by x and y polarization components of said beam of selectively polarized light through the strain sensitive material.

4. The method of measuring strain according to claim 1 wherein said beam of selectively polarized light is a beam of circularly polarized light.

5. The method of measuring strain according to claim 1 wherein said beam of selectively polarized light is a beam of linearly polarized light.

6. The method of measuring strain according to claim 1 wherein said beam of selectively polarized light is a beam of elliptically polarized light.

7. The method of measuring strain according to claim 1 wherein said strain-sensitive material is a strain-sensitive photoelastic material.

8. A method of measuring strain in a workpiece that is insensitive to ambient temperature fluctuations, comprising the steps of:

illuminating a strain-sensitive material with a beam of selectively polarized light, the beam of selectively polarized light being substantially perpendicular to the surface of the workpiece, the strain-sensitive material being in physical contact with the surface of the workpiece;

measuring a first intensity of a first polarization component and a second intensity of a second polarization component of the beam of selectively polarized light making at least one pass through the strain-sensitive material, the first and second polarization components being orthogonal to each other and tilted with respect to strain-induced fast and slow orthogonal axes in the strain-sensitive material parallel to the surface of the workpiece so that each of said first and second polarization components has a projection along both strain-induced fast and slow orthogonal axes; and

calculating from the first and second intensities a difference between strains along the strain-induced fast and slow orthogonal axes in the strain-sensitive material, the difference being substantially independent of ambient temperature fluctuations.

9. The method of measuring strain according to claim 8 wherein said beam of selectively polarized light is a beam of linearly polarized light, including operating said sensor in a region of linear response corresponding to quadrature points in which cos(φ

_y−

φ

_x)=0, wherein φ

_x and φ

_y are the total optical phase shift accumulated in passage by x and y polarization components of said beam of selectively polarized light.

10. The method of measuring strain according to claim 9 wherein said beam of selectively polarized light is a beam of circularly polarized light.

11. The method of measuring strain according to claim 9 wherein said beam of selectively polarized light is a beam of linearly polarized light.

12. The method of measuring strain according to claim 9 wherein said beam of selectively polarized light is a beam of elliptically polarized light.

13. A temperature insensitive strain sensor that is insensitive to ambient temperature fluctuations, comprising:

a strain-sensitive material adapted to be physically contacted to a surface of a workpiece;

light source means and light beam polarization means for illuminating said strain-sensitive material with a beam of selectively polarized light, said beam of selectively polarized light being substantially perpendicular to the surface of the workpiece; and

detection means for measuring an intensity of at least one of a first polarization component and a second polarization component in the beam of selectively polarized light making at least one pass through said strain-sensitive material, the at least one of a first and second polarization components being tilted with respect to strain-induced fast and slow orthogonal axes in the strain-sensitive material parallel to the surface of the workpiece so that at least one of the at least first and second polarization components has a projection along both strain-induced fast and slow orthogonal axes; and

processing means connected to said detection means for calculating from the intensity of the at least one of a first polarization component and a second polarization component a difference between strains along the strain-induced fast and slow orthogonal axes in said strain-sensitive material, the difference between strains being substantially independent of ambient temperature fluctuations.

14. The strain sensor according to claim 13 wherein the at least one of a first polarization component and a second polarization component is the first polarization component and the second polarization component, and wherein said detection means measures the first intensity of the first polarization component and the second intensity of the second polarization component in said beam of selectively polarized light making at least one traversal through the strain-sensitive material, and wherein said processing means calculates from said first and second intensities a difference between strains along the strain-induced fast and slow orthogonal axes in said strain-sensitive material, said difference being substantially independent of fluctuations in ambient temperature.

15. The strain sensor according to claim 13 wherein said beam of selectively polarized light is a beam of circularly polarized light.

16. The strain sensor according to claim 13 wherein said beam of selectively polarized light is a beam of linearly polarized light.

17. The strain sensor according to claim 13 wherein said beam of selectively polarized light is a beam of elliptically polarized light.

18. The strain sensor according to claim 13 wherein said strain-sensitive material is a strain-sensitive photoelastic material.

19. A temperature insensitive strain sensor that is insensitive to ambient temperature fluctuations, comprising:

a strain-sensitive material adapted to be physically contacted to a surface of a workpiece;

light source means and light beam polarization means for illuminating said strain-sensitive material with a beam of selectively polarized light, said beam of selectively polarized light being substantially perpendicular to the surface of the workpiece; and

detection means for measuring an intensity of a first polarization component and a second polarization component in the beam of selectively polarized light making at least one pass through said strain-sensitive material, each of the first and second polarization components being tilted with respect to strain-induced fast and slow orthogonal axes in the strain-sensitive material parallel to the surface of the workpiece so that each of the first and second polarization components have a projection along both strain-induced fast and slow orthogonal axes; and

processing means connected to said detection means for calculating from the intensities of the first and second polarization components a difference between strains along the strain-induced fast and slow orthogonal axes in said strain-sensitive material, the difference between strains being substantially independent of ambient temperature fluctuations.

20. The strain sensor according to claim 19 wherein said beam of selectively polarized light is a beam of circularly polarized light.

21. The strain sensor according to claim 19 wherein said beam of selectively polarized light is a beam of linearly polarized light.

22. The strain sensor according to claim 19 wherein said beam of selectively polarized light is a beam of elliptically polarized light.

23. The strain sensor according to claim 19 wherein said strain-sensitive material is a strain-sensitive photoelastic material.