Resonant microcavity display utilizing mirrors exhibiting anomalous phase dispersion

• US 6,649,432 B1
• Filed: 10/24/2000
• Issued: 11/18/2003
• Est. Priority Date: 10/25/1999
• Status: Expired due to Fees

• Current Assignee: Quantum Vision
• Original Assignee: Quantum Vision
• Inventors: Olmsted, Brian L., Eilers, Hergen, Jones, Michieal L., Jaffe, Steven M.
• Primary Examiner(s): Bruce, David V.
• Assistant Examiner(s): Yun, Jurie
• Application Number:
  US09/695,630
• Time in Patent Office: 1,120 Days
• Field of Search: 313/461, 313/463, 313/466, 313/474, 438/22, 438/46, 438/47, 257/94
• US Class Current: 438/22
• CPC Class Codes: H01L 33/465 with a resonant cavity structure
• CPC Class Codes: H10K 50/852 comprising a resonant cavity structure, e.g. Bragg reflector pair
• CPC Class Codes: H10K 59/876 comprising a resonant cavity structure, e.g. Bragg reflector pair

Abstract

A resonant microcavity display comprises a thin-film resonant microcavity (20, 50, 60) with an active layer (21). The microcavity (20, 50, 60) comprises a front reflector (22, 52), the active region (21) deposited upon the front reflector, and a back reflector (20, 54) deposited upon the active region (21). The display preferentially emits light that propagates along the axis (27) perpendicular to the plane of the display, due to its quantum mechanical properties. The extrinsic efficiency of this device is increased by the use of thin film construction with anomalous phase dispersion.

Claims

1. A method of making a resonant microcavity including the steps of:

forming a resonant microcavity with an active region and a reflective region;

during the forming step, using an anomalous phase dispersion mirror to reduce the amount of dispersion in at least one of (1) the active region, and (2) the reflective region in order to cause the rate of usable light emission to increase.

2. The method of claim 1 wherein for the reducing step, the rate of emission is given by integrating the probability for emission into a specific mode over angle space and wavelength space.

3. A method according to claim 1, wherein:

the forming step includes forming a resonant microcavity with an active region capable of having spontaneous light emission.

4. A method according to claim 1, wherein:

using an anomalous phase dispersion mirror comprises using an anomalous phase dispersion mirror positioned adjacent to the active region.

5. A method according to claim 1, wherein:

the forming step includes forming a resonant microcavity with an active region that includes one of a semiconductor device, a semiconductor material, a quantum well, an organic material, and an inorganic material.

6. A method according to claim 1, wherein:

the forming step includes forming a resonant microcavity with an active region that includes a phosphor.

7. A method according to claim 1, wherein:

using an anomalous phase dispersion mirror comprises using an anomalous phase dispersion mirror that includes multiple thin film layers, some of said layers having a high refractive index, some of said layers having a low refractive index, and some of said layers having an intermediate refractive index lying between the high refractive index and the low refractive index.

8. A method according to claim 1, wherein:

using an anomalous phase dispersion mirror comprises using an anomalous phase dispersion mirror that includes multiple thin film layers, some of said layers having a high refractive index, some of said layers having a low refractive index, and some of said layers having an intermediate refractive index lying between the high refractive index and the low refractive index; and

wherein said layers with said high, low, and intermediate refractive indices are intermixed.

9. A method according to claim 1, wherein:

using an anomalous phase dispersion mirror comprises using an anomalous phase dispersion mirror that is comprised of layers, each of said layers having an refractive index in order to define an index profile for the mirror, and said index profile controls the dispersion characteristics of said anomalous phase dispersion mirror.

10. A method according to claim 1, wherein:

using an anomalous phase dispersion mirror comprises using an anomalous phase dispersion mirror that is comprised of a Fabry-Perot cavity.

11. A method according to claim 1, wherein:

using an anomalous phase dispersion mirror comprises using an anomalous phase dispersion mirror that is comprised of a second microcavity.

12. A method of making a resonant microcavity including the steps of:

forming a resonant microcavity with an active region and a reflective region;

during the forming step using an anomalous phase dispersion mirror to reduce the amount of dispersion in at least one of (1) the active region, and (2) the reflective region in order to cause an integrated emission probability to increase.

13. The method of claim 12 wherein said reducing step includes:

reducing the amount of dispersion in at least one of (1) the reflective region, and (2) the active region until the integrated emission probability reaches a maximum.

14. A method according to claim 12, wherein:

the reflective region is a first reflective region, and wherein the forming step includes forming a resonant microcavity having a second reflective region, the active region being positioned between the first reflective region and the second reflective region; and

during the forming step, using an anomalous phase dispersion mirror to reduce the amount of dispersion in at least one of (1) the active region, (2) the first reflective region, and (3) the second reflective region, in order to cause the rate of usable light emission to increase.

15. A method according to claim 14, wherein:

one of the reflective region and second reflective region includes said anomalous phase dispersion mirror.

16. A method according to claim 14, wherein:

said first reflective region includes a front anomalous phase dispersion mirror and said second reflective region includes a rear anomalous phase dispersion mirror.

17. A method according to claim 14, wherein:

one of said first and second reflective regions includes a resonant multi-layer mirror.

18. A method according to claim 14, wherein:

the forming step comprises forming a resonant microcavity with an active region positioned between the first reflective region and a second reflective region, wherein one of said first and second reflective regions includes a resonant mirror with multiple thin film layers comprised on both high refractive index materials and low refractive index materials and wherein the number of layers of the mirror is minimized for a specific desired reflectance by increasing the contrast between the high refractive index materials and the low refractive index materials.