Frequency tunable resonant scanner and method of making
First Claim
1. An apparatus for producing a plurality of resonant optical MEMs scanners from a single wafer, each MEMs scanner having a movable body that moves at a desired resonant frequency and carries one or more removable masses, comprising:
- a first electrical signal source configured for coupling to each respective MEMs scanner while the MEMs scanner is an integral part of the wafer, the first signal source being operative to produce a first input signal for activating the respective optical scanner;
a position sensor coupled to the movable body of the respective MEMs scanner and operative to produce an electrical signal indicative of movement of the movable body while the MEMs scanner is an integral part of the wafer;
a reference signal source operative to produce a reference signal at the desired resonant frequency;
an electronic controller coupled electrically to the position sensor and the reference signal source, the controller being operative to produce an error signal indicative of a difference between a frequency of movement of the movable body and the desired resonant frequency; and
a mass removal apparatus responsive to the electronic controller to remove selected portions of the removable masses while the respective MEMs scanner is an integral part of the wafer.
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Abstract
A MEMs scanning device has a variable resonant frequency. In one embodiment, the MEMs device includes a torsion arm that supports an oscillatory body. In one embodiment, an array of removable masses are placed on an exposed portion of the oscillatory body and selectively removed to establish the resonant frequency. The material can be removed by laser ablation, etching, or other processing approaches. In another approach, a migratory material is placed on the torsion arm and selectively stimulated to migrate into the torsion arm, thereby changing the mechanical properties of the torsion arm. The changed mechanical properties in turn changes the resonant frequency of the torsion arm. In another approach, symmetrically distributed masses are removed or added in response to a measured resonant frequency to tune the resonant frequency to a desired resonant frequency. A display apparatus includes the scanning device and the scanning device scans about two or more axes, typically in a raster pattern. Various approaches to controlling the frequency responses of the scanning device are described, including active control of MEMs scanners and passive frequency tuning.
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Citations
7 Claims
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1. An apparatus for producing a plurality of resonant optical MEMs scanners from a single wafer, each MEMs scanner having a movable body that moves at a desired resonant frequency and carries one or more removable masses, comprising:
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a first electrical signal source configured for coupling to each respective MEMs scanner while the MEMs scanner is an integral part of the wafer, the first signal source being operative to produce a first input signal for activating the respective optical scanner;
a position sensor coupled to the movable body of the respective MEMs scanner and operative to produce an electrical signal indicative of movement of the movable body while the MEMs scanner is an integral part of the wafer;
a reference signal source operative to produce a reference signal at the desired resonant frequency;
an electronic controller coupled electrically to the position sensor and the reference signal source, the controller being operative to produce an error signal indicative of a difference between a frequency of movement of the movable body and the desired resonant frequency; and
a mass removal apparatus responsive to the electronic controller to remove selected portions of the removable masses while the respective MEMs scanner is an integral part of the wafer. - View Dependent Claims (2, 3, 4)
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5. A method of producing a plurality of resonant optical MEMS scanners from a wafer, each MEMS scanner having a movable body, comprising:
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photolithographically patterning the wafer to define a plurality of the moving bodies;
activating each of the defined movable bodies for periodic motion while the movable body is attached to the wafer;
monitoring a resonant frequency for each of the activated movable bodies while the movable body is activated;
for each of the monitored movable bodies, determining a deviation of the monitored resonant frequency from a desired resonant frequency; and
for each of the monitored movable bodies, removing a portion of the respective movable body, wherein the mass of the removed portion is a function of the determined deviation of the monitored resonant frequency from the desired resonant frequency. - View Dependent Claims (6, 7)
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Specification