Method and apparatus for enhanced laser-induced plasma spectroscopy using mixed-wavelength laser pulses

• US 6,661,511 B2
• Filed: 01/16/2002
• Issued: 12/09/2003
• Est. Priority Date: 01/16/2001
• Status: Expired due to Fees

• Current Assignee: National Research Council Canada
• Original Assignee: National Research Council Canada
• Inventors: St-Onge, Louis, Detalle, Vincent, Sabsabi, Mohamad
• Primary Examiner(s): Evans, F. L.
• Application Number:
  US10/046,227
• Publication Number:
  US 20020093653A1
• Time in Patent Office: 692 Days
• Field of Search: 356/317, 356/318
• US Class Current: 356/318
• CPC Class Codes: G01N 21/718 Laser microanalysis, i.e. with formation of sample plasma

Abstract

A sample of heterogeneous material is analyzed by directing a mixed-wavelength laser pulse at the sample to produce a plasma. The mixed wavelength pulse contains both shorter and longer wavelength components. The composition of the material is determined from the emission spectrum of the plasma.

Claims

1. A method of analyzing the composition of heterogeneous materials comprising:

providing a sample of a material to be analyzed;

directing a mixed-wavelength laser pulse at said sample to produce a plasma; and

determining the composition of said material from the emission spectrum of said plasma.

2. A method as claimed claim 1, wherein said mixed wavelength pulse comprises a shorter wavelength component that ablates efficiently the sample and rapidly produces an initial plume of ablated matter containing seed electrons and a longer wavelength component that is absorbed in said initial plume and further ionizes the ablated matter, rapidly producing a plasma sufficiently dense to prevent the laser from reaching the material surface.

3. A method as claimed in claim 1, wherein said mixed wavelength pulse is formed by combining two simultaneous pulses from separate lasers.

4. A method as claimed in claim 1, wherein said mixed wavelength pulse is formed with a single laser that is provided with one or more frequency conversion devices.

5. A method as claimed in claim 4, wherein said one or more frequency conversion devices generates one or more harmonics of the output of said single laser.

6. A method as claimed in claim 4, wherein said frequency conversion devices are selected from the group consisting of:

frequency doubling crystals and optical parametric oscillators.

7. A method as claimed in claim 1, wherein said mixed wavelength pulse comprises an infrared component and an ultraviolet component.

8. A method as claimed in claim 7, wherein said infrared component is a near infrared component.

9. A method of analyzing the composition of heterogeneous materials comprising:

providing a sample of a material to be analyzed;

directing a mixed-wavelength laser pulse having one or more relatively shorter wavelength components that are initially well absorbed by the material to vaporize the material into a plasma and produce seed electrons and one or more relatively longer wavelength components that are absorbed in said plasma and induce plasma shielding; and

determining the composition of said material from the emission spectrum of said plasma.

10. A method as claimed in claim 9, wherein said one or more shorter wavelength components are ultraviolet and said one or more longer wavelength components are infrared.

11. A method as claimed in claim 9, wherein said wavelength components include a wavelength at 1064 nm and one or more harmonics thereof.

12. An apparatus for use in the analysis of heterogeneous materials comprising:

at least one laser for generating a mixed-wavelength pulsed laser beam; and

a focusing arrangement for focusing said mixed wavelength laser beam onto a sample to produce a plasma; and

a spectrum analyzer determining the composition of said material from the emission spectrum of said sample.

13. An apparatus as claimed in claim 12, comprising two said lasers operating at different wavelengths and arranged to be tired simultaneously, and a combiner for combining beams from said respective lasers into a single mixed wavelength output beam that is focused onto said sample.

14. An apparatus as claimed in claim 12, comprising a single said laser producing an output beam;

a beam splitter for separating said output beam into separate beam portions;

a frequency converter for changing the frequency of at least one of said separate beam portions; and

a combiner for combining the separate beam portions into a single mixed wavelength beam that is focused onto the sample.

15. An apparatus as claimed in claim 12, comprising a single said laser producing an output laser beam;

a frequency converter for generating at least one new frequency in the laser beam while retaining the original frequency so as to produce said mixed wavelength beam that is focused onto the sample.

16. An apparatus as claimed in claim 12, wherein said focusing arrangement is an achromatic lens.

17. An apparatus as claimed in claim 15, wherein said laser is a Nd:

YAG laser operating at 1064 nm.

18. An apparatus as claimed in claim 15, wherein said frequency converter generates harmonics of said output beam produced by said laser.