Measuring jitter of high-speed data channels

• US 6,661,836 B1
• Filed: 10/17/1999
• Issued: 12/09/2003
• Est. Priority Date: 10/21/1998
• Status: Expired due to Term

• Current Assignee: Xcerra Corporation (COHU Incorporated)
• Original Assignee: Nptest LLP
• Inventors: Rosenthal, Daniel A., Dalal, Wajih
• Primary Examiner(s): Tran, Khai
• Application Number:
  US09/419,317
• Time in Patent Office: 1,514 Days
• Field of Search: 375/226, 375/224, 375/228, 375/227, 324/76.15, 324/76.42, 370/516, 341/165
• US Class Current: 375/226
• CPC Class Codes: G01R 29/02 Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
• CPC Class Codes: H03M 1/1285 Synchronous circular sampling, i.e. using undersampling of periodic input signals
• CPC Class Codes: H04L 1/24 Testing correct operation

Abstract

A jitter measurement technique utilizing a high-bandwidth undersampling voltage measurement instrument is presented. A trigger is derived from the a signal having a repetitive signal pattern. The signal is compared with a threshold at a plurality of times relative to the trigger during multiple repetitions of the signal pattern to produce measurement samples indicative of signal level relative to the threshold. The measurement samples are used to determine the probability of signal edge states as a function of time for the multiple repetitions. The probability of signal edge states are used to determine an edge probability density as a function of time. A histogram of signal state transition times can be prepared from the edge probability density. Mean deviation of edge transitions of the signal can be estimates, and standard deviation of edge transitions of the signal can be estimated to give the root-mean-square (rms) jitter of the signal.

Claims

1. A method of measuring jitter of a signal having a repetitive signal pattern, comprising the steps of:

a. deriving a trigger from the signal;

b. comparing the signal with a threshold at a plurality of times relative to the trigger during multiple repetitions of the signal pattern to produce measurement samples indicative of signal level relative to the threshold;

c. determining from the measurement samples the probability of signal edge states as a function of time for the multiple repetitions; and

d. determining from the probability of signal edge states an edge probability density as a function of time for the multiple repetitions.

2. The method of claim 1, wherein comparing the signal with a threshold comprises comparing level of the signal with a voltage threshold and producing a measurement sample for each comparison.

3. The method of claim 1, wherein the measurement sample is a binary comparison result.

4. The method of claim 1, wherein comparing the signal with a threshold comprises connecting a high-speed comparator to a source of the signal without compensating for signal path.

5. The method of claim 1, wherein comparing the signal with a threshold comprises connecting a high-speed comparator to a source of the signal without compensating for impedance matching.

6. The method of claim 1, wherein comparing the signal with a threshold comprises connecting a high-speed comparator to a source of the signal without compensating for device-under-test (DUT) loading effects.

7. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed relative to a trigger signal.

8. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed relative to a trigger signal generated from a system clock (T0) in an automatic-test-equipment (ATE) tester.

9. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed relative to a trigger signal generated by a signal which is synchronous to the signal having a repetitive signal pattern.

10. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed with incremental time shifts from measurement sample to measurement sample such that resolution of the incremental time shift is the effective sampling rate.

11. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed such that time shift from measurement sample to measurement sample is not linearly incremental.

12. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed such that time shift from measurement sample to measurement sample is linearly incremental.

13. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed such that density of the measurement samples is not constant with respect to time.

14. The method of claim 1, wherein comparing the signal with a threshold at a plurality of times during multiple repetitions of the signal pattern is performed such that density of the measurement samples is constant with respect to time.

15. The method of claim 1, wherein determining the probability of signal edge states comprises estimating probability of signal edge states in accordance with the relationship P{x(t)>

V_ref}=1/KΣ

M_j(t), where P{x(t)>

V_ref} is the probability over time t that the level of the signal x is greater than a threshold voltage V_ref, j is the measurement sample number, K is the number of measurement samples per time step, and M_j is a binary measurement sample result.

16. The method of claim 1, wherein determining edge probability density as a function of time comprises differentiating the probability of signal edge states.

17. The method of claim 1, further comprising preparing from the edge probability density as a function of time a histogram of signal state transition times.

18. The method of claim 1, further comprising estimating mean deviation μ

of edge transitions of the signal.

19. The method of claim 1, further comprising estimating standard deviation σ

of edge transitions of the signal to give the root-mean-square (rms) jitter of the signal.

20. Apparatus for measuring jitter of a signal having a repetitive signal pattern, comprising:

a. a sample probe (740) for deriving a trigger from the signal;

b. a sampler (715) having a timing generator (745) and sample probe (735) for comparing the signal with a threshold at a plurality of times relative to the trigger during multiple repetitions of the signal pattern to produce measurement samples indicative of signal level relative to the threshold; and

c. a processor (760) for determining from the measurement samples the probability of signal edge states as a function of time for the multiple repetitions, and for determining from the probability of signal edge states an edge probability density as a function of time for the multiple repetitions.