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Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation

  • US 6,661,867 B2
  • Filed: 10/19/2001
  • Issued: 12/09/2003
  • Est. Priority Date: 10/19/2001
  • Status: Expired due to Term
First Claim
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1. A scanning X-ray inspection system comprising:

  • a) a conveyor for moving an object to be scanned though said system;

    b) an X-ray generation device for generating a pencil beam of X-rays repeatedly sweeping along a straight line across said conveyor, thereby scanning said object as it moves through said system;

    c) a fast backscatter detector for generating a backscatter signal when detecting said X-rays backscattered by said object moving on said conveyor, said backscatter detector being disposed on the same side of said moving object as said X-ray generation device and proximate to said straight line, and comprising two elongated scintillator sections optically linked to at least one photon detector, each of said sections being oppositely disposed along said straight line;

    d) a transmission detector for generating a transmission signal when detecting said X-rays traversing said object moving on said conveyor, said transmission detector being positioned on the opposite side of said object as said backscatter detector, whereby said object moves between said transmission detector and said backscatter detector;

    e) a processor for processing said backscatter and transmission signals for a display; and

    f) a display means for displaying a backscatter image and/or a transmission image.

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