Apparatus and method for recording and/or reading program history

• US 6,662,150 B1
• Filed: 09/27/2000
• Issued: 12/09/2003
• Est. Priority Date: 12/04/1997
• Status: Expired due to Term

• Current Assignee: Invensas Corporation
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Jacobs, Marc A.
• Primary Examiner(s): Broda, Samuel
• Application Number:
  US09/671,637
• Time in Patent Office: 1,168 Days
• Field of Search: 703/13-28, 700/121, 365/201, 365/94
• US Class Current: 703/22
• CPC Class Codes: G06F 8/65 Updates security arrangements therefor G06F21/57

Abstract

An integrated circuit, apparatus and method is provided for programming manufacturing information and software program information upon non-volatile storage elements on the integrated circuit. The manufacturing information includes information as to a specific processing recipe or layout used to form hardware of the integrated circuit. The software information indicates a specific revision of software used to program the integrated circuit, or a programming tool used to input the software into the integrated circuit. Combination of software and hardware is therefore embodied in non-volatile storage elements as product engineering bits. The product engineering bits can be called upon and read by the manufacturer or by the customer outside normal operation of the integrated circuit. A comparison of the hardware and software revisions will indicate possible incompatibility. This may signal that a new software revision is needed which is suited for the existing hardware revision, or that a new hardware revision is needed to match the existing software.

Claims

1. An integrated circuit comprising:

a first storage element including information as to a particular revision of software with which the integrated circuit is programed;

a second storage element including information identifying a particular manufacturing revision of the integrated circuit, wherein the first and second storage elements comprise non-volatile storage elements; and

wherein the second storage element is accessible before accessing the first storage element and is inaccessible during normal operation of the integrated circuit.

2. The integrated circuit as recited in claim 1, further comprising a comparing circuit for comparing information in the first and second storage elements to ascertain compatibility between the particular revision of software and the particular manufacturing revision.

3. The integrated circuit as recited in claim 1, wherein the particular manufacturing revision corresponds to a particular revision of hardware embodied within the integrated circuit.

4. The integrated circuit as recited in claim 1, wherein the first storage element is accessible during program of the integrated circuit and is inaccessible during normal operation of the integrated circuit.

5. The integrated circuit as recited in claim 1, wherein the first and second storage elements form at least a portion of an array of non-volatile storage elements on the integrated circuit.

6. The integrated circuit as recited in claim 5, wherein the non-volatile storage elements are electrically erasable.

7. The integrated circuit as recited in claim 1, wherein the first storage element includes information as to a particular tool used to program the integrated circuit.

8. A method for storing manufacturing and software revisions readable at a later time, the method comprising:

writing information into a second storage element arranged on the integrated circuit as to a particular manufacturing revision of the integrated circuit;

writing information into a first storage element arranged on the integrated circuit as to a particular revision of software for programming the integrated circuit, wherein the first and second storage elements comprise non-volatile storage elements; and

programming said software into memory elements of the integrated circuit of the first storage element concurrent with said writing information into the first storage element as to the particular revision of the software.

9. The method as recited in claim 8, further comprising removing a die on which said integrated circuit is contained from a wafer after said writing into the second storage element.

10. The method as recited in claim 8, wherein the first and second storage elements form at least a portion of an array of non-volatile storage elements on the integrated circuit.