Digital eddy current proximity system: apparatus and method

• US 6,664,782 B2
• Filed: 01/08/2002
• Issued: 12/16/2003
• Est. Priority Date: 10/22/1999
• Status: Expired due to Term

• Current Assignee: BN Corporation LLC
• Original Assignee: Bently Nevada Incorporated (General Electric Company)
• Inventors: Slates, Richard D.
• Primary Examiner(s): Cuneo, Kamand
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US10/042,514
• Publication Number:
  US 20020153880A1
• Time in Patent Office: 707 Days
• Field of Search: 324/207.11, 324/207.13, 324/207.15, 324/207.16, 324/207.17, 324/207.18, 324/207.19, 324/207.26, 324/644, 324/662, 702/155, 702/158
• US Class Current: 324/207.16
• CPC Class Codes: G01B 7/003 for measuring position, not involving coordinate determination coordinate measuring G01B7/004
• CPC Class Codes: G01B 7/023 for measuring distance between sensor and object G01B7/082 and G01B7/102 take precedence
• CPC Class Codes: G01D 18/00 Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
• CPC Class Codes: G01D 5/202 by movable a non-ferromagnetic conductive element G01D5/2033 takes precedence
• CPC Class Codes: G01N 27/9046 by analysing electrical signals

Abstract

A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

Claims

1. A method for measuring a gap between a proximity probe and a conductive target material, said method including the steps of:

providing a network of components including a first electrical component, an extension cable component and a proximity probe component respectively serially connected, and locating the proximity probe adjacent a conductive target material;

driving a dynamic current through the serially connected electrical components for impressing a first analog voltage across the network and a second analog voltage across the serial connection of the extension cable component and the proximity probe component;

sampling and digitizing the first analog voltage impressed across said network to obtain a first digitized voltage value;

sampling and digitizing a second analog voltage impressed across the serial connection of the extension cable component and the proximity probe component to obtain a second digitized voltage value;

digitally convolving the first digitized voltage value and the second digitized voltage value into a first complex number and a second complex number respectively;

calculating a voltage ratio of the second complex number to a difference between the first complex number and the second complex number;

processing the voltage ratio into a gap value correlative to a gap between the proximity probe and the conductive target material.

2. The method of claim 1 wherein said processing step further includes the step of calculating a complex electrical impedance value of the proximity probe from the voltage ratio by digitally compensating for an impedance of the extension cable and processing the complex electrical impedance value into said gap value correlative to said gap between said proximity probe and said conductive target material.

3. The method of claim 2 further including the step of outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.

4. The method of claim 1 wherein said processing step further includes the steps of calculating a complex electrical impedance value of the proximity probe from the voltage ratio by digitally compensating for an impedance of said extension cable and normalizing the complex electrical impedance value into said gap value correlative to said gap between said proximity probe and said conductive target material.

5. The apparatus of claim 4 further including means for outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.

6. The method of claim 1 wherein said processing step further includes the step of determining a complex electrical impedance of the serial connection of the extension cable and proximity probe by multiplying the voltage ratio by a value of the electrical component, the determined value defining a measured value of the electrical impedance of the serial connection of the extension cable and proximity probe.

7. The method of claim 6 further including the step of performing open, short and load measurements on the extension cable for determining compensation parameters and storing the parameters in a memory means, the compensation parameters including a measured open impedance of the extension cable, a measured short impedance of the extension cable, a measured impedance of a load coupled to the extension cable in place of the proximity probe, the load having a known impedance value.

8. The method of claim 7 further including the step of determining a complex electrical impedance of the probe by utilizing the compensation parameters and by utilizing the formula:

$Z_{\mathrm{probe}}=\frac{Z_{s<br><br>\text{\hspace{1em}<br><br>}<br><br>t<br><br>\text{\hspace{1em}<br><br>}<br><br>d}<br><br>\left(Z_O-Z_{S<br><br>\text{\hspace{1em}<br><br>}<br><br>M}\right)<br><br>\left(Z_{X<br><br>\text{\hspace{1em}<br><br>}<br><br>M}-Z_S\right)}{\left(Z_{S<br><br>\text{\hspace{1em}<br><br>}<br><br>M}-Z_S\right)<br><br>\left(Z_O-Z_{X<br><br>\text{\hspace{1em}<br><br>}<br><br>M}\right)}$

where;

Z_O is the measured open impedance of the extension cable,

Z_S is the measured short impedance of the extension cable,

Z_SM is the measured impedance of the load coupled to the extension cable in place of the proximity probe,

Z_std is the known value of the load impedance,

Z_XM is the measured impedance of the probe coupled to the extension cable,

Z_probe is the compensated complex electrical impedance of the proximity probe.

9. The method of claim 8 wherein said processing step further includes the step of processing the complex electrical impedance of the proximity probe into said gap value correlative to said gap between said proximity probe and said conductive target material.

10. The method of claim 9 further including the step of outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.

11. The method of claim 8 wherein said processing step further includes the steps of normalizing the complex electrical impedance value of the probe into a normalized impedance value and processing the normalized impedance value into said gap value correlative to said gap between said proximity probe and said conductive target material.

12. The apparatus of claim 11 further including means for outputting a signal as a function of said gap value which is correlative to said gap between said proximity probe and said conductive target material.

13. The method of claim 1 further including the step of storing electrical parameters for a plurality of different proximity probes and extension cables and retrieving the electrical parameters of the proximity probe that is disposed adjacent the conductive target material and the electrical parameters of the extension cable coupled to that probe for use in the step of processing the voltage ratio into a gap value correlative to a gap between the proximity probe and the conductive target material.

14. The method of claim 1 further including the step of storing electrical parameters for a plurality of different target materials and retrieving the electrical parameters of the target material in which the proximity probe is disposed adjacent to and using the retrieved parameters in the step of processing the voltage ratio into a gap value correlative to a gap between the proximity probe and the conductive target material.