X-ray imaging system with active detector

• US 6,665,373 B1
• Filed: 03/12/2002
• Issued: 12/16/2003
• Est. Priority Date: 03/12/2002
• Status: Active Grant

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Security Products USA Incorporated (OSI Systems Incorporated)
• Inventors: Smith, Steven W., Kotowski, Andreas F.
• Primary Examiner(s): Glick, Edward J.
• Assistant Examiner(s): Ho, Allen C.
• Application Number:
  US10/097,700
• Time in Patent Office: 644 Days
• Field of Search: 378/57, 378/86, 378/87, 378/88, 378/89, 378/90
• US Class Current: 378/90
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Abstract

The present invention provides for an apparatus and method for use in a system with an x-ray source to produce a pencil beam of x-rays to scan an object and a first detector providing a value representative of the intensity of the x-rays scattered from the object to produce a scattered image having a second detector disposed opposite the first detector to provide a value representative of the intensity of the x-rays passing directly from the x-ray source to the second detector; a processor coupled to the system to receive information specifying a position of the pencil beam of x-rays, the processor also coupled to second detector to produce a shadow image formed of pixels indicating the intensity value measured by the second detector for a plurality of positions of the pencil beam of x-rays; and combining the scattered and shadow image to produce a composite image.

Claims

1. An apparatus for use in a system having an x-ray source to produce a pencil beam of x-rays to scan an object and a first detector providing a value representative of the intensity of the x-rays scattered from the object to produce a scattered image, said apparatus comprising:

a second detector disposed opposite said first detector, said second detector providing a value representative of the intensity of the x-rays passing directly from said x-ray source to said second detector; and

a processor coupled to the system and receiving therefrom information specifying a position of the pencil beam of x-rays, the processor also coupled to said second detector and producing a shadow image formed of pixels that are not blocked by the object and which indicate an intensity value measured by said second detector for a plurality of positions of said pencil beam of x-rays.

2. The apparatus in accordance with claim 1 wherein said pixels are limited to representing one of two intensity values.

3. The apparatus in accordance with claim 2 wherein one of said two intensity values represents that the x-ray beam directed at the corresponding position of said second detector was detected to have impinged said second detector and wherein the other of said two values represents that the x-ray beam was not detected to have impinged said second detector.

4. The apparatus of claim 1 wherein said second detector is disposed about 2 to 6 feet from said x-ray source.

5. The apparatus of claim 1 wherein said second detector comprises a plurality of gas filled ionization chambers.

6. The apparatus of claim 1 wheren said second detector comprises a scintillation material and a light detector.

7. The apparatus of claim 6 wherein said scintillation material comprises a fluorescent screen.

8. The apparatus of claim 6 wherein said scintillation material comprises a plastic scintillator.

9. The apparatus of claim 6 wherein said light detector comprises a photomultiplier tube.

10. The apparatus of claim 6 wherein said light detector comprises a photodiode.

11. The apparatus of claim 1 further comprising a radiation shield coupled to said second detector.

12. The apparatus of claim 11 wherein said radiation shield comprises an x-ray absorbing material.

13. The apparatus of claim 12 wheren said x-ray absorbing material is steel.

14. The apparatus of claim 12 wherein said x-ray absorbing material is lead.

15. The apparatus of claim 1 wherein said shadow image is capable of being combined with said scattered image to form a composite image.

16. The apparatus of claim 15 wherein said composite image comprises the intensity value from said shadow image where the x-ray beam impinged said second detector, and wherein said composite image comprises the value representative of the intensity of the x-rays scattered from the object where the x-ray beam did not impinge said second detector.

17. A method for detecting concealed items on or in an object in a system having an x-ray source to produce a pencil bean of x-rays to scan the object and a first detector providing a value representative of the intensity of the x-rays scattered from the object to produce a scattered image, said method comprising:

detecting x-rays that pass unscattered from said x-ray source to a second detector disposed opposite said first detector;

forming a signal in response to said detection of x-rays;

receiving information from said system to a processor specifying a position of the pencil beam of x-rays; and

producing a shadow image formed of pixels that are not blocked by the object and which indicate an intensity value measured by said second detector for a plurality of positions of said pencil beam of x-rays.

18. The method in accordance with claim 17 wherein said pixels are limited to representing one of two intensity values.

19. The method in accordance with claim 18 wherein one of said two intensity values represents that the x-ray beam directed at the corresponding position of said second detector was detected to have impinged said second detector and wherein the other of said two values represents that the x-ray beam was not detected to have impinged said second detector.

20. The method of claim 17 further comprising disposing said second detector about 2 to 6 feet from said x-ray source.

21. The method of claim 17 wherein said second detector comprises a plurality of gas filled ionization chambers.

22. The method of claim 17 wherein said second detector comprises a scintillation material and a light detector.

23. The method of claim 22 wherein said scintillation material comprises a fluorescent screen.

24. The method of claim 22 wherein said scintillation material comprises a plastic scintillator.

25. The method of claim 22 wherein said light detector comprises a photomultiplier tube.

26. The method of claim 22 wherein said light detector comprises a photodiode.

27. The method of claim 17 further comprising coupling a radiation shield to said second detector.

28. The method of claim 27 wherein said radiation shield comprises an x-ray absorbing material.

29. The method of claim 28 wherein said x-ray absorbing material is steel.

30. The method of claim 28 wherein said x-ray absorbing material is lead.

31. The method of claim 17 further comprising combining said shadow image with said scattered image to form a composite image.

32. The method of claim 31 wherein said composite image comprises the intensity value from said shadow image where the x-ray beam impinged said second detector, and wherein said composite image comprises the value representative of the intensity of the x-rays scattered from the object where the x-ray beam did not impinge said second detector.

33. A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform a method for detecting concealed items on or in an object in a system having an x-ray source to produce a pencil beam of x-rays to scan the object and a first detector providing a value representative of the intensity of the x-rays scattered from the object to produce a scattered image, said method comprising:

detecting x-rays that pass unscattered from said x-ray source to a second detector disposed opposite said first detector;

forming a signal in response to said detection of x-rays;

receiving information from said system to a processor specifying a position of the pencil beam of x-rays; and

producing a shadow image formed of pixels that are not blocked by the object and which indicate an intensity value measured by said second detector for a plurality of positions of said pencil beam of x-rays.

34. A system for scanning an object, comprising:

an x-ray source to produce a pencil beam of x-rays to scan the object;

a first detector to provide a value representative of the intensity of x-rays scattered from the object;

an image former responsive to said first detector to form a scattered image;

a second detector disposed opposite said first detector, said second detector providing a value representative of an intensity of x-rays passing directly from said x-ray source to said second detector; and

a processor coupled to receive information specifying a position of the pencil beam of x-rays, the processor also coupled to said second detector and producing a shadow image formed of pixels that are not blocked by the object and which indicate an intensity value measured by said second detector for a plurality of positions of said pencil beam of x-rays.

35. The system in accordance with claim 34 wherein said pixels are limited to representing one of two intensity values.

36. The system in accordance with claim 35 wherein one of said two intensity values represents that the x-ray beam directed at the corresponding position of said second detector was detected to have impinged said second detector and wherein the other of said two values represents that the x-ray beam was not detected to have impinged said second detector.

37. The system of claim 34 wherein said shadow image is adapted to be combined with said scattered image to form a composite image.

38. The system of claim 37 wherein said composite image comprises the intensity value from said shadow image where the x-ray beam impinged said second detector, and wherein said composite image comprises the value representative of the intensity of the x-rays scattered from the object where the x-ray beam did not impinge said second detector.

39. A system for scanning an object, comprising:

x-ray scanning means for producing a pencil beam of x-rays to scan the object;

scattered x-ray detection means for detecting an intensity of x-rays scattered from the object;

image forming means responsive to said scattered x-ray detection means for forming a scattered image;

direct x-ray detection means disposed opposite said scattered x-ray detection means, said direct x-ray detection means responsive to an intensity of x-rays passing directly from said x-ray source to said direct x-ray detection means; and

processor means coupled to receive information specifying a position of the pencil beam of x-rays, said processor means also responsive to said direct x-ray detection means for forming a shadow image formed of pixels that are not blocked by the object and which indicate intensity values measured by said direct x-ray detection means at a plurality of positions of said pencil beam of x-rays.

40. The system in accordance with claim 39 wherein said pixels are limited to representing one of two intensity values.

41. The system in accordance with claim 40 wherein one of said two intensity values represents that the beam of x-rays directed at a corresponding position of said direct x-ray detection means was detected to have impinged said direct x-ray detection means and wherein the other of said two values represents that the beam of x-rays was not detected to have impinged said direct x-ray detection means.

42. The system of claim 39 wherein the shadow image is adapted to be combined with said scatted image to form a composite image.

43. The system of claim 42 wherein said composite image comprises the intensity value from said shadow image where the x-ray beam impinged said direct x-ray detection means, and wherein said composite image comprises the value representative of the intensity of the x-rays scattered from the object where the x-ray beam did not impinge said direct x-ray detection means.

44. A method for scanning an object, comprising:

forming a pencil beam of x-rays with an x-ray source;

scanning the object with the pencil beam of x-rays;

detecting an intensity of x-rays scattered from the object;

forming a scattered image in response to said detecting;

measuring an intensity of x-rays passing directly from said x-ray source to a direct x-ray detector; and

forming a shadow image of pixels that are not blocked at the object and which indicate intensity values measured by the direct x-ray detector at a plurality of positions of the pencil beam of x-rays.

45. The method in accordance with claim 44 wherein the pixels are limited to representing one of two intensity values.

46. The method in accordance with claim 45 wherein one of the two intensity values represents that the beam of x-rays directed at a corresponding position of the direct x-ray detection means was detected to have impinged said direct x-ray detection means and wherein the other of the two values represents that the beam of x-rays was not detected to have impinged the direct x-ray detector.

47. The method of claim 44, further comprising:

combining the shadow image with the scattered image to form a composite image.

48. The method of claim 47 wherein the composite image comprises the intensity value from the shadow image where the beam of x-rays impinged the direct x-ray detector, and wherein the composite image comprises the value representative of the intensity of the x-rays scattered from the object where the x-ray beam did not impinge the direct x-ray detector.