Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method
First Claim
1. A process for fabricating a semiconductor structure comprising:
- providing a monocrystalline silicon substrate;
providing a plurality of metal sources in a deposition chamber;
depositing a monocrystalline perovskite oxide film overlying the monocrystalline silicon substrate by exposing the substrate to two or more of the plurality of metal sources at one time; and
monitoring a deposition rate of the monocrystalline perovskite oxide film during the depositing step, while the substrate is rotating.
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Accused Products
Abstract
High quality epitaxial layers of monocrystalline oxide materials (24) are grown overlying monocrystalline substrates such as large silicon wafers (22) using RHEED information to monitor the growth rate of the growing film. The monocrystalline oxide layer (24) may be used to form a compliant substrate for monocrystalline growth of additional layers. One way to achieve the formation of a compliant substrate includes first growing an accommodating buffer layer (24) on a silicon wafer (22) spaced apart from the silicon wafer (22) by an amorphous interface layer of silicon oxide (28). The amorphous interface layer (28) dissipates strain and permits the growth of a high quality monocrystalline oxide accommodating buffer layer (24).
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Citations
41 Claims
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1. A process for fabricating a semiconductor structure comprising:
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providing a monocrystalline silicon substrate;
providing a plurality of metal sources in a deposition chamber;
depositing a monocrystalline perovskite oxide film overlying the monocrystalline silicon substrate by exposing the substrate to two or more of the plurality of metal sources at one time; and
monitoring a deposition rate of the monocrystalline perovskite oxide film during the depositing step, while the substrate is rotating. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
forming a monocrystalline compound semiconductor layer; and
forming an electronic device using the monocrystalline compound semiconductor layer.
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14. The process of claim 13, wherein the step of forming an electronic device includes forming a field effect transistor.
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15. The process of claim 13, wherein the step of forming an electronic device includes forming a light emitting device.
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16. The process of claim 13, further comprising the step of forming an electronic device using the monocrystalline silicon substrate.
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17. The process of claim 16, wherein the step of forming a template comprises depositing aluminum.
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18. The process of claim 16, further comprising the step of forming an electrical connection between the electronic device formed using the monocrystalline silicon substrate and the electronic device formed using the monocrystalline compound semiconductor layer.
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19. The process of claim 1, further comprising the step of epitaxially forming a monocrystalline GaAs layer.
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20. A semiconductor structure formed using the method of claim 1.
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21. A semiconductor device formed using the method of claim 1.
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22. A process for fabricating a semiconductor structure comprising:
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providing a monocrystalline silicon substrate;
providing a plurality of sources in a deposition chamber;
rotating the monocrystalline silicon substrate;
depositing a monocrystalline perovskite oxide film overlying the monocrystalline silicon substrate; and
monitoring a deposition rate of the a monocrystalline perovskite oxide film using a RHEED diffraction pattern, while the substrate is rotating. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 40)
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39. A process for fabricating a semiconductor structure comprising:
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providing a monocrystalline silicon substrate;
providing a plurality of sources in a deposition chamber;
rotating the monocrystalline silicon substrate;
depositing a monocrystalline perovskite oxide film overlying the monocrystalline silicon substrate, while rotating the monocrystalline silicon substrate;
monitoring the deposition of the a monocrystalline perovskite oxide film using a RHEED diffraction pattern, while the monocrystalline silicon substrate is rotating;
forming an amorphous oxide layer interposed between the monocrystalline silicon substrate and the monocrystalline perovskite oxide film; and
epitaxially growing a layer of GaAs overlying the monocrystalline perovskite oxide. - View Dependent Claims (41)
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Specification