Sample support plates for mass spectrometry with ionization by matrix-assisted laser desorption

• US 6,670,609 B2
• Filed: 08/16/2002
• Issued: 12/30/2003
• Est. Priority Date: 08/17/2001
• Status: Active Grant

• Current Assignee: Bruker Daltonik GmbH (Bruker Corporation)
• Original Assignee: Bruker Daltonik GmbH (Bruker Corporation)
• Inventors: Rebettke, Jens, Franzen, Jochen
• Primary Examiner(s): Lee, John R.
• Assistant Examiner(s): SOUW, BERNARD E
• Application Number:
  US10/222,764
• Publication Number:
  US 20030057368A1
• Time in Patent Office: 501 Days
• Field of Search: 250/288, 435/6, 435/23, 435/24, 435/287.2, 436/177, 536/24.3
• US Class Current: 250/288
• CPC Class Codes: H01J 49/0418 for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
• CPC Class Codes: Y10T 436/25375 Liberation or purification of sample or separation of material from a sample [e.g., filtering, centrifuging, etc.]

Abstract

The invention concerns the structure of the sample support plates for mass spectrometric analysis of organic samples ionized by matrix-assisted laser desorption. The invention consists of a highly flat plate, electrically conductive at least on its surface, rigidly bonded to a base structure in such a way that together they form a body having the external dimensions of a microtitre plate, but such that thermal distortions of the surface cannot occur. The base structure may have both depressions for frictional gripping by a robot as well as a machine-readable identifier.

Claims

1. Sample support for the mass spectrometric analysis of samples with ionization by matrix-assisted laser desorption, consisting of a flat sample plate to take the samples and a base structure, together creating the external form of a microtitre plate wherein the sample plate has holes or grooves, and the base structure is rigidly bonded to the sample plate by pins or protrusions anchored into the holes or grooves.

2. Sample support according to claim 1 wherein there are three such bonding points, and the base structure is attached with a small clearance from the sample plate.

3. Sample support according to claim 2 wherein the base structure has slightly raised supporting surfaces surrounding the bonding points to take the sample plate, and these raised surfaces determine the clearance.

4. Sample support according to claim 1 wherein the protrusions or pins are so flexible that they can absorb part of the shear forces generated as a result of the different rates of expansion of the sample plate and the base structure when temperature changes occur, without fully transferring these forces to the sample plate.

5. Sample support according to claim 1 wherein the sample plate consists of stainless steel, glass onto which a conductive layer has been evaporated, or silicon.

6. Sample support according to claim 1 wherein the base structure consists of an injection molding or of vacuum-compatible plastic.

7. Sample support according to claim 1 wherein the base structure carries a machine-readable identifier.

8. Sample support according to claim 7 wherein the identifier is a barcode.

9. Sample support according to claim 7 wherein the identifier is a transponder.

10. Sample support according to claim 9 wherein the identifier in the transponder contains a non-alterable partial code that identifies the sample support, and a partial code that can contain the current occupancy of the sample support, specific current properties of the sample support, data on the history of its occupancy and/or the frequency of its usage.

11. Sample support according to claim 1 wherein the base structure has holes or grooves at the side to facilitate frictional gripping by a gripper robot.