Method for determining the position and rotational position of an object
First Claim
1. A method for determining the position and rotational position of an object with object structures of known dimension in three-dimensional space using an optical measuring head having an imaging optical system with imaging properties, an optoelectronic detector which is position-resolving in two dimensions, and an evaluation system, said method comprising the steps of collecting on the detector a focused image of that part of the object which is present in the field of view of the imaging optical system, feeding detected image information from the detector to the evaluation system, and using the evaluation system to determine at least one of the position and rotational position of the object in space, described by position parameters, by determining the position of focused object structures on the detector using the detected image information, determining an imaging scale based on the position of focused object structures on the detector relative to known dimensions of the object structures, and determining the position parameters by at least one of the following:
- (1) calculating theoretical detector images for at least one set of position parameters using the imaging scale and imaging properties of the optical system, and choosing the position parameters which result in a calculated detector image which agrees with the detected image information; and
(2) calculating the position parameters directly using the imaging properties of the optical system, the imaging scale, and geometric vector equations.
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Abstract
The invention relates to a method for determining the spatial and rotational positions of an object. With the assistance of an imaging optical system, the object is mapped and detected on a high-sensitivity resolution optoelectronic detector. The location parameter of the object, such as the position vector ({overscore (r)}0), the direction vector ({overscore (ν)}) of the object axis, and the angle (κ) of rotation of the object around the object axis is determined from the planar position of the mapped object structures in the coordinate system (XDet, YDet) of the detector by means of geometric optical relationships and mathematical evaluation methods. With this, the spatial position of the object is determined in a quick and contactless manner.
23 Citations
28 Claims
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1. A method for determining the position and rotational position of an object with object structures of known dimension in three-dimensional space using an optical measuring head having an imaging optical system with imaging properties, an optoelectronic detector which is position-resolving in two dimensions, and an evaluation system, said method comprising the steps of collecting on the detector a focused image of that part of the object which is present in the field of view of the imaging optical system, feeding detected image information from the detector to the evaluation system, and using the evaluation system to determine at least one of the position and rotational position of the object in space, described by position parameters, by determining the position of focused object structures on the detector using the detected image information, determining an imaging scale based on the position of focused object structures on the detector relative to known dimensions of the object structures, and determining the position parameters by at least one of the following:
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(1) calculating theoretical detector images for at least one set of position parameters using the imaging scale and imaging properties of the optical system, and choosing the position parameters which result in a calculated detector image which agrees with the detected image information; and
(2) calculating the position parameters directly using the imaging properties of the optical system, the imaging scale, and geometric vector equations. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28)
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Specification