Method and device for measuring characteristics of a sample

• US 6,671,629 B2
• Filed: 06/17/2002
• Issued: 12/30/2003
• Est. Priority Date: 12/15/1999
• Status: Expired due to Fees

• Current Assignee: Siemens AG
• Original Assignee: Siemens AG
• Inventors: Maier, Peter
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): SUAREZ, FELIX E
• Application Number:
  US10/171,964
• Publication Number:
  US 20030028329A1
• Time in Patent Office: 561 Days
• Field of Search: 702/27, 702/28, 702/32, 702/69, 702/76, 702/134, 702/172, 600/318, 250/573, 435/174, 356/369
• US Class Current: 702/28
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 2201/12723 Self check capacity; automatic, periodic step of checking

Abstract

A method and a device for measuring the characteristics of a sample by spectral analysis. According to the method, the characteristics are calculated from the spectral data obtained by the spectral analysis, using a calibration model that has been established on the basis of reference samples. In order to improve the stability of the measuring process, an additional calculation of the characteristics (16) of the samples (1) takes place, using at least one additional calibration model (14) that has been established on the basis of additional reference samples (1″). Deviations between the characteristics (12, 16) calculated by the respective calibration models (11, 14) are determined and output.

Claims

1. Method for measuring characteristics of a sample by spectral analysis, comprising:

calculating the characteristics from spectral data obtained from the spectral analysis using a calibration model that has been established on the basis of reference samples;

performing an additional calculation of the characteristics of the sample based on the same spectral data using at least one additional calibration model that has been established on the basis of additional reference samples; and

determining and outputting deviations between the characteristics calculated by the respective calibration models, to permit an evaluation of the quality of the measurement.

2. Method as claimed in claim 1, wherein the deviations are monitored for exceeding a predefined threshold.

3. Method as claimed in claim 1, wherein the reference samples and the additional reference samples each cover differently sized variation ranges of the characteristics.

4. Method as claimed in claim 1, wherein the calibration model and the additional calibration model are established, respectively, with the reference samples and the additional reference samples under slightly different boundary conditions.

5. Method as claimed in claim 1, wherein the calibration model and the additional calibration model are established with reference samples and additional reference samples obtained from different points in time.

6. Method as claimed in claim 1, wherein the characteristics calculated by one of the calibration models are selected based on at least one of sample-specific and measurement-situation-specific criteria.

7. Device for measuring characteristics of a sample comprising:

a spectrometer for spectral analysis of the sample;

a calibration model that has been established on the basis of reference samples and that calculates the characteristics from spectral data supplied by said spectrometer;

at least one additional calibration model that has been established on the basis of additional reference samples and that performs an additional calculation of the characteristics; and

a comparator arranged downstream from said calibration models, which determines deviations between the characteristics calculated by said respective calibration models.

8. Device as claimed in claim 7, wherein said comparator checks whether the deviations exceed a predetermined threshold.

9. Device as claimed in claim 7, further comprising a selection unit arranged downstream from said calibration models, which selects the characteristics calculated by one of said calibration models based on at least one of sample-specific and measurement-situation-specific criteria that are supplied to said selection unit.

10. A method for measuring at least one characteristic of a sample by spectral analysis, comprising:

obtaining spectral data from a spectral analysis of the sample;

performing a first calculation of the characteristic of the sample from the spectral data obtained using a first calibration model that has been established on the basis of reference samples;

performing an additional calculation of the characteristic of the sample from the same spectral data using at least one different calibration model that has been established on the basis of at least partly differing reference samples; and

comparing the characteristics calculated, respectively, by the first calibration model and the different calibration model.

11. The method as claimed in claim 10, further comprising outputting a signal if said comparing reveals a deviation in the respectively calculated characteristics that exceeds a predetermined threshold.

12. The method as claimed in claim 10, wherein the reference samples and the differing reference samples differ in extent of sample variation.

13. The method as claimed in claim 10, wherein the first calibration model and the different calibration model are established, respectively, with the reference samples and the differing reference samples under mutually different boundary conditions.

14. The method as claimed in claim 10, wherein the first calibration model and the different calibration model are established, respectively, with the reference samples and the differing reference samples taken from mutually different points in time.

15. The method as claimed in claim 10, further comprising selecting one of the respectively calculated characteristics in accordance with said comparing and at least one selection criterion.

16. A system for measuring at least one characteristic of a sample, comprising:

a spectrometer configured to output spectral data for the sample;

a first calibration model established on the basis of reference samples and configured to calculate the characteristic from the spectral data;

at least one additional calibration model established on the basis of at least partly differing reference samples and configured to calculate the characteristics from the spectral data; and

a unit having inputs for the calculated characteristics of said first and said second calibration models and configured to output a comparison result of the calculated characteristics.

17. The system as claimed in claim 16, wherein the comparison result is a signal indicating a deviation in the calculated characteristics greater than a predetermined value.

18. The system as claimed in claim 16, wherein the comparison result is one of the calculated characteristics selected by said unit in accordance with a selection criterion.