Method and apparatus for managing circuit tests

• US 6,675,362 B1
• Filed: 06/12/2000
• Issued: 01/06/2004
• Est. Priority Date: 06/12/2000
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies Europe BV (Agilent Technologies, Inc.)
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Ortiz, Richard D., Huetter, John P., Vu, Duong Xuan, Sill, Gale A.
• Primary Examiner(s): Smith, Matthew
• Assistant Examiner(s): Dimyan, Magid Y
• Application Number:
  US09/592,033
• Time in Patent Office: 1,303 Days
• Field of Search: 716/4, 716/1-3, 716/5-10
• US Class Current: 703/4
• CPC Class Codes: G01R 31/31705 Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544
• CPC Class Codes: G01R 31/3183 Generation of test inputs, e.g. test vectors, patterns or sequences
• CPC Class Codes: G01R 31/318307 computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
• CPC Class Codes: G01R 31/318342 by preliminary fault modelling, e.g. analysis, simulation
• CPC Class Codes: G01R 31/318371 Methodologies therefor, e.g. algorithms, procedures

Abstract

Methods and apparatus for managing circuit tests. In a first embodiment of the invention, a number of electrical characteristics of a number of electrical components which exist in a circuit are identified, and the number of electrical components are then grouped in response to the number of electrical characteristics. Thereafter, and for each group of electrical components, a circuit test which is common to the electrical components of the group is established. When the execution of a test results in a false fail, the test is debugged, and the debugged test is then associated with each other component in its group. Much of a programmer'"'"'s debug effort is therefore “proactive” rather than “reactive”. Preferably, a test history log is maintained for each component group so that previously abandoned test solutions are not repeated as tests are debugged. In a second embodiment of the invention, a number of test parameters of a number of circuit tests created for a number of electrical components which exist in a circuit are identified. Circuit components are then grouped in response to the test parameters rather than in response to electrical characteristics (though some of the test parameters may actually be electrical characteristics). The methods are preferably implemented in software. The methods and apparatus disclosed not only shorten the time required to complete a debug effort (i.e., to insure that tests are stabile), but also insure a greater degree of uniformity among tests which are associated with like electrical components.

Claims

1. A method of managing circuit tests, comprising:

a) identifying a number of electrical characteristics of a number of electrical components existing in a circuit;

b) grouping at least some of the number of electrical components in response to the number of electrical characteristics; and

c) for each group of electrical components formed, establishing a circuit test which is common to the electrical components of the group.

2. A method as in claim 1, wherein said identifying comprises parsing a mathematical model of the circuit.

3. A method as in claim 1, wherein the number of electrical characteristics comprises component type information.

4. A method as in claim 1, wherein the number of electrical characteristics comprises component value information.

5. A method as in claim 1, wherein the number of electrical characteristics comprises circuit topology information.

6. A method as in claim 1, wherein said grouping is performed in response to identity of one or more of the number of electrical characteristics.

7. A method as in claim 1, wherein said grouping is performed in response to ranges of one or more of the number of electrical characteristics.

8. A method as in claim 1, further comprising, when a circuit test which is associated with one electrical component in a particular group of electrical components is modified, similarly modifying circuit tests which are associated with each other electrical component in the particular group of electrical components.

9. A method as in claim 8:

a) further comprising, after modification of the circuit test which is associated with the one electrical component in the particular group of electrical components, executing the circuit test which is associated with the one electrical component with respect to the one electrical component; and

b) wherein similar modification of circuit tests which are associated with each other electrical component in the particular group of electrical components is only performed after the circuit test which is associated with the one electrical component is deemed to execute satisfactorily with respect to the one electrical component.

10. A method as in claim 8:

a) further comprising, after modification of the circuit test which is associated with the one electrical component in the particular group of electrical components, executing the circuit test which is associated with the one electrical component with respect to each electrical component in the particular group of electrical components; and

b) wherein similar modification of circuit tests which are associated with each other electrical component in the particular group of electrical components is only performed after the circuit test which is associated with the one electrical component is deemed to execute satisfactorily with respect to each electrical component in the particular group of electrical components.

11. A method as in claim 1, further comprising:

a) for each group of electrical components, maintaining a list of electrical components which are included in the group; and

b) when a circuit test which is associated with one electrical component in a particular group of electrical components is modified, using the list of electrical components which are included in the particular group as an index into a data structure which maintains circuit tests for the number of electrical components.

12. A method as in claim 1, further comprising:

a) maintaining a test history log; and

b) updating the test history log as circuit tests are modified.

13. Apparatus for managing circuit tests, comprising:

a) a number of computer readable media; and

b) computer readable program code stored on said number of computer readable media, said computer readable program code comprising;

i) program code for identifying a number of electrical characteristics of a number of electrical components existing in a circuit;

ii) program code for grouping at least some of the number of electrical components in response to the number of electrical characteristics; and

iii) program code which, for each group of electrical components, establishes a circuit test which is common to the electrical components of the group.

14. A method of managing circuit tests, comprising:

a) identifying a number of test parameters of a number of circuit tests created for a number of electrical components existing in a circuit;

b) grouping at least some of the number of electrical components in response to the number of test parameters; and

c) when a circuit test which is associated with one electrical component in a particular group of electrical components is modified, similarly modifying circuit tests which are associated with each other electrical component in the particular group of electrical components.

15. A method as in claim 14, wherein the number of test parameters comprises component type information.

16. A method as in claim 15, wherein the number of test parameters comprises component tolerance information.

17. A method as in claim 16, wherein the component tolerance information comprises value tolerance information.

18. A method as in claim 16, wherein the component tolerance information comprises frequency response tolerance information.

19. A method as in claim 14, wherein the number of test parameters comprises component value information.

20. A method as in claim 14, wherein said grouping is performed in response to identity of one or more of the number of test parameters.

21. A method as in claim 14, wherein said grouping is performed in response to ranges of one or more of the number of test parameters.

22. A method as in claim 14:

a) further comprising, after modification of the circuit test which is associated with the one electrical component in the particular group of electrical components, executing the circuit test which is associated with the one electrical component with respect to the one electrical component; and

b) wherein similar modification of circuit tests which are associated with each other electrical component in the particular group of electrical components is only performed after the circuit test which is associated with the one electrical component is deemed to execute satisfactorily with respect to the one electrical component.

23. A method as in claim 14:

a) further comprising, after modification of the circuit test which is associated with the one electrical component in the particular group of electrical components, executing the circuit test which is associated with the one electrical component with respect to each electrical component in the particular group of electrical components; and

b) wherein similar modification of circuit tests which are associated with each other electrical component in the particular group of electrical components is only performed after the circuit test which is associated with the one electrical component is deemed to execute satisfactorily with respect to each electrical component in the particular group of electrical components.

24. A method as in claim 14, further comprising:

a) for each group of electrical components, maintaining a list of electrical components which are included in the group; and

b) when a circuit test which is associated with one electrical component in a particular group of electrical components is modified, using the list of electrical components which are included in the particular group as an index into a data structure which maintains circuit tests for the number of electrical components.

25. A method as in claim 14, further comprising:

a) maintaining a test history log; and

b) updating the test history log as circuit tests are modified.

26. Apparatus for managing circuit tests, comprising:

a) a number of computer readable media; and

b) computer readable program code stored on said number of computer readable media, said computer readable program code comprising;

i) program code for identifying a number of test parameters of a number of circuit tests created for a number of electrical components existing in a circuit;

ii) program code for grouping at least some of the number of electrical components in response to the number of test parameters; and

iii) program code for similarly modifying circuit tests which are associated with each electrical component in a particular group of electrical components when a circuit test which is associated with one electrical component in the particular group of electrical components is modified.