Method and system for testing a test piece

• US 6,681,142 B2
• Filed: 03/02/2001
• Issued: 01/20/2004
• Est. Priority Date: 03/02/2000
• Status: Expired due to Fees

• Current Assignee: Siemens AG
• Original Assignee: Siemens AG
• Inventors: Schinkowitsch, Bernhard
• Primary Examiner(s): Picard, Leo
• Assistant Examiner(s): Lee, Douglas S.
• Application Number:
  US09/798,242
• Publication Number:
  US 20010021899A1
• Time in Patent Office: 1,054 Days
• Field of Search: 702/108, 702/117, 702/118, 702/121, 714/724, 714/745, 324/73.1, 324/158.1, 700/1, 700/26, 700/39, 700/79, 700/81, 700/108-113
• US Class Current: 700/108
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/31816 Soft error testing; Soft error rate evaluation; Single event testing
• CPC Class Codes: H04M 1/24 Arrangements for testing

Abstract

A method and system for computerized testing of a test piece, wherein testing is implemented by individual test modules operating in parallel. As a result, the total testing time is shortened. A central control computer and the test modules communicate via a field bus system. Implementation of a test occurs at least partially in parallel with respect to time by means of at least two different test modules. Transmission of test orders from the central computer to a test module and acknowledgment messages from the test module to the central control computer are carried by the field bus system. As a result, necessary wiring outlay is low and any interferences that occur can be quickly localized and eliminated.

Claims

1. A method for performing a test on an electronic device having input units and output units which are tested with at least two different test modules that perform at least two different functions, the method comprising the steps of:

controlling the test by a control program running in a central control computer;

connecting test modules and transport modules to the central control computer;

implementing the test by the at least two different test modules running at least partially in parallel in terms of time

transmitting test orders from the central control computer to a test module; and

acknowledging messages from the test module to the central computer via a field bus system.

2. The method according to claim 1, further comprising the step of:

running in the control program a user-specific part that is independent of the test modules and the transport modules.

3. The method according to claim 2, further comprising the steps of:

recognizing the test modules and transport modules with the aid of the control program; and

integrating the modules into the test process corresponding to their type.

4. The method according to claim 3, further comprising the steps of:

recognizing the structure of the test piece with the aid of the control program; and

adapting the test process correspondingly.

5. The method according to claim 4, further comprising the steps of:

having the control program prepare a report about the result of a test; and

forwarding the report into an external data network.

6. The method according to claim 5, further comprising the steps of:

recognizing disturbances in the test process by the central control computer and the test modules connected thereto;

preparing a report corresponding to the disturbances; and

forwarding the report is forwarded into an external data network.

7. A system for testing an electronic device, wherein input units and output units of the device are tested, the system comprising:

a central computer, at least two test modules and a field bus system connecting the test modules to the central control computer, whereby the test modules concerning at least two different functions, operate as interfaces to the input units and output units, and are configured to run at least partially in parallel in terms of

wherein the central control computer comprises an interface to a data network; and

wherein the central control computer comprises an interface to a transport module, which transports a test piece to and from the test modules.