Three dimensional etching process
First Claim
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1. A method of forming an optical confining structure, said method comprising producing or modifying a three dimensional surface profile on a substrate comprising the steps of:
- (i) forming a mask of resist on the substrate such that some area of the substrate is protected by the mask and some area is exposed;
(ii) forming the resist into a dome;
(iii) subjecting the substrate and the mask to a plurality of iterations;
wherein each iteration comprises at least one resist etch and at least one substrate etch, the resist etch being carried out using a suitable resist etchant, which modifies the shape of the mask and hence the area of substrate exposed, and the substrate etch being carried out using a suitable substrate etchant from which the mask affords protection of the substrate, and which removes material from the areas of substrate which are exposed, the resist etch and the substrate etch being substantially asynchronous, so that substantially perpendicular straight edges are formed in the substrate.
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Abstract
A method of forming three-dimensional structures on a substrate by a single reactive ion each run whereby a mask is formed on said substrate before a series of iterations are carried out, each iteration including a mask etch and a substrate etch, so that successive iterations give life to reduction in the mask area and exposure of further areas of substrate.
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Citations
7 Claims
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1. A method of forming an optical confining structure, said method comprising producing or modifying a three dimensional surface profile on a substrate comprising the steps of:
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(i) forming a mask of resist on the substrate such that some area of the substrate is protected by the mask and some area is exposed;
(ii) forming the resist into a dome;
(iii) subjecting the substrate and the mask to a plurality of iterations;
wherein each iteration comprises at least one resist etch and at least one substrate etch, the resist etch being carried out using a suitable resist etchant, which modifies the shape of the mask and hence the area of substrate exposed, and the substrate etch being carried out using a suitable substrate etchant from which the mask affords protection of the substrate, and which removes material from the areas of substrate which are exposed, the resist etch and the substrate etch being substantially asynchronous, so that substantially perpendicular straight edges are formed in the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification