Programmable voltage divider and method for testing the impedance of a programmable element

• US 6,686,747 B2
• Filed: 05/26/1999
• Issued: 02/03/2004
• Est. Priority Date: 03/07/1997
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Morgan, Donald M.
• Primary Examiner(s): Hafiz, Tariq R.
• Assistant Examiner(s): ALLEN, AKIBA KANELLE
• Application Number:
  US09/318,557
• Publication Number:
  US 20020042746A1
• Time in Patent Office: 1,714 Days
• Field of Search: 702/57, 702/58, 702/38, 702/117, 702/118, 324/756, 324/537, 324/500, 324/600, 324/66, 324/67, 324/158.1
• US Class Current: 324/600
• CPC Class Codes: G01R 15/09 Autoranging circuits
• CPC Class Codes: G01R 31/2843 In-circuit-testing
• CPC Class Codes: G06Q 20/202 Interconnection or interaction of plural electronic cash registers [ECR] or to host computer, e.g. network details, transfer of information from host to ECR or from ECR to ECR
• CPC Class Codes: G11C 5/147 Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops G11C5/141 takes precedence

Abstract

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled node, a second divider element that has a selectable resistivity and that is coupled between the divider node and the controlled node, and a test circuit that is coupled between the controlled node and the second supply node. During the normal mode of operation, the first and second divider elements generate the data value having a first logic level when the second divider element has a first resistivity, and generate the data value having a second logic level when the second divider element has a second resistivity. The test circuit generates a first voltage at the controlled node during the normal mode of operation, and generates a second voltage at the controlled node during the test mode of operation. The test circuit may generate the first and second voltages by varying its impedance, or by switching in and out one or more fixed voltages.

Claims

1. A method for testing a programmed level of conductivity of a programmed conduction element, the method comprising:

coupling an impedance element between a first voltage and a first terminal of said programmed conduction element, the programmed conduction element having an impedance that may be at, below or above a target impedance and may be above the target impedance by at more than a predetermined tolerance impedance approximating a difference between a target level for the programmed level of conductivity of the programmed conduction element and an unacceptable level of impedance for the programmed conduction element;

generating at a second terminal of said programmed conduction element a test voltage in both a normal operating mode and in a test mode, the test voltage having a value in the normal operating mode that causes the voltage at said first terminal to be substantially equal to a predetermined voltage if the programmed conduction element has an impedance substantially equal to the sum of the target impedance and the predetermined tolerance impedance, the test voltage having a value in the test mode that causes the voltage at said first terminal to be substantially equal to the predetermined voltage if the programmed conduction element has an impedance substantially equal to the target impedance; and

comparing the voltage at said first terminal of said programmed conduction element to the predetermined voltage in both the normal operating mode and the test mode to determine if the voltage at said first terminal is between the first voltage and the predetermined voltage or between the test voltage and the predetermined voltage.

2. The method of claim 1 wherein said act of generating the test voltage comprises coupling a voltage generator between said second terminal of said programmed conduction element and a reference voltage the magnitude of the voltage generated by the voltage generator having a first magnitude in the normal operating mode and a second magnitude in the test mode.

3. The method of claim 1 wherein said act of generating the test voltage comprises coupling an impedance load between said second terminal of said programmed conduction element and a reference voltage, the magnitude of the impedance load having a first magnitude in the normal operating mode and a second magnitude in the test mode.

7. The method of claim 1 wherein the first voltage is a constant voltage.

8. The method of claim 1 wherein the first voltage has a magnitude that is greater than the magnitude of the test voltage.

10. The method of claim 1 wherein each of the first voltages as a respective magnitude that is greater than the magnitude of the corresponding test voltage.

4. A method for testing the conductivities of programmed conduction elements, the method comprising:

for each of said programmed conduction elements, coupling an impedance element between a first voltage and a first terminal of said programmed conduction element, each programmed conduction element having an impedance that may be at, below or above a target impedance and may be above the target impedance by at least a predetermined tolerance impedance approximating a difference between a target level for the programmed level of conductivity of each programmed conduction element and an unacceptable level of impedance for each programmed conduction element;

generating at a second terminal of each of said programmed conduction elements a respective test voltage in both a normal operating mode and in a test mode, the respective test voltage having a value in the normal operating mode that causes the voltage at said first terminal of the respective programmed conduction element to be substantially equal to a predetermined voltage if the programmed conduction element has an impedance that is substantially equal to the sum of the target impedance and the predetermined tolerance impedance, and the respective test voltage having a value in the test mode that causes the voltage at said first terminal of the respective programmed conduction element to be substantially equal to the predetermined voltage if the programmed conduction element has an impedance that is substantially equal to the target impedance;

comparing the voltage at said first terminal of each of said programmed conduction elements to the predetermined voltage in both the normal operating mode and the test mode to determine if the voltage at said first terminal is between the first voltage and the predetermined voltage or between the test voltage and the predetermined voltage;

generating respective first logic levels if the voltage at said first terminal of each of said programmed conduction elements is between the first voltage and the predetermined voltage and generating respective second logic levels if the voltage at said first terminal of each of said programmed conduction elements is between the test voltage and the predetermined voltage; and

determining in the test mode if the first logic level is generated for any of the programmed conduction elements.

5. The method of claim 4 wherein said generating the test voltage comprises coupling a respective voltage generator between said second terminals of said programmed conduction elements and a reference voltage, the magnitude of the voltage generated by the voltage generator having a first magnitude in the normal operating mode and a second magnitude in the test mode.

6. The method of claim 4 wherein said act of generating the test voltage comprises coupling a respective impedance load between said second terminals of said programmed conduction elements and a reference voltage, the magnitude of the impedance load having a first magnitude in the normal operating mode and a second magnitude in the test mode.

9. The method of claim 4 wherein each of the first voltages is a constant voltage.