Apparatus and method for measuring optical activity

• US 6,687,012 B2
• Filed: 10/30/2001
• Issued: 02/03/2004
• Est. Priority Date: 10/30/2001
• Status: Expired due to Fees

• Current Assignee: Fordham University
• Original Assignee: Fordham University
• Inventors: Sanzari, Martin
• Primary Examiner(s): Turner, Samuel A.
• Assistant Examiner(s): Lyons, Michael A.
• Application Number:
  US10/016,476
• Publication Number:
  US 20030081221A1
• Time in Patent Office: 826 Days
• Field of Search: 356/450, 356/484, 356/491
• US Class Current: 356/484
• CPC Class Codes: G01N 2021/216 using circular polarised light
• CPC Class Codes: G01N 21/23 Bi-refringence

Abstract

The change in the circular birefringence of a sample is measured by passing a light beam comprised of a left circularly polarized (LCP) wave and a right circularly polarized (RCP) wave through a sample and measuring the change in the phase difference between the RCP and LCP waves.

Claims

1. An apparatus for measuring the circular birefringence of a sample comprising:

(a) a reference polarizer positioned to receive a reference beam having a right circularly polarized (RCP) wave characterized by a first frequency and a left circularly polarized (LCP) wave characterized by a second frequency, the reference polarizer producing a reference heterodyne wave, the reference heterodyne wave characterized by a reference phase, the reference phase representing the difference between the RCP wave and the LCP wave of the reference beam;

(b) a reference detector positioned to receive the reference heterodyne wave and generate a reference signal;

(c) a measurement polarizer positioned to receive a measurement beam exiting the sample, the measurement beam having a RCP wave characterized by the first frequency and a LCP wave characterized by the second frequency, the measurement polarizer producing a measurement heterodyne wave, the measurement heterodyne wave characterized by a measurement phase, the measurement phase representing the difference between the RCP wave and the LCP wave of the measurement beam;

(d) a sample detector positioned to receive the measurement heterodyne wave and generate a measurement signal;

(e) a gain/phase meter connected to the reference detector and sample detector and generating an output signal characterized by a phase difference equal to the difference between the measurement phase and the reference phase; and

(f) a control program capable of execution on a processor, the control program calculating the circular birefringence of the sample based, in part, on the output signal of the gain/phase meter.

2. The apparatus of claim 1 wherein the reference beam and measurement beam are generated by a Zeeman laser characterized by a center frequency and a beat frequency.

3. The apparatus of claim 2 wherein the Zeeman laser includes a permanent magnet and a stabilizer coil, the stabilizer coil energized to maintain a beat frequency having a variation less than 100 Hz.

4. The apparatus of claim 3 wherein the Zeeman laser further includes a quarter-wave plate, the quarter-wave plate converting a portion of the LCP and RCP waves into a first linearly polarized (1 LP) wave and a second linearly polarized (2LP) wave, the 1LP wave orthogonal to the 2LP wave.

5. The apparatus of claim 1 wherein the measurement polarizer is fixed with respect to rotations about an axis defined by the measurement beam.

6. The apparatus of claim 2 wherein the beat frequency is less than 200 MHz.

7. The apparatus of claim 6 wherein the beat frequency is less than 10 MHz.

8. The apparatus of claim 7 wherein the beat frequency is between 0.5 MHz-4 MHz.

9. The apparatus of claim 8 wherein the beat frequency is between 1.5 MHz-2.0 MHz.

10. The apparatus of claim 1 further comprising:

(i) a light beam generator generating a light beam having a first linearly polarized (1LP) wave characterized by a first frequency and a first polarization plane and a second linearly polarized (2LP) wave characterized by a second frequency and a second polarization plane, wherein the first polarization plane is orthogonal to the second polarization plane;

(ii) a quarter-wave plate positioned to receive the light beam and convert the first and second linearly polarized waves to a right circularly polarized (RCP) wave and a left circularly polarized (LCP) wave; and

(iii) a beam splitter positioned to receive the light beam from the quarter-wave plate and produce a measurement beam and a reference beam.

11. The apparatus of claim 10 wherein the light beam generator is a Zeeman laser characterized by a center frequency and a beat frequency.

12. The apparatus of claim 11 wherein the Zeeman laser includes a permanent magnet and a stabilizer coil, the stabilizer coil energized to maintain a beat frequency having a variation less than 100 Hz.

13. The apparatus of claim 10 wherein the measurement polarizer is fixed with respect to rotations about an axis defined by the measurement beam.

14. The apparatus of claim 11 wherein the beat frequency is less than 200 MHz.

15. The apparatus of claim 14 wherein the beat frequency is less than 10 MHz.

16. The apparatus of claim 15 wherein the beat frequency is between 0.5 MHz-4 MHz.

17. The apparatus of claim 16 wherein the beat frequency is between 1.5 MHz-2.0 MHz.

18. A method for determining the circular birefringence of a sample comprising the steps of:

(a) generating a coherent light beam having a left circularly polarized (LCP) wave and a right circularly polarized (RCP) wave, the light beam characterized by a phase;

(b) splitting the light beam into a measurement beam and a reference beam;

(c) passing the measurement beam through a blank sample;

(d) measuring a first phase difference between the measurement beam and reference beam;

(e) replacing the blank with the sample and passing the measurement beam through the sample;

(f) measuring a second phase difference between the measurement beam and reference beam; and

(g) determining the circular birefringence of the sample based, in part, on the first and second phase difference.

19. The method of claim 18 wherein the coherent light beam is generated by a Zeeman laser.

20. The method of claim 19 wherein the Zeeman laser includes a stabilizer coil, the stabilizer coil energized to maintain a beat frequency having a variation of less than 100 Hz.

21. The method of claim 18 wherein the steps (b) and (f) of measuring further include the steps of:

(i) passing the measurement beam and reference beam through a polarizer;

(ii) detecting a measurement beam intensity and a reference beam intensity; and

(iii) measuring the phase difference between the measurement beam and reference beam based, in part, on the measurement beam intensity and reference beam intensity.

22. A method for determining the circular birefringence of a sample comprising the steps of:

(a) generating a coherent light beam having a left circularly polarized (LCP) wave and a right circularly polarized (RCP) wave, the light beam characterized by a phase;

(b) splitting the light beam into a measurement beam and a reference beam;

(c) passing the measurement beam through a sample;

(d) measuring a phase difference between the measurement beam and reference beam;

(e) repeating steps (c) and (d) at least once thereby measuring a plurality of phase differences; and

(f) determining the circular birefringence of the sample based, in part, on the plurality of phase differences.

23. The method of claim 22 wherein the step of measuring further includes the steps of:

(i) passing the measurement beam and reference beam through a polarizer;

(ii) detecting a measurement beam intensity and a reference beam intensity; and

(iii) measuring the phase difference between the measurement beam and reference beam based, in part, on the measurement beam intensity and reference beam intensity.

24. The method of claim 22 wherein the LCP wave is characterized by a first frequency and the RCP wave is characterized by a second frequency wherein the first frequency is not equal to the second frequency.

25. A method for measuring the change of the circular birefringence of a sample comprising the steps of:

(a) propagating a beam through a sample, the beam having a first wave characterized by a first polarization state and a second wave characterized by a second polarization state that is orthogonal to the first polarization state, the beam further characterized by a phase difference between the first and second wave; and

(b) measuring the change of the phase difference of the beam.

26. An apparatus for measuring the circular birefringence of a sample comprising:

(a) a light beam generator generating a light beam having a right circularly polarized (RCP) wave characterized by a first frequency and a left circularly polarized (LCP) wave characterized by a second frequency;

(b) a beam splitter positioned to receive the light beam from the beam generator and produce a measurement beam and a reference beam;

(c) a reference polarizer positioned to receive the reference beam and produce a reference heterodyne wave, the reference heterodyne wave characterized by a reference phase, the reference phase representing the difference between the RCP wave and the LCP wave of the reference beam;

(d) a reference detector positioned to receive the reference heterodyne wave and generate a reference signal;

(e) a measurement polarizer positioned to receive the measurement beam exiting the sample and produce a measurement heterodyne wave, the measurement heterodyne wave characterized by a measurement phase, the measurement phase representing the difference between the RCP wave and the LCP wave of the measurement beam;

(f) a sample detector positioned to receive the measurement heterodyne wave and generate a measurement signal;

(g) a gain/phase meter connected to the reference detector and sample detector and generating an output signal characterized by a phase difference equal to the difference between the measurement phase and the reference phase; and

(h) a processor connected to the gain/phase meter, the processor calculating the circular birefringence of the sample based, in part, on the output signal of the gain/phase meter.

27. An apparatus for measuring the circular birefringence of a sample comprising:

(a) a light beam generator generating a light beam having a first linearly polarized (1LP) wave characterized by a first frequency and a first polarization plane and a second linearly polarized (2LP) wave characterized by a second frequency and a second polarization plane, wherein the first polarization plane is orthogonal to the second polarization plane;

(b) a quarter-wave plate positioned to receive the light beam and convert the first and second linearly polarized waves to a right circularly polarized (RCP) wave and a left circularly polarized (LCP) wave;

(c) a beam splitter positioned to receive the light beam from the quarter-wave plate and produce a measurement beam and a reference beam;

(d) a reference polarizer positioned to receive the reference beam and produce a reference heterodyne wave, the reference heterodyne wave characterized by a reference phase, the reference phase representing the difference between the RCP wave and the LCP wave of the reference beam;

(e) a reference detector positioned to receive the reference heterodyne wave and generate a reference signal;

(f) a measurement polarizer positioned to receive the measurement beam exiting the sample and produce a measurement heterodyne wave, the measurement heterodyne wave characterized by a measurement phase, the measurement phase representing the difference between the RCP wave and the LCP wave of the measurement beam;

(g) a sample detector positioned to receive the measurement heterodyne wave and generate a measurement signal;

(h) a gain/phase meter connected to the reference detector and sample detector and generating an output signal characterized by a phase difference equal to the difference between the measurement phase and the reference phase; and

(i) a processor connected to the gain/phase meter, the processor calculating the circular birefringence of the sample based, in part, on the output signal of the gain/phase meter.