Methods and apparatus for increasing appliance measuring system accuracy

• US 6,688,119 B2
• Filed: 12/22/2000
• Issued: 02/10/2004
• Est. Priority Date: 12/22/2000
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Holmes, John Steven
• Primary Examiner(s): NORMAN, MARC E
• Application Number:
  US09/742,532
• Publication Number:
  US 20030010089A1
• Time in Patent Office: 1,145 Days
• Field of Search: 621/27, 374/1, 73/10.1, 324/537, 324/549, 324/691, 324/555
• US Class Current: 62/127
• CPC Class Codes: G01D 18/008 with calibration coefficients stored in memory
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24

Abstract

A reduced error measurement system for use in, for example, an appliance control system includes a multiplexor, a plurality of sensors coupled to the multiplexor, and a single amplifier circuit having an impedance path. The multiplexor is configured to selectively place one of the sensors into the impedance path of the amplifier. A transfer function of an amplifier circuit is dependent upon a selected sensor response when placed into the circuit, thereby allowing a controller to make control decisions based upon a voltage output of the single amplifier, thereby reducing errors attributable to a plurality of amplifier channels. An adjacent channel calibration technique is used to calibrate a hard mounted sensor to an integrated circuit that applies a calibrated offset value determined with a removable sensor coupled to the integrated circuit to the hard mounted sensor.

Claims

1. A method for reducing measurement error in a measurement system including a plurality of thermistors, a multiplexor, and a single amplifier circuit having an impedance path, said method comprising the steps of:

calibrating each of the plurality of thermistors;

coupling each of the thermistors to the multiplexor; and

selectively supplying an output of one of the thermistors through the multiplexor to the impedance path.

2. A method in accordance with claim 1 wherein said step of calibrating each of the sensors comprises the step of calibrating at least one of the sensors with a single point calibration slope technique to determine at least one sensor offset.

3. A method in accordance with claim 2, the measurement system including a memory, said method further comprising the step of storing the at least one sensor offset in the memory.

4. A method in accordance with claim 3, the measurement system including a processor, said method further comprising the steps of:

retrieving the sensor offset from memory when a reading of the at least one sensor is desired; and

applying the stored offset value to the at least one sensor signal to compensate for system error.

5. A method in accordance with claim 2 wherein said step of calibrating each of the sensors comprises the step of calibrating at least one of the sensors with a two point calibration slope technique to determine a sensor slope and a sensor offset.

6. A method in accordance with claim 5, the measurement system including a memory, said method further comprising the step of storing the at least one sensor slope and at least one sensor offset in the memory.

7. A method in accordance with claim 6, the measurement system including a processor, said method further comprising the steps of:

retrieving the at least one sensor slope and at least one sensor offset from memory when a reading of the at least one sensor is desired; and

applying the stored sensor slope value and the stored sensor offset value to the at least one sensor signal to compensate for system error.

8. A method in accordance with claim 5 wherein said step of selectively supplying an output of one of the sensors through the multiplexor to the impedance path further comprises the step of supplying the selected sensor output at an input impedance path of the amplifier.

9. A method in accordance with claim 1 wherein the measurement system includes at least one hard mounted sensor, the measurement system further including an integrated circuit having at least a first channel and a second channel, the hard mounted sensor mounted to the first channel and a removable sensor coupled to the second channel, said step of calibrating each sensor comprising the steps of:

calibrating the second channel with the removable sensor to obtain at least a calibration offset value; and

applying the calibration offset value to the first channel.

10. A method in accordance with claim 9 wherein the measuring system includes at least one analog-to-digital converter configured to receive and convert channel measurement values, said step of calibrating the second channel comprising the steps of:

replacing the removable sensor with an equivalent source having an expected value;

obtaining a measured value for the equivalent source using the analog-to-digital converter;

determining the offset value using the measured value and the expected value.

11. A method in accordance with claim 10 wherein the measurement system includes a memory, said method further comprising the step of storing the offset value in the memory.

12. A method in accordance with claim 11 wherein said step of replacing the removable sensor with an equivalent source having an expected value comprises the step of replacing the removable sensor with a tight-tolerance resistor.

13. A method in accordance with claim 9 wherein the measuring system includes at least one analog-to-digital converter configured to receive and convert channel measurement values, said step of calibrating the second channel comprising the steps of:

replacing the removable sensor with a first equivalent source having a first expected value;

obtaining a first measured value for the first equivalent source using the analog-to-digital converter;

replacing the removable sensor with a second equivalent source having a second expected value;

obtaining a second measured value for the second equivalent source using the analog-to-digital converter; and

determining a slope and an offset value using the first and second measured values and the first and second expected values.

14. A method in accordance with claim 13 wherein the measurement system includes a memory, said method further comprising the step of storing the slope and offset values in the memory.

15. A method in accordance with claim 1 further comprising the step of supplying an output of the amplifier to an analog-to-digital converter.

16. A method in accordance with claim 1 wherein said step of selectively supplying an output of one of the sensors through the multiplexor to the impedance path further comprises the step of placing a selected sensor output in series with an on resistance of the multiplexor.

17. A method in accordance with claim 1 wherein said step of selectively supplying an output of one of the sensors through the multiplexor to the impedance path further comprises the step of supplying the selected sensor output to a feedback impedance path of the amplifier.

18. A method in accordance with claim 1 wherein the plurality of sensors include a plurality of thermistors for sensing operating conditions of an appliance, said method further comprising the steps of:

selectively reading at least one of the thermistor outputs with the multiplexor; and

making appliance control decisions based at least in part on the thermistor reading.

19. A method in accordance with claim 1 wherein the plurality of sensors include a plurality of thermistors for sensing operating conditions of an appliance, said method further comprising the steps of:

selectively reading at least one of the thermistor outputs with the multiplexor; and

making appliance control decisions based at least in part on the thermistor reading.

20. A method for calibrating a hard mounted sensor in an appliance control system, the control system including an integrated circuit having at least a first channel and a second channel, the hard mounted sensor mounted to the first channel and a removable sensor coupled to the second channel, said step of calibrating each sensor comprising the steps of:

calibrating the second channel with the removable sensor to obtain at least a calibration offset value; and

applying the calibration offset value to the first channel.

21. A method in accordance with claim 20 wherein the measuring system includes at least one analog-to-digital converter configured to receive and convert channel measurement values, said step of calibrating the second channel comprising the steps of:

replacing the removable sensor with an equivalent source having an expected value;

obtaining a measured value for the equivalent source using the analog-to-digital converter, and;

determining the offset value using the measured value and the expected value.

22. A method in accordance with claim 21 wherein the measurement system includes a memory, said method further comprising the step of storing the offset value in the memory.

23. A method in accordance with claim 22, the measurement system including a processor, said method further comprising the steps of:

retrieving the sensor offset from memory when a reading of the at least one sensor is desired; and

applying the stored offset value to the at least one sensor signal to compensate for system error.

24. A method in accordance with claim 21 wherein said step of replacing the removable sensor with an equivalent source having an expected value comprises the step of replacing the removable sensor with a tight-tolerance resistor.

25. A method in accordance with claim 20 wherein the measuring system includes at least one analog-to-digital converter configured to receive and convert channel measurement values, said step of calibrating the second channel comprising the steps of:

replacing the removable sensor with a first equivalent source having a first expected value;

obtaining a first measured value for the first equivalent source using the analog-to-digital converter;

replacing the removable sensor with a second equivalent source having a second expected value;

obtaining a second measured value for the second equivalent source using the analog-to-digital converter; and

determining a slope and an offset value using the first and second measured values and the first and second expected values.

26. A method in accordance with claim 25 wherein the measurement system includes a memory, said method further comprising the step of storing the slope value and offset value in the memory.

27. A method in accordance with claim 26, the measurement system including a processor, said method further comprising the steps of:

retrieving the sensor offset value and slop value from memory when a reading of the at least one sensor is desired; and

applying the stored offset value and the stored slope value to the at least one sensor signal to compensate for system error.

28. A measurement system comprising:

a multiplexor;

a plurality of thermistors coupled to the multiplexor; and

a single amplifier circuit comprising an impedance path, said multiplexor configured to selectively place one of the thermistors into the impedance path.

29. A measurement system in accordance with claim 28, said impedance path comprising an input impedance path.

30. A measurement system in accordance with claim 28, said impedance path comprising a feedback impedance path.

31. A measurement system in accordance with claim 28 further comprising an integrated circuit comprising at least a first channel and a second channel, and a hard mounted sensor mounted to the first channel.

32. A measurement system in accordance with claim 31 wherein said hard mounted sensor is calibrated with adjacent channel calibration.

33. A measurement system in accordance with claim 32 wherein said hard mounted sensor is calibrated with a single point calibration offset.

34. A measurement system in accordance with claim 32 wherein said hard mounted sensor is calibrated with a two point slope and offset.

35. A measurement system in accordance with claim 31 wherein the measurement system further comprises a controller, said plurality of sensors comprise at least a plurality of thermistors for sensing operating conditions of an appliance, said controller configured to make control decisions based upon a reading of at least one of said plurality of thermistors.