THz pulse measurement with an optical streak camera

• US 6,690,001 B2
• Filed: 04/05/2001
• Issued: 02/10/2004
• Est. Priority Date: 04/06/2000
• Status: Active Grant

• Current Assignee: Rensselaer Polytechnic Institute
• Original Assignee: Rensselaer Polytechnic Institute
• Inventors: Jiang, Zhiping, Zhang, Xi-Cheng
• Primary Examiner(s): Luu, Thanh X.
• Application Number:
  US09/826,457
• Publication Number:
  US 20010050334A1
• Time in Patent Office: 1,041 Days
• Field of Search: 250/214.VT, 250/225, 313/103.CM, 324/244.1, 324/96, 324/637
• US Class Current: 250/214.0VT
• CPC Class Codes: G04F 13/026 Measuring duration of ultra-short light pulses, e.g. in the pico-second range; particular detecting devices therefor photometry, radiation pyrometry G01J1/00, G01J5/00; non-linear optics G02F1/35

Abstract

A method and apparatus for measuring electromagnetic pulses as a function of time. Radiation measurement, including measurement of single-shot, free-space terahertz femtosecond pulses, is realized using an electro-optical modulator in combination with an optical streak camera. This method and apparatus allow measurement of electromagnetic pulses previously unmeasurable due to the time resolution restrictions dictated by the time-frequency correlation.

Claims

1. A system for measuring a terahertz frequency pulse propagating in a free-space optical path, the system comprising:

an optical streak camera; and

an electro-optical modulator positioned before the optical streak camera in the free-space optical path,

wherein the streak camera measures an optical intensity as a function of time, and wherein the terahertz frequency pulse comprises subpicosecond free-space electromagnetic radiation with a bandwidth in a range from 10 gigahertz to 40 terahertz, and the terahertz frequency pulse modulates a probe pulse.

2. The system of claim 1 wherein the terahertz frequency pulse is measured in a single shot.

3. The system of claim 1 wherein the modulation of the probe pulse occurs as the terahertz frequency pulse and the probe pulse copropagate in the electro-optical modulator.

4. The system of claim 1 wherein the probe pulse is stretched relative to the terahertz frequency pulse.

5. The system of claim 4 wherein the probe pulse is stretched via a chirped pulse technique.

6. The system of claim 1 wherein the probe pulse is synchronized with the streak camera.

7. The system of claim 1 wherein the electro-optical modulator comprises:

an electro-optical crystal; and

a polarization analyzer.

8. The system of claim 7, wherein the electro-optical crystal comprises one of a ZnTe crystal, a GaAs crystal, a CdTe crystal, a CdZnTe crystal, and an organic DAST crystal.

9. The system of claim 7 wherein the polarization analyzer converts a polarization modulation into an intensity modulation.

10. The system of claim 7 wherein the polarization analyzer is in a crossed-polarizer geometry.

11. The system of claim 1 wherein the streak camera comprises an electron tube comprising a photo cathode, an accelerating mesh, at least two electrodes, a multi-channel plate, and a phosphor screen.

12. The system of claim 11 wherein the streak camera further comprises a data processing device to process data from the phosphor screen.

13. The system of claim 12 wherein the data processing device is a CMOS.

14. The system of claim 12 wherein the data processing device is a charge coupled device camera.

15. The system of claim 1 further comprising an optical source, for providing the probe pulse and a pump pulse, and an emitter wherein the pump pulse excites the emitter to emit the terahertz frequency pulse.

16. The system of claim 15 wherein the optical source is a laser.

17. The system of claim 16 wherein the laser is a Ti:

sapphire laser.

18. The system of claim 1 further comprising a probe pulse polarizer positioned before the electro-optical modulator in a probe pulse optical path.

19. The system of claim 1 further comprising a trigger to synchronize the streak camera and the probe pulse.

20. The system of claim 19 wherein the trigger is a PIN diode.

21. The system of claim 15 further comprising one or more lenses between the emitter and the electro-optical modulator.

22. A system for measuring a free-space terahertz frequency pulse emitted from an emitter and propagating in an optical path, the system comprising:

an optical streak camera;

an optical source and related optics for providing a pump pulse to excite the emitter to emit the terahertz frequency pulse and a probe pulse to probe the terahertz frequency pulse;

a probe pulse stretcher that produces a stretched probe pulse;

a probe pulse polarizer that produces a polarized stretched probe pulse from the stretched probe pulse;

a trigger that synchronizes the streak camera and the probe pulse; and

an electro-optical modulator positioned before the optical streak camera in the optical path, the electro-optical modulator comprising an electro-optical crystal and a polarization analyzer;

wherein an electric field is generated by the terahertz frequency pulse when the terahertz frequency pulse propagates through the electro-optical crystal, the electric field modulates the polarization of the polarized stretched probe pulse in the electro-optical modulator, generating a polarization modulation, wherein the polarization modulation is converted to an intensity modulation by the polarization analyzer, and the intensity modulation is measured by the streak camera.

23. The system of claim 22 wherein the terahertz frequency pulse comprises subpicosecond free-space electromagnetic radiation with a bandwidth in a range from 10 gigahertz to 40 terahertz.

24. The system of claim 22 wherein the electro-optical modulator is in a crossed-polarization geometry.

25. The system of claim 22 wherein an index of refraction of the electro-optical crystal changes as a function of a local electromagnetic field.

26. The system of claim 25 wherein the electro-optical crystal comprises one of a ZnTe crystal, a GaAs crystal, a CdTe crystal, a CdZnTe crystal, and an organic DAST crystal.

27. The system of claim 22 wherein the optical source is a laser and the trigger is a PIN diode.

28. A method for measuring terahertz frequency electromagnetic pulses as a function of time, the method comprising the steps of:

(a) providing an optical pump pulse and an optical probe pulse;

(b) exciting a terahertz frequency emitter with the optical pump pulse to generate an emitted pulse from the terahertz frequency emitter;

(c) stretching the optical probe pulse relative to the optical pump pulse;

(d) polarizing the optical probe pulse;

(e) modulating the probe pulse with a local electromagnetic field generated by the emitted pulse in an electro-optical modulator, the modulating resulting in a probe pulse polarization modulation;

(f) converting the polarization modulation into an intensity modulation; and

(g) measuring the intensity modulation as a function of time with a streak camera.

29. The method of claim 28 wherein, in step (e), an index of refraction of an electro-optical crystal within the electro-optical modulator changes as a function of the local electromagnetic field.

30. The method of claim 28 further comprising a step of synchronizing the optical probe pulse with the streak camera.

31. An apparatus for measuring a free-space terahertz frequency pulse in a time-dependent manner, said apparatus comprising:

an electro-optical crystal positioned so that the free-space terahertz frequency pulse passes therethrough, thereby changing an index of refraction of the electro-optical crystal;

means for generating an optical probe signal to impinge the electro-optical crystal simultaneously with the free-space terahertz frequency pulse passing therethrough, the optical probe signal having a polarization modulation after impinging upon the electro-optical crystal;

means for determining the polarization modulation of the optical probe signal after impinging upon the electro-optical crystal;

means for characterizing the free-space terahertz frequency pulse by evaluating the polarization modulation of the optical probe signal; and

a streak camera.

32. The apparatus of claim 31 wherein the means for characterizing includes means for determining a change in the index of refraction of the electro-optical crystal by analyzing the polarization modulation of the optical probe signal.

33. The apparatus of claim 31 wherein the optical probe signal comprises a polarized optical probe signal.

34. The apparatus of claim 31 wherein the electro-optical crystal comprises one of a ZnTe crystal, a GaAs crystal, a CdTe crystal, a CdZnTe crystal, and an organic DAST crystal.

35. The apparatus of claim 31 wherein the free-space terahertz frequency pulse comprises subpicosecond free-space electromagnetic radiation with a bandwidth in a range from 10 gigahertz to 40 terahertz.