Monitor having a polymer internal reflective element

• US 6,690,452 B2
• Filed: 04/18/2001
• Issued: 02/10/2004
• Est. Priority Date: 04/18/2001
• Status: Expired due to Fees

• Current Assignee: Paul A. Wilks Jr
• Original Assignee: Paul A. Wilks Jr
• Inventors: Wilks, Paul A. Jr.
• Primary Examiner(s): Stafira, Michael P.
• Assistant Examiner(s): VALENTIN, JUAN D
• Application Number:
  US09/837,749
• Publication Number:
  US 20020154289A1
• Time in Patent Office: 1,028 Days
• Field of Search: 356/70, 356/436, 356/442, 356/128, 356/136
• US Class Current: 356/70
• CPC Class Codes: G01N 21/552 Attenuated total reflection
• CPC Class Codes: G01N 33/2858 Metal particles

Abstract

A detector assembly which is capable of analyzing a material, the detector assembly comprising: an internal reflection element which is formed of a polymer having internally reflecting surfaces and an optical index of refraction greater than that of the material; a base portion disposed substantially adjacent to the internal reflection element; a light source disposed within the base portion wherein it is in communication with the internal reflection element such that the light source is capable of radiating light into the internal reflection element such that it contacts the internally reflecting surfaces; and a light analyzer disposed within the base portion wherein it is in communication with the internal reflection element such that the light analyzer is capable of measuring the absorbance by the material as the light is discharged from the internal reflection element.

Claims

1. A detector assembly which is capable of analyzing at least one material, said detector assembly comprising:

an internal reflection element which is formed of a polymer having internally reflecting surfaces and an optical index of refraction greater than that of said material;

a base portion is integrally formed with said internal reflection element from said polymer to form a unitary device;

a light source disposed within said base portion wherein it is in communication with said internal reflection element such that said light source is capable of radiating light into said internal reflection element such that it contacts said internally reflecting surfaces; and

a light analyzer disposed within said base portion wherein it is in communication with said internal reflection element such that said light analyzer is capable of measuring the absorbance of said material as said light is discharged from said internal reflection element.

2. The detector of claim 1, wherein said polymer is selected from the group consisting of polyether-sulfone and other high index of refraction materials.

3. The detector of claim 1, wherein said unitary device is provided by molding or machining.

4. The detector of claim 1, wherein said polymer internal reflection element has a hemispherical shape.

5. The detector of claim 1, wherein said base portion comprises a connecting portion for mounting the detector in a desired location, said connecting portion being selected from the group consisting of:

a mechanical connection, an adhesive connection, and a bonding connection.

6. A monitor for detecting at least one material contained in a mixture, said monitor comprising:

a controller; and

detector assembly which is capable of analyzing said material, said detector assembly comprising;

an internal reflection element which is formed of polyether-sulfone having internally reflecting surfaces and an optical index of refraction greater than that of said material;

a base portion formed as part of said internal reflection element from said polyether-sulfone;

a light source disposed within said base portion wherein it is in communication with said internal reflection element such that said light source is capable of radiating light into said internal reflection element such that it contacts said internally reflecting surfaces; and

a light analyzer disposed within said base portion wherein it is in communication with said internal reflection element such that said light analyzer is capable of measuring the absorbance of said material as said light is discharged from said internal reflection element,

wherein said controller controls said light source to radiate light into said internal reflection element at greater tan the critical angle such that said light is reflected on said internally reflection surface, a portion of said light is absorbed by said material, wherein said non-absorbed portion of said light is discharged from said internal reflective element at less than the critical angle, and causes said light analyzer to measurer the absorbed light.

7. The monitor of claim 6, wherein said light source is selected from the group consisting of:

an incandescent light source, a light emitting diode and a laser.

8. The monitor of claim 6, wherein said light detector is a broad-spectrum detector.

9. The monitor of claim 6, wherein said internal reflection element has a hemispherical shape.

10. The monitor of claim 6, wherein said light detector has a predetermined wavelength.

11. A detector element comprising:

an internal reflection portion;

a base portion for mounting the detector element in a desired location so that said internal reflection portion is exposed to a target material;

a first hole formed in said base portion, said first hole receiving a light source therein; and

a second hole formed in said base portion, said second hole receiving a light detector therein, said first and second holes being positioned in said based portion so that light radiated from said light source into said internal reflection portion at said first hole is internally reflected within said internal reflection portion before exiting said internal reflection portion at said second hole into said light detector, wherein said internal reflection portion and said base portion are formed as a unitary element of polymeric material having a selected optical index of refraction.

12. The detector element as in claim 11, wherein said base portion has a threaded section for mounting the detector element in said desired location.

13. The detector element as in claim 11, wherein said internal reflection portion has a hemispherical shape.

14. The detector element as in claim 11, wherein said polymeric material is polyether-sulfone.