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Method and an apparatus for a waveform quality measurement

  • US 6,693,920 B2
  • Filed: 12/14/2000
  • Issued: 02/17/2004
  • Est. Priority Date: 12/14/2000
  • Status: Active Grant
First Claim
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1. A method for determining a waveform quality measurement, comprising:

  • providing a plurality of offsets of parameters of an actual signal with respect to an ideal signal;

    compensating the actual signal with the plurality of offsets to generate a compensated actual signal;

    filtering the compensated actual signal to generate a filtered signal;

    modifying the ideal signal to correspond to the filtered signal to generate a modified signal; and

    determining the waveform quality measurement in accordance with the modified ideal signal and the filtered signal.

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