Burn-in apparatus having average voltage calculating circuit

• US 6,703,854 B2
• Filed: 08/22/2002
• Issued: 03/09/2004
• Est. Priority Date: 09/28/2001
• Status: Expired due to Fees

• Current Assignee: Renesas Electronics Corporation
• Original Assignee: Renesas Technology Corporation (Renesas Electronics Corporation)
• Inventors: Hashimoto, Osamu
• Primary Examiner(s): KARLSEN, ERNEST F
• Application Number:
  US10/225,306
• Publication Number:
  US 20030062918A1
• Time in Patent Office: 565 Days
• Field of Search: 324/760, 324/765, 324/754, 324/758, 324/158.1, 438/14, 438/17
• US Class Current: 324/750.05
• CPC Class Codes: G01R 19/003 Measuring mean values of current or voltage during a given time interval
• CPC Class Codes: G01R 31/2849 Environmental or reliability testing, e.g. burn-in or validation tests of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855

Abstract

A function test circuit inside a burn-in apparatus is mounted on a burn-in board and specifies a plurality of checked devices which operate normally. An average voltage calculating circuit calculates average voltage for test voltage applied to a plurality of checked devices specified on a mounting section. A voltage correction circuit receives the average voltage and outputs a control signal to control set voltage output from a device power supply generation circuit. Therefore, this burn-in apparatus can set the test voltage applied to the checked devices readily with high accuracy.

Claims

1. A burn-in apparatus, comprising:

a burn-in board on which a plurality of checked devices are mountable;

a device power supply generation circuit supplying test voltage for burn-in test to said plurality of checked devices mounted on said burn-in board;

an average voltage calculating circuit measuring said test voltage supplied to each of said plurality of checked devices and outputting an average voltage; and

a voltage correction circuit outputting control signal to control said device power supply generation circuit in response to said average voltage.

2. The burn-in apparatus according to claim 1, wherein

said voltage correction circuit includes a comparator receiving said average voltage and predetermined voltage and outputting said control signal.

3. The burn-in apparatus according to claim 1, further comprising a sensing circuit sensing said plurality of checked devices mounted on said burn-in board;

wherein

said average voltage calculating circuit measures said test voltage supplied to each of said plurality of checked devices sensed by said sensing circuit and outputs said average voltage.

4. The burn-in apparatus according to claim 3, wherein

said sensing circuit further senses two or more operable checked devices among said plurality of checked devices.

5. The burn-in apparatus according to claim 4, wherein

said sensing circuit includes a function testing circuit performing a function test for said plurality of checked devices;

and

said average voltage calculating circuit outputs said average voltage in response to the result of said function test.

6. The burn-in apparatus according to claim 1, wherein

said average voltage calculating circuit measures said test voltage supplied to each of two or more checked devices among said plurality of checked devices and outputs said average voltage.